The Microanalytical Research Centre

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The Microanalytical Research Centre
SUPPLEMENT
http//www.ph.unimelb.edu.au/dnj

• David N. Jamieson,
• and Steven Prawer, David Hoxley
• School of Physics, Microanalytical Research
  Centre, University of Melbourne, AUSTRALIA
• Work supported by the Australian Research Council
  and the Visiting Fellowship Scheme of the
  University of Melbourne

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Single ion tracks
(Huang and Sasaki, Influence of ion velocity on
damage efficiency in the single ion target
irradiation system Au-Bi2Sr2CaCu2Ox Phys Rev B
59, p3862)
Depth
1 mm
3 mm
5 mm
7.5 mm

• Latent damage from single-ion irradiation of a
  crystal(230 MeV Au into Bi2Sr2CaCuOx)
• Lighter ions produce narrower tracks!

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Self Assembled Monolayers for nanofabrication
CreditsA www.ifm.liu.se/Applphys/ftir/sams.html
B-D IBM Research Labs www.zurich.ibm.com/b
mi/sams.html
C
Monolayer deposition
A
AFM images of end-groups
D
B
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MeV ion etch pits in track detector

• Single MeV heavy ions are used to produce latent
  damage in plastic
• Etching in NaOH develops this damage to produce
  pores
• Light ions produce smaller pores

Heavy ion etch pit
3. Etch
2. Latent damage
1. Irradiate
Scale bars 1 mm intervals
From B.E. Fisher, Nucl. Instr. Meth. B54 (1991)
401.
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