Richard Vanfleet, Jeff Farrer

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Richard Vanfleet, Jeff Farrer
Electron Microscopy Facilities

• Department of Physics and Astronomy
• Brigham Young University

Interest nano-scale characterization.
Poster 30
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Nano-Scale Characterization

• SEM, OIM
• HRTEM, ED, STEM, EDX, EELS
• That is to say
• Topography, crystal structure, atomic scale
  imaging, elemental analysis, bonding/valance
  information
• Unique facility to Utah

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How to get access

• Researchers (Basic and applied)
• What do I really have?
• Self use (Training, Fee structure, Proprietary
  work)
• Collaborative (involve/fund students)