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PseudoRandom Pattern Generator Design forColumnMatching BIST

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Here are the Buts... Weighted pattern testing works well. OK. ... Here are the Buts... How many weights then? No weights, no weighting logic. More decoder logics. ... – PowerPoint PPT presentation

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Title: PseudoRandom Pattern Generator Design forColumnMatching BIST


1
Pseudo-Random Pattern Generator Design
for Column-Matching BIST
  • Petr Fier
  • Czech Technical University
  • Dept. of Computer Science and Engineering

2
Outline
  • Introduction
  • Mixed-Mode Column-Matching BIST
  • Weighted-Pattern testing splitter
  • Results
  • Conclusions

3
Introduction
  • Discussion on the choice of the pseudorandom
    pattern generator (PRPG) in connection with
    Column-Matching BIST design method
  • Target low area overhead of both the PRPG and
    other BIST logic

4
Column-Matching BIST
  • Pseudorandom patterns are generated by PRPG and
    then modified by a combinational logic into
    deterministic ones (by output decoder)
  • For test-per-clock, patterns are applied in
    parallel

5
Standard Mixed-ModeColumn-Matching BIST
  • Combination of pseudorandom and deterministic
    testing (like bit-fixing, bit-flipping).
  • Difference these phases are disjoint
  • The pseudorandom phase is run first, and then
    deterministic test is generated for undetected
    faults
  • 100 fault coverage assumed

6
PRPG Issues Choices
  • LFSR
  • CA
  • Sometimes better, but not much (see DSD05)
  • LFSR width is one problem to solve
  • PRPG fault coverage is the second problem

7
PRPG Issues Choices
  • m-bit wide LFSR is needed, in the standard
    approach
  • Usually, m goes to thousands
  • gt high PRPG area overhead

8
Solution 1
  • Weighted pattern testing
  • (LFSR outputs are AND-ed or OR-ed, to obtain
    weighted outputs)
  • Shorter LFSR
  • Higher fault coverage
  • - Weighting logic overhead

9
Solution 2
  • Splitter
  • (LFSR outputs are distributed to m CUT inputs by
    branching them)
  • Shorter LFSR
  • - Less fault coverage
  • No weighting logic overhead

10
One Remark to This Weighted Pattern Testing
  • 100 fault coverage is not the aim here
  • The aim is minimum area overhead
  • ?
  • More sophisticated methods, like multiple
    weights, MPLFSR, GURT, etc., are not welcome here

11
Weighting Logic Effects
12
How to Compute Weights
  • Weights are derived from test vectors detecting
    random pattern resistant faults (RPRFs)
  • Question How to find them?
  • Several pseudorandom vectors are applied to the
    CUT (by fault simulation), undetected faults are
    RPRFs.
  • Major question How many vectors?

13
How to Compute Weights
14
Some Comparisons
  • c2670 ISCAS benchmark circuit
  • 233 inputs

15
Scaling Down the LFSR size
  • s13207.1 ISCAS benchmark circuit
  • 700 inputs

16
Conclusions
  • Two (simple) PRPG design methods have been
    investigated weighted pattern testing and
    splitting the LFSR outputs
  • Primarily targeted to lower the area overhead
  • Seems to be simple, but

17
Here are the Buts
  • Weighted pattern testing works well. OK.But how
    many vectors should be simulated to obtain RPRFs
    to compute the weights?

Numerous experiments have been performed, every
benchmark circuit behaves differently
18
Here are the Buts
  • How many weights then? No weights, no weighting
    logic. More decoder logics.
  • Too much weights, too much weighting logics.
    Less Decoder logics.

Numerous experiments have been performed. No
clue, unless the final result is computed
19
Here are the Buts
  • The LFSR width can be scaled. OK.But to what
    extent?

Numerous experiments have been performed. No
clue, unless the final result is computed
20
One Last Conclusion
Lots to think about
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