68 Iddq PPTs View free & download

Lecture 21 IDDQ Current Testing PowerPoint PPT Presentation

Lecture 21 IDDQ Current Testing - Instrumentation difficulties. Sematech study. Limitations of IDDQ testing ... Instrumentation Problems. Need to measure 1 mA current at clock 10 kHz ...

Instrumentation difficulties. Sematech study. Limitations of IDDQ testing ... Instrumentation Problems. Need to measure 1 mA current at clock 10 kHz ...

| PowerPoint PPT presentation | free to view

Characterization and Estimation of Circuit Reliability Degradation under NBTI using OnLine IDDQ Meas PowerPoint PPT Presentation

Characterization and Estimation of Circuit Reliability Degradation under NBTI using OnLine IDDQ Meas - Characterization and Estimation of Circuit Reliability Degradation ... Microphotograph. Layout. Vin. VDD. IDDQ Measurement. 1000 stages. 11. Measurement Flow ...

Characterization and Estimation of Circuit Reliability Degradation ... Microphotograph. Layout. Vin. VDD. IDDQ Measurement. 1000 stages. 11. Measurement Flow ...

| PowerPoint PPT presentation | free to view

Nitin Yogi and Vishwani D. Agrawal PowerPoint PPT Presentation

Nitin Yogi and Vishwani D. Agrawal - Optimizing Tests for Multiple Fault ... Minimization of total number of vectors. Minimizing IDDQ measurements. Results ... Sematech study (Nigh et. al. VTS' ...

Optimizing Tests for Multiple Fault ... Minimization of total number of vectors. Minimizing IDDQ measurements. Results ... Sematech study (Nigh et. al. VTS' ...

| PowerPoint PPT presentation | free to download

Nitin Yogi and Vishwani D. Agrawal - Optimizing Tests for Multiple Fault Models Nitin Yogi and Vishwani D. Agrawal Auburn University Department of ECE Auburn, AL 36849, USA Outline Multiple fault models ...

Optimizing Tests for Multiple Fault Models Nitin Yogi and Vishwani D. Agrawal Auburn University Department of ECE Auburn, AL 36849, USA Outline Multiple fault models ...

| PowerPoint PPT presentation | free to download

Testing Solutions for Very Deep Sub-Micron CMOS Technologies PowerPoint PPT Presentation

Testing Solutions for Very Deep Sub-Micron CMOS Technologies - Ioannina - Greece. University of Athens. Dept. of Informatics & Telecommunications. Athens - Greece. University of Patras. Dept. of Computer Engineering & Informatics ...

Ioannina - Greece. University of Athens. Dept. of Informatics & Telecommunications. Athens - Greece. University of Patras. Dept. of Computer Engineering & Informatics ...

| PowerPoint PPT presentation | free to download

E-Learning Environment for WEB-Based Study of Testing PowerPoint PPT Presentation

E-Learning Environment for WEB-Based Study of Testing - E-Learning Environment for WEB-Based Study of Testing R.Ubar1, A.Jutman1, J.Raik1, S.Kostin1, H.-D.Wuttke2 1Dept. of Computer Engineering Tallinn University of Technology

E-Learning Environment for WEB-Based Study of Testing R.Ubar1, A.Jutman1, J.Raik1, S.Kostin1, H.-D.Wuttke2 1Dept. of Computer Engineering Tallinn University of Technology

| PowerPoint PPT presentation | free to download

Adaptive On-Chip Test Strategies for Complex Systems PowerPoint PPT Presentation

Adaptive On-Chip Test Strategies for Complex Systems - ... Logic ATE, Memory ATE, Analog ATE (Double/Triple Insertion) ... Requires deep tester memory for scan I/O pins. Slow test with long scan chains. External ...

... Logic ATE, Memory ATE, Analog ATE (Double/Triple Insertion) ... Requires deep tester memory for scan I/O pins. Slow test with long scan chains. External ...

| PowerPoint PPT presentation | free to download

ELEC 7250 - ELEC 7250 VLSI Testing (Spring 2005) Place and Time: Broun 235, Tuesday/Thursday, 11:00AM 12:15PM Catalog data: ELEC 7250. VLSI Testing (3) Lec.

ELEC 7250 VLSI Testing (Spring 2005) Place and Time: Broun 235, Tuesday/Thursday, 11:00AM 12:15PM Catalog data: ELEC 7250. VLSI Testing (3) Lec.

| PowerPoint PPT presentation | free to download

Fundamentals of Digital Test and DFT PowerPoint PPT Presentation

Fundamentals of Digital Test and DFT - Fundamentals of Digital Test and DFT Vishwani D. Agrawal Rutgers University, Dept. of ECE New Jersey http://cm.bell-labs.com/cm/cs/who/va January 2003

Fundamentals of Digital Test and DFT Vishwani D. Agrawal Rutgers University, Dept. of ECE New Jersey http://cm.bell-labs.com/cm/cs/who/va January 2003

| PowerPoint PPT presentation | free to download

STIL Support PowerPoint PPT Presentation

STIL Support - ... Systeme M3610, M3650, Piranha, Falcon, Kodiak. Test Debug on ... SZ Test Systeme M3650, Piranha, Falcon, Kodiak. And Additional Tester Support in Development ...

... Systeme M3610, M3650, Piranha, Falcon, Kodiak. Test Debug on ... SZ Test Systeme M3650, Piranha, Falcon, Kodiak. And Additional Tester Support in Development ...

| PowerPoint PPT presentation | free to download

Lecture 3 Mixed Signal Testing PowerPoint PPT Presentation

Lecture 3 Mixed Signal Testing - Lecture 3 Mixed Signal Testing DC and Parametric Test Continuity Testing Detect on-chip ESD devices Validate Connection of Device to Tester Eliminate DC Package ...

Lecture 3 Mixed Signal Testing DC and Parametric Test Continuity Testing Detect on-chip ESD devices Validate Connection of Device to Tester Eliminate DC Package ...

| PowerPoint PPT presentation | free to download

Test Technology Overview PowerPoint PPT Presentation

Test Technology Overview - ... (transistor level), at least for development of the ... Usually assumed to be a low resistance path (hard short) Three classes are typically considered: ...

... (transistor level), at least for development of the ... Usually assumed to be a low resistance path (hard short) Three classes are typically considered: ...

| PowerPoint PPT presentation | free to download

Smart Card security analysis Marc Witteman, TNO PowerPoint PPT Presentation

Smart Card security analysis Marc Witteman, TNO - 1. 1. 1. Differential Power Analysis. Assume power consumption relates to hamming weight of data ... Smart cards can be broken by advanced analysis techniques. ...

1. 1. 1. Differential Power Analysis. Assume power consumption relates to hamming weight of data ... Smart cards can be broken by advanced analysis techniques. ...

| PowerPoint PPT presentation | free to view

Fundamentals of Digital Test and DFT - Fundamentals of Digital Test and DFT Vishwani D. Agrawal Rutgers University, Dept. of ECE New Jersey http://cm.bell-labs.com/cm/cs/who/va January 2003

Fundamentals of Digital Test and DFT Vishwani D. Agrawal Rutgers University, Dept. of ECE New Jersey http://cm.bell-labs.com/cm/cs/who/va January 2003

| PowerPoint PPT presentation | free to download

Alfred L. Crouch Chief Scientist Inovys Corporation al.crouch@inovys.com PowerPoint PPT Presentation

Alfred L. Crouch Chief Scientist Inovys Corporation al.crouch@inovys.com - Title: DFT For AC Scan Subject: AC Scan Author: Al Crouch Keywords: Design Rules, Resource Checking, Limitations Description: Tutorial Information involved in Using ...

Title: DFT For AC Scan Subject: AC Scan Author: Al Crouch Keywords: Design Rules, Resource Checking, Limitations Description: Tutorial Information involved in Using ...

| PowerPoint PPT presentation | free to view

A Novel Wavelet Transform Based Transient Current Analysis for Fault Detection and Localization PowerPoint PPT Presentation

A Novel Wavelet Transform Based Transient Current Analysis for Fault Detection and Localization - Time domain information from wavelet coefficients can be used to compute delay ... occurs and delay is between min/max Tpd - consider the gate in the faulty set ...

Time domain information from wavelet coefficients can be used to compute delay ... occurs and delay is between min/max Tpd - consider the gate in the faulty set ...

| PowerPoint PPT presentation | free to view

ELEC 7250 - Boundary scan (2 classes) Analog test bus (1 class) System test and core test (2 classes) ... Homework (1 per week, most weeks) 30% Term paper (6 pages) 10 ...

Boundary scan (2 classes) Analog test bus (1 class) System test and core test (2 classes) ... Homework (1 per week, most weeks) 30% Term paper (6 pages) 10 ...

| PowerPoint PPT presentation | free to download

Lecture 3 Mixed Signal Testing - Validate Connection of Device to Tester. Eliminate DC Package Bridging Faults ... Issue (Hysteresis of DUT or Tester) Linear Search (Simplified form of Newton) ...

Validate Connection of Device to Tester. Eliminate DC Package Bridging Faults ... Issue (Hysteresis of DUT or Tester) Linear Search (Simplified form of Newton) ...

| PowerPoint PPT presentation | free to download

Fundamentals of Digital Test and DFT - Design synthesis: Given an I/O function, develop a procedure ... Data obtained courtesy of Phil Nigh (IBM) 2003. Agrawal: Digital Test and DFT. 15. Computed DL ...

Design synthesis: Given an I/O function, develop a procedure ... Data obtained courtesy of Phil Nigh (IBM) 2003. Agrawal: Digital Test and DFT. 15. Computed DL ...

| PowerPoint PPT presentation | free to view

Delay Test with Integrated Timing Analysis PowerPoint PPT Presentation

Delay Test with Integrated Timing Analysis - The material originally was prepared for a Cadence Design Systems ... Source: Pat Gelsinger, Intel, ITC 1999. Added. resistance. Wiring is more significant in ...

The material originally was prepared for a Cadence Design Systems ... Source: Pat Gelsinger, Intel, ITC 1999. Added. resistance. Wiring is more significant in ...

| PowerPoint PPT presentation | free to view

DTTC Presentation Template PowerPoint PPT Presentation

DTTC Presentation Template - ... tasks to core tested latest pick top priority task in core i & core-in-test in core i? yes run task no migrate? cost analysis migrate and run task ... HCI ...

... tasks to core tested latest pick top priority task in core i & core-in-test in core i? yes run task no migrate? cost analysis migrate and run task ... HCI ...

| PowerPoint PPT presentation | free to download

Design for Test PowerPoint PPT Presentation

Design for Test - Validation and Test of Manufactured Circuits. Components of DFT strategy ... Goals of Design-for-Test (DFT) Make testing of manufactured part swift and. comprehensive ...

Validation and Test of Manufactured Circuits. Components of DFT strategy ... Goals of Design-for-Test (DFT) Make testing of manufactured part swift and. comprehensive ...

| PowerPoint PPT presentation | free to download

ELEC%207770%20Advanced%20VLSI%20Design%20Spring%202008%20VLSI%20Test%20Principles PowerPoint PPT Presentation

ELEC%207770%20Advanced%20VLSI%20Design%20Spring%202008%20VLSI%20Test%20Principles - Test Program (written in high-level language) running on the computer ... Only one line is faulty. The faulty line is permanently set to 0 or 1 ...

Test Program (written in high-level language) running on the computer ... Only one line is faulty. The faulty line is permanently set to 0 or 1 ...

| PowerPoint PPT presentation | free to download

Logic Built in Self Test PowerPoint PPT Presentation

Logic Built in Self Test - Concurrent BILBO. R1-TGP. Combinational. Logic. R2-MISR. R1 ... BILBO Operation. Concurrent BILBO Operation. 19 Jan 2004. BIST/ESG Seminar. 24. RTL description ...

Concurrent BILBO. R1-TGP. Combinational. Logic. R2-MISR. R1 ... BILBO Operation. Concurrent BILBO Operation. 19 Jan 2004. BIST/ESG Seminar. 24. RTL description ...

| PowerPoint PPT presentation | free to view

Testing in the Fourth Dimension PowerPoint PPT Presentation

Testing in the Fourth Dimension - The Remarkables, Frankton, New Zealand, Near Lake Alta (Dimrill Dale) 332:479 Concepts in VLSI Design Lecture 2 Trends in ULSI Technology for the Next 15 Years ...

The Remarkables, Frankton, New Zealand, Near Lake Alta (Dimrill Dale) 332:479 Concepts in VLSI Design Lecture 2 Trends in ULSI Technology for the Next 15 Years ...

| PowerPoint PPT presentation | free to view

Design Methodologies PowerPoint PPT Presentation

Design Methodologies - Advanced packaging and assembly ... of the inverter Circuit Switch Design defined as ... Digital Data treated as Analog Signal Representing Data ...

Advanced packaging and assembly ... of the inverter Circuit Switch Design defined as ... Digital Data treated as Analog Signal Representing Data ...

| PowerPoint PPT presentation | free to view

Pattern%20Compression%20for%20Multiple%20Fault%20Models PowerPoint PPT Presentation

Pattern%20Compression%20for%20Multiple%20Fault%20Models - ck : tu tv tw 1. Objective function. Minimize tj. N : total number of vectors ... Undetected faults become the new targeted faults ...

ck : tu tv tw 1. Objective function. Minimize tj. N : total number of vectors ... Undetected faults become the new targeted faults ...

| PowerPoint PPT presentation | free to download

ECE260B - Testing Website: http://vlsicad.ucsd.edu/courses/ece260b-w05 ...

Testing Website: http://vlsicad.ucsd.edu/courses/ece260b-w05 ...

| PowerPoint PPT presentation | free to download

Introduction to IC Test Technology PowerPoint PPT Presentation

Introduction to IC Test Technology - Verilog. Lehrstuhl Technische Informatik - Computer Engineering ... Verilog. takes a. look. Testability. Analysis. Rule Base. user information ...

Verilog. Lehrstuhl Technische Informatik - Computer Engineering ... Verilog. takes a. look. Testability. Analysis. Rule Base. user information ...

| PowerPoint PPT presentation | free to view

3rd Annual Review Meeting PowerPoint PPT Presentation

3rd Annual Review Meeting - VHDL/Verilog/System C. Logic synthesis. Synopsys/Cadence. Gate-Level. EDIF ... and converters to commercial tools are available (EDIF, VHDL, Verilog, System C) ...

VHDL/Verilog/System C. Logic synthesis. Synopsys/Cadence. Gate-Level. EDIF ... and converters to commercial tools are available (EDIF, VHDL, Verilog, System C) ...

| PowerPoint PPT presentation | free to download

Everything you always wanted to know about Smart Cards... PowerPoint PPT Presentation

Everything you always wanted to know about Smart Cards... - ... Credit card or SIM dimensions Contacts or contactless CPU Central Processing Unit: heart of the chip CPU security logic security logic: ...

... Credit card or SIM dimensions Contacts or contactless CPU Central Processing Unit: heart of the chip CPU security logic security logic: ...

| PowerPoint PPT presentation | free to download

Fundamentals of Digital Test and DFT - Based on analyzable fault models, which may not map onto real defects. ... Two (0, 1) or three (0, 1, X) states for purely Boolean logic circuits ...

Based on analyzable fault models, which may not map onto real defects. ... Two (0, 1) or three (0, 1, X) states for purely Boolean logic circuits ...

| PowerPoint PPT presentation | free to view

Submicron Verification Challenges PowerPoint PPT Presentation

Submicron Verification Challenges - speed. Background. Been available for many years. A timing defect test pattern. Used so far to test very high speed devices & very accurate goals ...

speed. Background. Been available for many years. A timing defect test pattern. Used so far to test very high speed devices & very accurate goals ...

| PowerPoint PPT presentation | free to view

EEE287 California State University Sacramento VLSI Design IC Manufacturing and Test PowerPoint PPT Presentation

EEE287 California State University Sacramento VLSI Design IC Manufacturing and Test - Hot test is usually most critical since speed is key differentiator (devices ... This will reduce devices which fail during burnin or at class (speed) test. ...

Hot test is usually most critical since speed is key differentiator (devices ... This will reduce devices which fail during burnin or at class (speed) test. ...

| PowerPoint PPT presentation | free to view

Lecture 5 Fault Modeling PowerPoint PPT Presentation

Lecture 5 Fault Modeling - Fault dominance and checkpoint theorem. Classes of stuck-at faults and multiple faults ... Checkpoint theorem: A test set that detects all single (multiple) stuck-at ...

Fault dominance and checkpoint theorem. Classes of stuck-at faults and multiple faults ... Checkpoint theorem: A test set that detects all single (multiple) stuck-at ...

| PowerPoint PPT presentation | free to view

CMP238: Projeto e Teste de Sistemas VLSI PowerPoint PPT Presentation

CMP238: Projeto e Teste de Sistemas VLSI - CMP238: Projeto e Teste de Sistemas VLSI Marcelo Lubaszewski Aula 2 - Teste PPGC - UFRGS 2005/I Lecture 2 - Fault Modeling Defects, Errors, and Faults Why model faults?

CMP238: Projeto e Teste de Sistemas VLSI Marcelo Lubaszewski Aula 2 - Teste PPGC - UFRGS 2005/I Lecture 2 - Fault Modeling Defects, Errors, and Faults Why model faults?

| PowerPoint PPT presentation | free to download

Testing in the Fourth Dimension - The Remarkables, Frankton, New Zealand, Near Lake Alta (Dimrill ... Evanescent near-field lithography cheap (U. of Canterbury) 9/10/09. Concepts in VLSI Des. ...

The Remarkables, Frankton, New Zealand, Near Lake Alta (Dimrill ... Evanescent near-field lithography cheap (U. of Canterbury) 9/10/09. Concepts in VLSI Des. ...

| PowerPoint PPT presentation | free to view

VLSI Digital System Design PowerPoint PPT Presentation

VLSI Digital System Design - VLSI Digital System Design Input-Output Pads Input-Output Pad Design I-O pad design is highly specialized Requires circuit design experience Requires fabrication ...

VLSI Digital System Design Input-Output Pads Input-Output Pad Design I-O pad design is highly specialized Requires circuit design experience Requires fabrication ...

| PowerPoint PPT presentation | free to view

Embedded test tutorial PowerPoint PPT Presentation

Embedded test tutorial - ... of semi-embedded test address the bandwidth bottleneck in ATE to ... Reduced volume of test data. Underutilized bandwidth. Decompressor capacity problem ...

... of semi-embedded test address the bandwidth bottleneck in ATE to ... Reduced volume of test data. Underutilized bandwidth. Decompressor capacity problem ...

| PowerPoint PPT presentation | free to download

Fundamentals of Electrical Testing PowerPoint PPT Presentation

Fundamentals of Electrical Testing - Fundamentals of Electrical Testing Derek Lindberg Jason Shin What and Why? Electrical testing is intended to guarantee that a given device is electrically functional ...

Fundamentals of Electrical Testing Derek Lindberg Jason Shin What and Why? Electrical testing is intended to guarantee that a given device is electrically functional ...

| PowerPoint PPT presentation | free to view

Chapter 2 Boundary Scan and CoreBased Testing PowerPoint PPT Presentation

Chapter 2 Boundary Scan and CoreBased Testing - ... in (TDI), Test data out (TDO), Test mode select (TMS), Test clock (TCK), and ... TCK. Enable. EE141. 24. Data registers. Boundary scan ... Input: TCK, TMS ...

... in (TDI), Test data out (TDO), Test mode select (TMS), Test clock (TCK), and ... TCK. Enable. EE141. 24. Data registers. Boundary scan ... Input: TCK, TMS ...

| PowerPoint PPT presentation | free to view

Manufacturability, Test, and Diagnostics for Microelectronics PowerPoint PPT Presentation

Manufacturability, Test, and Diagnostics for Microelectronics - Pellicle. Phase shift coating. 11. Photo courtesy: SGS Thompson ... A reticle only covers a part of the wafer. It uses a larger image that is reduced by ...

Pellicle. Phase shift coating. 11. Photo courtesy: SGS Thompson ... A reticle only covers a part of the wafer. It uses a larger image that is reduced by ...

| PowerPoint PPT presentation | free to view

Memory market and memory complexity PowerPoint PPT Presentation

Memory market and memory complexity - Title: Testing in the Fourth Dimension Author: pagrawal Last modified by: bushnell Created Date: 11/3/2000 2:09:08 AM Document presentation format

Title: Testing in the Fourth Dimension Author: pagrawal Last modified by: bushnell Created Date: 11/3/2000 2:09:08 AM Document presentation format

| PowerPoint PPT presentation | free to view

Manufacturability, Test, and Diagnostics for Microelectronics - ... and/or systematic variations between clock distribution paths ... Weak inverter (shown) or clocked inverter for feedback. SysClk. SysData. ScnClk. SysClk ...

... and/or systematic variations between clock distribution paths ... Weak inverter (shown) or clocked inverter for feedback. SysClk. SysData. ScnClk. SysClk ...

| PowerPoint PPT presentation | free to view

P1253553558ngyUf PowerPoint PPT Presentation

P1253553558ngyUf - ... and testing methods, with possible implementation in an EDA environment ... design flow for mixed-signal and RF circuits implemented in an EDA environment. ...

... and testing methods, with possible implementation in an EDA environment ... design flow for mixed-signal and RF circuits implemented in an EDA environment. ...

| PowerPoint PPT presentation | free to download

DefectDesign Learning from Electrical Test - DefectDesign Learning from Electrical Test

DefectDesign Learning from Electrical Test

| PowerPoint PPT presentation | free to view

Fault-Tolerant design of RF front-end circuits PowerPoint PPT Presentation

Fault-Tolerant design of RF front-end circuits - ... ends', Journal of Electronic Testing (JETTA), Accepted for publication ... Abraham, 'Signature analysis for analog and mixed-signal circuit test response ...

... ends', Journal of Electronic Testing (JETTA), Accepted for publication ... Abraham, 'Signature analysis for analog and mixed-signal circuit test response ...

| PowerPoint PPT presentation | free to download

Fault Modeling PowerPoint PPT Presentation

Fault Modeling - ... at, multiply-testable path delay. Practicality issues: ... M paths = 3M-1 multiply-testable path delay faults ... Delay faults (transition, path) Analog faults ...

... at, multiply-testable path delay. Practicality issues: ... M paths = 3M-1 multiply-testable path delay faults ... Delay faults (transition, path) Analog faults ...

| PowerPoint PPT presentation | free to view

Lecture 9 Design PowerPoint PPT Presentation

Lecture 9 Design - Introduction Lower MOS supply voltages save energy Require low ... St Has not increased with new technologies because tox got smaller and substrate doping ...

Introduction Lower MOS supply voltages save energy Require low ... St Has not increased with new technologies because tox got smaller and substrate doping ...

| PowerPoint PPT presentation | free to download

TEST ET TESTABILITE DES CIRCUITS INTEGRES DIGITAUX PowerPoint PPT Presentation

TEST ET TESTABILITE DES CIRCUITS INTEGRES DIGITAUX - Effectu e par simulation, mulation mat rielle, preuve formelle ... Responsable de la qualit de la conception. V rifier la correction du mat riel fabriqu ...

Effectu e par simulation, mulation mat rielle, preuve formelle ... Responsable de la qualit de la conception. V rifier la correction du mat riel fabriqu ...

| PowerPoint PPT presentation | free to view

Lecture 9 Design - Clocked Logic. Domino Logic. Differential Current Switch Logic (DCSL) ... Increased signal activity extra loads for clock line ...

Clocked Logic. Domino Logic. Differential Current Switch Logic (DCSL) ... Increased signal activity extra loads for clock line ...

| PowerPoint PPT presentation | free to view

"Test and Debug" subnetwork PowerPoint PPT Presentation

"Test and Debug" subnetwork - Testing cost may represent up to 50% of the manufacturing cost of SoC ... Test Engineering Education (LIRMM, Agilent, Ljubljana, Stuttgart, Torino, UPC) ...

Testing cost may represent up to 50% of the manufacturing cost of SoC ... Test Engineering Education (LIRMM, Agilent, Ljubljana, Stuttgart, Torino, UPC) ...

| PowerPoint PPT presentation | free to download

Sistemi Elettronici PowerPoint PPT Presentation

Sistemi Elettronici - Design process traverses iteratively between three abstractions: ... Other options: schematics, Verilog. 10 - 10. L1 - MZ. Behavioral Description of Accumulator ...

Design process traverses iteratively between three abstractions: ... Other options: schematics, Verilog. 10 - 10. L1 - MZ. Behavioral Description of Accumulator ...

| PowerPoint PPT presentation | free to view

How to Make Efficient Communication, Collaboration, and optimization from System to Chip PowerPoint PPT Presentation

How to Make Efficient Communication, Collaboration, and optimization from System to Chip - Wobble. Filter. Frequency. Phase. Comparator. FIR. Filter. LMS ... Wobble. Detect. Pick up. Outputs. Extracted. Clock. Servo. Pre-Processor. Servo Error Signals ...

Wobble. Filter. Frequency. Phase. Comparator. FIR. Filter. LMS ... Wobble. Detect. Pick up. Outputs. Extracted. Clock. Servo. Pre-Processor. Servo Error Signals ...

| PowerPoint PPT presentation | free to view

332:479 Concepts in VLSI Design Lecture 8 DC PowerPoint PPT Presentation

332:479 Concepts in VLSI Design Lecture 8 DC - Reflect p device characteristic about x-axis. Take absolute value of p device characteristic ... With Idsp = - Idsn, then. Vout = (Vin Vtn) - (Vin Vtn)2 ...

Reflect p device characteristic about x-axis. Take absolute value of p device characteristic ... With Idsp = - Idsn, then. Vout = (Vin Vtn) - (Vin Vtn)2 ...

| PowerPoint PPT presentation | free to view

ELEN 468 Advanced Logic Design PowerPoint PPT Presentation

ELEN 468 Advanced Logic Design - Design Cycles. System/Architectural Design. Logic Design. Physical Design/Layout. Fabrication ... fabricated, fast automated design, low cost. Prototyping, ...

Design Cycles. System/Architectural Design. Logic Design. Physical Design/Layout. Fabrication ... fabricated, fast automated design, low cost. Prototyping, ...

| PowerPoint PPT presentation | free to view

Iddq PowerPoint PPT Presentations