OL

1
ARGCS ACTD CONOPS
BIT/Integrated Diagnostics
Weapon System ECP
OL
IL
DL
OEM
Dataflow
Dataflow
Dataflow
Test / Maintenance Feedback
Coalition Team Concept for _at_world Wide Support
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Northrop Grumman ARGCS Solution
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ATML Elements
(Web) Services
TestStation
Instrument
TestAdaptor
UUTData
TestConfiguration
TestDescription
Diagnostics
TestProgram
TestResults
Not Included
Not Started
Started
Draft
Candidate
4
UUT Repair Process
Bit Check
Observation
O level
I level
D level
UUTData
TestResults (Results Diagnosis)
TestDescription
Diagnostics
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ATML Framework

• 12 Jan 05

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Condensation of Architectures

• Common Features

• Test Controller or Test Executive
• Application Executive
• Historical Database
• Data store (metadata)

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Condensation of Architectures
Contains UUT data, test descriptions, instrument
metadata
Static DB
UUT
Fault Tree
Interface (Adapter?)
Diagnostic Interface
Application Executive
Test Controller
User Interface
Historical DB
Reasoner

• PIREP
• Technician knowledge

Contains prior test results for UUT, operator
knowledge base (?)
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A time line that test results may go through.

• Start with a simple list of test that we want to
  perform
• Each test is performed and a measurement is
  captured
• A set of limits is applies to each test
  consistent with the design authority field test
  requirements, which may be different from the
  depot level.
• The pass/fail criteria is determined from the
  limits supplied
• The grouping pass/fail criteria is determined
• The pass/fail limits and measurements are
  filtered out as a security measure
• The test and pass/fail information is diagnosed
  to identify indictments and subsequent repair.

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• How will Test Description define Test Limits?
  Simple, theres a common type TestLimits just use
  that.
• What happens if your TestDesription wants to
  reference an previous run? Oh allow for XPath
  XLink
• How do you define a group of test? Ahhh
• More importantly how do we know we have to?
• How do we ensure our Requirement specifications
  in Test Description can be met from our
  Instrument descriptions?

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Whats happening with?

• ? - Design - Preconditions Postconditions,
  Initialization Termination (Ion Neag)
• ? - Design - Test Actions (Ion Neag)
• ? - A couple of use case scenarios (Dan Pleasant)
• Supporting Both Static and Dynamic descriptions?
  (Chris Gorringe)
• What Will Services mean? (Chris Gorringe)
• XML Transaction Presentation (Tony Alwardt)

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Whats Next?
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ATML/ARI KEY Elements
DRV
FRM
ICM
CXE
Web Services
(Web) Services
RAI
TestStation
Instrument
RMS
IFP
SFP
SWM
CTI
DNE
TestAdaptor
UDI
NET
AFP
UUTData
PDD
TestConfiguration
MCI
TestDescription
Diagnostics
UTR
BTD
TPD
DIAD
MTD
MTD
TestProgram
DTF
MMF
RTS
TestResults
Not Included
DIAS
Not Started
Started
Draft
Candidate
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Adapter Functional Parametric Data AFP (IEEE
P1641)
Instrument Functional Parametric
Data IFP/SFP (IEEE P1641)
Digital Test Format DTF (IEEE 1445)
Built In Test Data BTD (IEEE 1149.X)
Product Design Data PDD
Test Program Documentation TPD
Interface Adaptor
Test Station
Instrument
Test Description
UUTData
UUTData
Test Description
UUTData
Diagnostics
Instrument Driver DRV (VPP 3-X)
Data/ Distributed Network DNE
System Framework FRM (VPP-2)
UUT Test Requirements UTR (IEEE P1641)
Diagnostic Data DIAD (IEEE 1232)
IVI/Resource Adapter Interface RAI (IEEE P1641)
Multimedia Formats MMF (JTA)
Data Networking NET (TCP/IP)
Communication Manager ICM (VPP-4)
Diagnostic Services DIAS (IEEE 1232)
Instrument
UUT Device Interfaces UDI
Resource Management Services RMS
Instrument
Computer to External Env. CXE (TCP/IP)
Diagnostics
UUTData
Test Program Set
Test Description
Interface Adapter
Diagnostics
UUT
ATE
TPS
Run Time Services RTS
LEGEND
Switch Matrix SWM
Commercial std not yet selected/developed
Maintenance Data and Services MTD (IEEE P1636)
Master Conformance Index MCI
Common Test Interface CTI (IEEE P1505)
Commercial std under review/evaluation
Commonly accepted commercial standard
IEEE P1671 ATML Initiative
DoD ATS Technical Framework ATML Relationships
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