(non-)Destructive high-rate tests on silicon strip modules - PowerPoint PPT Presentation

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(non-)Destructive high-rate tests on silicon strip modules

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(non-)Destructive high-rate tests on silicon strip modules Emulating LHC beam incidents using the PS booster and measuring the effect on a LHCb Velo silicon strip module – PowerPoint PPT presentation

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Title: (non-)Destructive high-rate tests on silicon strip modules


1
(non-)Destructive high-rate tests on silicon
strip modules
  • Emulating LHC beam incidents using the PS booster
    and measuring the effect on a LHCb Velo silicon
    strip module
  • Lars Eklund, on the behalf of the LHCb
    Collaboration

2
Outline
  • Introduction
  • Motivation and previous publications
  • The participants
  • The PS booster and the LHCb/VELO module
  • The measurements
  • Observables and program
  • The surprise
  • Results and interpretations
  • Summary

3
Motivation (1)
  • The LHC
  • Stored beam energy 102 - 103 times larger than
    any previous accelerator
  • New machine, limited operational experience
  • The LHCb Velo
  • Very close to the beam silicon sensors _at_ 7-30 mm
    distance (moving!)
  • Located next to the injection line TI8
  • Designed and built but operation procedures can
    be changed
  • LV HV on/off at injection?
  • Feedback to the machine
  • Intensity limit at injection
  • Currently H/W 1011 protons and F/W 1010

4
Motivation (2)
  • Possible beam incidents
  • Injection failures
  • incomplete or unsynchronized kicker fire gt
    mostly Alice LHCb
  • wrong magnet settings in transfer line gt mostly
    Alice LHCb
  • wrong magnet settings in the LHC gt everybody
  • Circulating beam failures (mostly caught by
    collimators)
  • magnet failure / mishap gt everybody
  • RF failure gt everybody
  • collimator failure / mishap gt everybody
  • Extraction failures
  • Under-kick, unsynchronized beam dump gt mostly
    CMS

5
Previous studies
  • Atlas silicon strip sensors LASER (2 types)
  • IEEE Trans. Nucl. Sci. NS47 (2000) 1902
  • Voltage across AC coupling vs. RRC CRC
  • Atlas silicon strip 1064 nm LASER (1 W)
  • NIM A 541 (2005) 15-20
  • Beam spot 8 µm, 10 ns pulse, 109 MIP equivalent
  • Damage HV bias gt 200 V _at_ 109 MIP (on one strip)
  • CMS silicon strip 24 GeV protons (CERN/PS)
  • NIM A 518 (2004) 328-330
  • Beam spot 10x3 cm2, 42 ns bunch, 2 bunches of
    7x1010 protons
  • No damage
  • Atlas pixel 24 GeV protons (CERN/PS)
  • NIM A 565 (2006) 50
  • Beam spot 6x3 cm2, 42 ns bunch, 8 bunches of
    1x1011 protons
  • No damage

6
The PS booster
Resto2
Main bldg
7
The beam line
  • Proton beam with 1.4 GeV energy
  • Intensity 2x109 9x1012 p
  • Beam spot 5 mm (max 4x1013 p/cm2)
  • Bunch length 200 ns
  • Cf. tests in the PS max 3x1010 p/cm2
  • Compare with LHC
  • Pilot bunch _at_ injection 2x109 protons (450 GeV)
  • 300 µm beam spot
  • 0.4 ns bunch length
  • Full luminosity (L1034) SPS injection train
  • 288 bunches of 1011 protons
  • 4x1013 protons/cm2/bunch

8
The set-up
  • Module mounted close to the beam dump
  • Back-splash gives non-negligible dose
  • Rough estimate of dose 1013 neq 1 kGy (very
    preliminary)
  • Small scale experiment

9
The victim
  • LHCb/Velo spare from production
  • Double sided (R Phi sensors)
  • 2048 AC coupled n-on-n strips / side
  • 16 FE chips (IBM 0.25 µm)
  • Mounted in the beam line
  • Cooled to 1 C (LV on)
  • Florescent screen to view the beam
  • Insert/retract from beam line
  • Remote control and read-out

10
Electrical model static case
CDET 1 nF/2048 ch. RDET 1-100 MO/2048
ch. CAC 250 nF/2048 ch. Rbias 1 kO x 2048
ch. CRC 10 nF RRC 5 kO CFB 400 fF
(per ch.) CG 10 pF (per ch.) CLV 32 x
100nF
11
The measurement sequence - observables
  • Intensity steps 2x109, 2x1010, 2x1011, 2x1012
    9x1012
  • Each step LV/HV off, LV on/HV off, LV on/HV 150
    V LV on/HV 300V
  • Each beam shot follows the same pattern
  • A set of standard measurements
  • I/V of both sensors
  • Noise pedestal data
  • Test pulse data at 1.5, 0 and -150 V (for some
    shots)
  • Insert the module, acquire during the shot
  • 14 consecutive triggers of front-end data
  • Voltage on hybrid GND and sensor bias via
    oscilloscope
  • Beam spot image via a a camera
  • Repeat the same set of measurements
  • Shots on two sensor positions
  • Shots on five front-end chips (only LV on/off
    matters)
  • No measurable damage up to
  • 9x1012 _at_ 300V bias on the sensor
  • 2x1011 (LV on) on the FE chips

12
Beam images
Combined R-F sensor front-end data
Beam line camera on scintillating screen
13
I/V curves
  • I/V curves in-situ between each shot
  • Superimpose temperature corrected I/V curves
  • Small increase probably due to accumulated dose
  • Rough estimate between first and last curve
    3x1012 neq 200 Gy
  • Work in progress
  • Correlate with radiation monitoring data

14
Thermal image No hot-spots
The majority of the shots hit this area
15
Noise Pedestals
  • Noise pedestals measured in-situ between each
    shot
  • Plots show date taken towards the end of the
    program
  • No change visible
  • Detailed analysis is in progress

16
Test pulse response post-zap
  • Test pulse response
  • booster in-situ after a few shots at 2x109
  • lab lab measurement after the full program
  • Gain difference due to different analogue
    drivers/receivers
  • Bad channels identical to production QA

17
Post-mortem why did it survive?
vivum
  • Deposited energy (in 300 µm Si)
  • 9x1012 x 24 k MIPs x 3.6 eV 1.2 Joule / 200 ns
  • Temperature increase in 1 cm2 Si 2.5 C
  • Maximum SPS injection train (288x1011) 4 Joule /
    10 µs
  • Local energy store the RC filter
  • 10 nF _at_ 300V gt 0.5 mJ
  • Absorption volume critical
  • Massive ionisation in biased silicon
  • QRC(300V) 3 µC
  • Deposited charge _at_ 2x109 7.5 µC
  • Possible transient damage
  • Current through front-end
  • AC coupling diode
  • Voltage on front-end input
  • Fast HV ramp-down

18
Voltage across the sensor vs. time
  • Oscilloscope measurements
  • Hybrid GND
  • Backplane
  • 1 sample / ns
  • Ground reference arbitrary
  • Huge ground bounce
  • Large pick-up
  • Plot Vbackplane-VhybridGND
  • Two distinct features
  • Sharp rising edge (50 ns)
  • Slow charge-up

19
The first 50 ns
6 GV/s
2.5 GV/s
2 GV/s
20
Electrical model the first 50 ns
  • VIN IZ/N x RIN
  • N is large ( 2048)
  • RIN is small (Os)

Ramping 300 to 0 V in 50 ns seems to be OK!
21
Shots on the FE chips
  • 56 shots on the FE chips 2x109 2x1011
  • No destructive latch-up
  • Design rules include structures to prevent
    latch-up
  • Seems to be effective!
  • SEU analysis in progress none observed so far
  • Requires large energy deposited in small volume
  • Nuclear reactions necessary
  • Cross-section very low
  • Triple-redundant registers corrected every 2 ns

22
Summary
  • The PS booster provided beam to emulate LHC beam
    incidents
  • 200 ns shots, 2x109 to 91012 protons
  • A VELO strip module was subject to a large number
    of shots
  • Two positions on the sensor, five FE chips
  • Survived 9x1012 protons on sensor with 300 V bias
  • Survived 2x1011 protons on the FE chip
  • No visible change in performance
  • I/V curves, noise, pedestals, thermal imaging,
  • Saving graces
  • The whole sensor responds as a unit
  • Large area sensor many channels
  • CAC gtgt CRC (CDET)
  • Protection diodes on the FE inputs
  • Triple-redundant registers in FE chips
  • Analysis measurement still in progress

23
Back-up slides
24
Total number of shots
Shots on the sensor (position 12)
Intensity LV off HV off LV on HV off LV on HV 150V LV on HV 300V
2109 1 2 293 2
21010 1 1 1 1
21011 1 1 1 1
21012 1 1 1 1
91012 2 2 5 5
Shots on the front-end chips
Intensity Beetle 4 Beetle 4 Beetle 5 Beetle 5 Beetle 6 Beetle 6 Beetle 7 Beetle 7
Intensity LV on LV off LV on LV off LV on LV off LV on LV off
2109 - - 2 4 3 3 3 6
21010 3 3 5 3 3 3 6 6
21011 - 3 - - - - - -
25
Beam size seen by the F-sensor
Response to beam during initial 25 ns of beam
rising edge in f detector
26
Fitting rising edge of all shots
  • Termination of HV monitoring signal was improved
    during the program
  • Rising edge not affected by termination
  • 150 V Shots 3-5 24 _at_ 2e9, shot 10 _at_ 2e10 and
    shot 14 _at_ 2e11 are less than 1 GV/s
  • 300V 9e12 Shots 34, 42, 44 are greater than 5
    GV/s
  • Weak correlation with intensity voltage
  • Large shot-to-shot variation

27
Re-charge of HV
  • Average time constants
  • t 6.8 µs _at_ 2e9 150V
  • t 13 µs _at_ 9e12 150V
  • t 10 µs _at_ 9e12 300V
  • Need spice simulation to understand recovery
    times
  • Re-charge depend on intensity
  • Some long term (10µs) process in the sensor?

28
Decay-time of all available wave forms
  • Falling edge clearly affected by the termination
  • Not possible to compare the two data-sets
  • De-convolution of impulse response maybe possible
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