Title: OUTLINE Author: Plasma Last modified by: Paul Created Date: 1/2/2001 7:10:39 AM Document presentation format: On-screen Show (4:3) Company: CityU
EDX-Spectra Simulation. Optimization of Excitation Conditions and Detection Limit ... The accuracy of data base is crucially. for quality of simulation! ...
AP 5301 / 8301 Instrumental Methods of Analysis Course Coordinator: Prof. Paul K. Chu Electronic mail: paul.chu@cityu.edu.hk Tel: 34427724 Fax: 27889549
A common question is whether a phase being analyzed ... These Monte Carlo simulations show the ... This Monte Carlo simulation shows that a 5% tilt of the ...
... (inductively coupled plasma mass spectrometry), LIMS 10 to 50 um spot size destructive Ion microprobe, SIMS (secondary ion mass spectrometry), SHRIMP ...
Beam current stability: with Faraday cup measurements made for each analysis, ... Polishing: samples should be polished with final stage using 1 mm diamond or ...
EDX-Spektrensimulation Optimierung der Messbedingungen und Berechnung von Nachweisgrenzen in der ESMA F. Eggert, R ntgenanalytik Apparatebau GmbH, Berlin
Compensation For Victims of Trafficking in Persons UNODC Perspective and State Practice Expert Consultation of the Special Rapporteur on Trafficking in Persons ...
Title: PowerPoint Presentation Author: Scott Stoller Last modified by: stoller Created Date: 8/10/2004 6:42:28 PM Document presentation format: On-screen Show
MONTE CARLO SIMULATIONS OF ELECTRON MOTION IN MATERIALS AND AVAILABLE SOFTWARE. ... The attempts to construct working Monte Carlo codes were presented by Nelson et ...
All research was carried out using the environmental JEOL 5130 SEM with an Oxford Instruments Pentafet thin window EDS. This detector has a beryllium (Be) ...
Poetry 1: Identity & Family Tone, Sound and Free Verse Image source Essay Question 1 1. Family Influences: So far we have read several texts where parent-children ...
X-ray/E-beam Spectral Metrology Tools: High Spatial Resolution Compositional Imaging ... Use electron beam X-ray microanalysis and scanning electron microscopy to ...