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Creating NanoPatterns through Atomic Force Microscopy

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Title: Creating NanoPatterns through Atomic Force Microscopy


1
Creating Nano-Patterns through Atomic Force
Microscopy
  • Name Suzie Harvey
  • Level Senior
  • Number of Semesters Participated 4
  • Date of Submission 12/17/04
  • Advisor Dr. Rudy Schlaf
  • Department Electrical Engineering

2
Introduction
  • Nanolithography
  • The process of creating nano-sized patterns on
    a surface.
  • In our experiments the AFM was used to create
    nano-oxide patterns on silicon
  • AFM Controller
  • The AFM has the ability to image and pattern a
    surface through the use of a cantilever and laser
    feedback mechanism.
  • The movement of the cantilever is directed by the
    AFMs control software.

3
Methodology
  • Oxidation
  • Voltage is applied to tip while is passes over
    sample surface.
  • Oxygen bonds attach to surface
  • Oxide grows on surface, creating nano-pattern.
  • PMMA Exposure
  • PMMA is sputtered onto a silicon wafer, and
    placed into AFM.
  • Voltage is applied to tip while is passes over
    surface, exposing the PMMA.
  • MIBK/IPA solution removes only exposed areas,
    leaving an etched pattern.
  • Dip-Pen
  • Tip is dipped into Au solution, dried and placed
    into AFM.
  • Small voltage is applied to tip, transferring Au
    particles onto sample surface to form a pattern.

4
Results
  • Dip-Pen Lithography
  • Au deposits on Titanium
  • Tip Voltage 5V
  • Write Speed 0.5m/s
  • Setpoint Factor .02

Oxidation
  • Oxidation of Silicon
  • Tip Voltage 10V
  • Write Speed 0.5µm/s
  • Setpoint Factor .02
  • Oxide thickness 5nm.
  • Dimensions of pattern 10µm10µm
  • Oxidation of Titanium
  • Tip Voltage 18.33V
  • Write Speed 0.5µm/s
  • Setpoint Factor .02
  • Oxide thickness 50nm.
  • Dimensions of pattern 10µm10µm
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