Title: Electron Backscattering
1Electron Backscattering
- Jeff Martin
- University of Winnipeg
Collaborators M.J. Betancourt1, B.W.
Filippone1, S.A. Hoedl2, T.M. Ito3, B. Plaster1,
A.R. Young4, J. Yuan1 U Winnipeg, 1 Caltech, 2 U
Washington, 3 LANL, 4 NCSU
- Outline
- Motivation
- Experimental Setup
- Results and Comparisons
See also nucl-ex/0508004 Phys. Rev. C 68, 055503
(2003)
2Motivation
- Electron backscattering is an important
systematic effect in many low-energy electroweak
experiments. - E.g. Asymmetries in Neutron Beta-Decay (UCNA)
UCNA Experimental Goal Asymmetry to
0.2 Residual correction due to backscattering
0.1
3Backscattering Data
- Below 40 keV lots of data on variety of targets,
oblique/normal incidence, integration of current,
silicon detectors, secondary electrons, etc. - Above 1 MeV detailed Monte Carlo simulations,
relatively well-calibrated. - In between only measurements of normal incidence
using integration of current. - Our goal to link the two regimes with detailed
measurements, focus on low Z
4Experimental Setup
Electron gun
Beam diagnostics
Backscattering chamber
Electron Beam
5Experimental Setup
- Two modes
- Silicon detector mode (det on rotating arm)
- Current integration mode (with grid)
6Silicon detector data
Normalized Yield vs. energy deposition in silicon
detector Rate at ? gt 90? is due to
rescattering from chamber walls. (chamber
background)
7New Scintillator Target Results
Geant 4
Lines data Histo simulation
Penelope
- Additional systematics
- charging
- deterioration at high current
8Current Mode andSi Mode Compared
total systematic uncertainty shown
9Statistical Analysis with Single Normalization
Factor
- Tends to confirm visual comparison
- In general ?2(G4) gt ?2(Penelope)
- For observables free of extrapolation
uncertainty, always within 16 - Normalization uncertainty is 12 (double-diff.)
and 9 (current int)
10Conclusions
- New detailed data set for normal incidence
backscattering from 43.5 to 124 keV. - Good agreement with Geant4 and Penelope Penelope
gives superior description of relative
distributions and normalization. - Fit gives normalization scale factors in
agreement with unity to within systematic
uncertainties of 12 and 9 (mostly). - Results will be used to assign systematic
uncertainty in UCNA.
11Si Det Final Results
Lines data Histo simulation
Geant 4
Penelope