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Chapter 15: Fundamentals of Sealing and Encapsulation

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Title: Chapter 15: Fundamentals of Sealing and Encapsulation


1
Chapter 15 Fundamentals of Sealing and
Encapsulation
  • Jason Shin
  • Derek Lindberg

2
15.1 What Is Encapsulation
  • Protection Techniques
  • Typically low temperature polymers
  • Isolation from environmental pollutants
  • Mechanical protection
  • Performance
  • Dimensional stability
  • Resistance to thermal excursions
  • Permeation (isolation of environmental
    pollutants)
  • Thermal dissipation

3
15.2.1 Chemical Protection
  • Protection from Moisture
  • Major contributor to packaging failures
  • Rapid water desorption from polymeric packaging
    during board assembly is a major cause of
    delamination
  • Vapor pressure build-up within packages sometimes
    cracks the plastic cases
  • Swelling of the encapsulants caused by moisture
    pickup is a major driving force of failures at
    the interconnection level

4
  • Protection from Moisture (continued)
  • Fricks Law of Diffusion
  • Equilibrium water constant

5
  • Protection from Salts
  • In the presents of salts, corrosion of the IC
    metallization is accelerated
  • Operating voltages and materials used for
    electrical performance may be sufficient to cause
    electrolytic corrosion
  • Due to small line widths and micrometer or less
    pitch, small localized corrosion can produce
    major problems
  • Protection from Biological Organisms
  • Insects can be attracted by the electric field
    generated by an electronic device

6
  • Protection from Atmospheric Contaminants
  • Corrosive gasses in the atmosphere can be harmful
    to electronic devices
  • Nitrogen oxides
  • Sulfur dioxide
  • Causes acid rain

7
15.2.2 Mechanical Protection
  • Both wirebond and flip chip devices have very
    fine interconnects
  • Structural integrity provided by the
    interconnections is very minimal
  • Protection achieved by
  • Prevention of damage by encapsulation over the IC
  • Minimization of strain in the solder joined by
    underfill between IC and package substrate

8
15.3.1 Hermetic versus Non-Hermetic Sealing
  • Compromise between cost and performance
  • Inorganics are hermetic, organics are not
  • Hermetic package is defined as one that prevents
    the diffusion of helium below a leak rate of 10-8
    cm3/s.

9
13.2 Moisture Absorption of Encapsulants
  • Moisture Effects on Plastic Packages
  • Moisture acts as a debonding agent though a
    combination of
  • Moisture-reacted metal surace can form a weak,
    hydrated oxide surface
  • Moisture-assisted chemical bond breakdown
  • Moisture-related degradation or depolymerization
  • Moisture diffusion rate depends on the material,
    as well as its thickness and the diffusion time

10
  • Moisture Effects on Plastic Packages (continued)
  • Organic materials are not hermetic and allow
    moisture to penetrate and be absorbed.
  • Improvements in plastic packaging materials and
    processes have lead to reliability that
    approaches hermetic packages
  • The word hermetic is defined as completely sealed
    by fusion, solder and so on, so as to keep air,
    moisture or gas from getting in or out.

11
15.3.3 Organics Came a Long Way
  • Inadequate adhesion, contaminants within the
    material itself, incompatible thermal expansion,
    and stress-related problems all combined for
    early problems
  • Now 90 of ICs are marketed in this form
  • Better filler technology resulted in materials
    that do not impart stress-related failures.

12
  • Adhesion Is Very Critical
  • Good interfacial adhesion between polymers and
    packages is important
  • This adhesion is between metallic-organic
    interfaces is facilitated by a combination of
    mechanical interlocking and chemical and physical
    bonding.
  • Corrosion protection and adhesion properties are
    closely linked

13
  • Accelerated Testing Helps to Select Right
    Material
  • The means by which non-hermetic packaging is
    assessed during screening.
  • Temperature cycling is the most common
    thermomechanical environmental test.

14
15.4.1 Encapsulation Requirements
  • Mechanical Properties
  • Good stress-strain Behavior
  • An ideal encapsulant should exhibit
  • gt1 elongation at break
  • A tensile modulus of 5-8 GPa
  • Minimum shift in properties at temperatures close
    to Tg

15
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16
  • Thermomechanical Considerations
  • Coefficients of thermal expansion
  • Ideally the CTE of a molding compond should be as
    close to Si as possible
  • Also the CTE of an underfill should be as close
    to the solder bump as possible

17
  • Residual Stress
  • Shrinkage of resin
  • Thermomechanical loading due to mismatch of CTEs
    of constituent materials between cure temperature
    and storage temperature.

18
15.4.1 Thermal Properties
  • Coefficient of Thermal Expansion (CTE)
  • Requirements for CTE vary significantly with the
    type of encapsulants in need
  • Glass Transition Temperature (Tg)
  • The temperature at which the transition from
    solid to liquid takes place
  • Flow During Encapsulation
  • Flow characteristics of the molten compound
    within the mold during the molding operation

19
15.4.3 Physical Properties
  • Adhesion
  • Measure of the strength between two interfaces
  • Robust encapsulation system provides strong
    adhesion to the device encapsulate interfaces
    such that the mechanical integrity of the package
    can be preserved under thermal stress
  • Interfaces
  • Any physical or chemical layer (in atomic scale
    between two materials)
  • first line of defense against adhesion failure

20
15.5 Encapsulant Materials
  • All encapsulants involve some form of
    polymerization and cross-linking reactions that
    enhance the mechanical properties of the
    packaging system.

21
15.6.1 Encapsulation Processes
  • Molding
  • Majority of processes use transfer molding
  • Simple and mass producible
  • Molten material injected into mold cavity with IC
    at its center.
  • Held under pressure until compound cures
  • Hard to apply to flip chip and PGA packages

22
15.6.1 Molding Complications
  • Early (70s 80s) molds suffered from unbalanced
    EMC injection
  • Different molds filled at different rates causing
  • wire sweep
  • Variation in void sizes and quantity
  • Variation in size
  • 90-240 second cycles
  • Modern gang-pot molds are balanced
  • Cycle time as low as 15 seconds

23
15.6.2 Liquid Encapsulation
  • Viscosity controlled to meet fill requirements
  • Three most common liquid encapsulation processes
  • Cavity Filling
  • Glob Topping
  • Underfilling

24
15.6.2 Cavity Fill
  • Used mostly in prefabricated ceramic (usually)
    chip carriers
  • After die attach and wire bonding the cavity is
    flooded with liquid encapsulant

25
15.6.2 Glob Top
  • Simple alternative to cavity-filling
  • No need for premade mold or cavity
  • Dams may not be necessary based on application
  • Often used for extra protection on manufactured
    PCBs

26
15.6.2 Underfilling
  • Typically used in flip-chip assembly
  • Liquid injected under chip to seal and strengthen
    the chip to board/substrate bond

27
15.7 Hermetic Sealing
  • The goal of sealing is to maintain the electronic
    package in an inert environment
  • Several processes are used
  • Fused Metal Sealing
  • Soldering
  • Brazing
  • Welding
  • Glass Sealing

28
Fused Metal Seals
  • Typical for hermetic packages with volumes
    gt.1mm3
  • Can be welded, soldered, or brazed
  • Welding is the most popular due to high yield,
    large throughput, and reliability
  • Soldering and brazing are typically used if the
    metal lid must be removed again later
  • Glass seals can also be used for reliable
    protection

29
Techniques
  • Soldering
  • Solders are selected by temperature, strength,
    and cost
  • Melting temperature must be below that of the
    solder or brazing process used to attach pins to
    the substrate
  • Must be above the temperature used to attach the
    part to a PCB
  • Brazing
  • Stronger, more corrosion resistant seal than
    solder
  • Does not require flux
  • Usually tack-welded to a gold-plated Kovar (Co,
    Ni, Fe alloy) lid
  • Glass Sealing
  • Been in use since the 1950s
  • Used to create hermetic glass-to-metal seals
    between metal lid and metallized alumina chip
    carrier

30
Sealing Examples
31
Summary and Future Trends
  • Early attempts at non-hermetic packages suffered
    from a number of problems, including encapsulant
    contamination, poor moisture resistance,
    incompatible thermal expansion, stress-related
    problems.
  • Low-cost polymeric plastic packaging has been
    dominant since the 1980s
  • Use of polymeric packages is only expected to
    increase.
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