Sentaurus PowerPoint PPT Presentations

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Radiation Damage in Sentaurus TCAD PowerPoint PPT Presentation
Radiation Damage in Sentaurus TCAD - Defect clusters affected by annealing conditions & impurities in the silicon ... Typically, test detectors after beneficial annealing, to try to find stable ...
Defect clusters affected by annealing conditions & impurities in the silicon ... Typically, test detectors after beneficial annealing, to try to find stable ...
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Substrate Bias Effect on Ge pMOSFETs with and without Halo PowerPoint PPT Presentation
Substrate Bias Effect on Ge pMOSFETs with and without Halo - profile which is much higher than what is obtained. from TSUPREM simulations. ... Sentaurus amorphous (Taurus.MC): 10k ions, 10 sec ...
profile which is much higher than what is obtained. from TSUPREM simulations. ... Sentaurus amorphous (Taurus.MC): 10k ions, 10 sec ...
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Spacer Lithography for Reduced Variability PowerPoint PPT Presentation
Spacer Lithography for Reduced Variability - FLCC Seminar Spacer Lithography for Reduced Variability in MOSFET Performance Prof. Tsu-Jae King Liu Electrical Engineering & Computer Sciences Dept.
FLCC Seminar Spacer Lithography for Reduced Variability in MOSFET Performance Prof. Tsu-Jae King Liu Electrical Engineering & Computer Sciences Dept.
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3D Simulation and Analysis of the Radiation Tolerance of Voltage Scaled Digital Circuits PowerPoint PPT Presentation
3D Simulation and Analysis of the Radiation Tolerance of Voltage Scaled Digital Circuits - 3D Simulation and Analysis of the Radiation Tolerance of Voltage Scaled Digital Circuits Rajesh Garg Sunil P. Khatri Department of ECE Texas A&M University
3D Simulation and Analysis of the Radiation Tolerance of Voltage Scaled Digital Circuits Rajesh Garg Sunil P. Khatri Department of ECE Texas A&M University
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FinFETs: From Circuit to Architecture PowerPoint PPT Presentation
FinFETs: From Circuit to Architecture - ... W = 2*n*h Channel width in a FinFET is quantized Width quantization is a design challenge if fine control of transistor drive strength is needed E.g., ...
... W = 2*n*h Channel width in a FinFET is quantized Width quantization is a design challenge if fine control of transistor drive strength is needed E.g., ...
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Project Review Meeting PowerPoint PPT Presentation
Project Review Meeting - Plan for D2.4.2 deliverable (M24): - TCAD reliability simulations focused on HV-CMOS. - Hot-Carrier lifetime model for HV-CMOS by modified Hu-model. ...
Plan for D2.4.2 deliverable (M24): - TCAD reliability simulations focused on HV-CMOS. - Hot-Carrier lifetime model for HV-CMOS by modified Hu-model. ...
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Novel dual-Vth independent-gate FinFET circuits Masoud PowerPoint PPT Presentation
Novel dual-Vth independent-gate FinFET circuits Masoud - Novel dual-Vth independent-gate FinFET circuits Masoud Rostami and Kartik Mohanram Department of Electrical and Computer Engineering Rice University, Houston, TX
Novel dual-Vth independent-gate FinFET circuits Masoud Rostami and Kartik Mohanram Department of Electrical and Computer Engineering Rice University, Houston, TX
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Device Simulation for SingleEvent Effects PowerPoint PPT Presentation
Device Simulation for SingleEvent Effects - It all pales in comparison to.... Objectives. Provide device simulation environment for rad-hard applications ... P = Process / D = Device 90% code shared ...
It all pales in comparison to.... Objectives. Provide device simulation environment for rad-hard applications ... P = Process / D = Device 90% code shared ...
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Device Simulation for SingleEvent Effects PowerPoint PPT Presentation
Device Simulation for SingleEvent Effects
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Simulation results from doublesided and standard 3D detectors PowerPoint PPT Presentation
Simulation results from doublesided and standard 3D detectors - Simulation results from doublesided and standard 3D detectors
Simulation results from doublesided and standard 3D detectors
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Characterization, Modeling and Optimization of Fills and Stress in Semiconductor Integrated Circuits PowerPoint PPT Presentation
Characterization, Modeling and Optimization of Fills and Stress in Semiconductor Integrated Circuits - Characterization, Modeling and Optimization of Fills and Stress in Semiconductor Integrated Circuits
Characterization, Modeling and Optimization of Fills and Stress in Semiconductor Integrated Circuits
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Shashi Paul Emerging Technologies Research Centre EMTERC PowerPoint PPT Presentation
Shashi Paul Emerging Technologies Research Centre EMTERC - EMTERC's goal is to continually build on its international ... DC magnetron sputterer. 3 evaporators. Dual chamber PECVD system. Langmuir Blodgett trough ...
EMTERC's goal is to continually build on its international ... DC magnetron sputterer. 3 evaporators. Dual chamber PECVD system. Langmuir Blodgett trough ...
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