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Summer School Students Projects

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Agilent 33120A ... Agilent 33250A ... Agilent 33220A ... – PowerPoint PPT presentation

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Title: Summer School Students Projects


1
Summer School Students Projects
2
Summer School Students Projects
  • Develop an ATE for dynamic testing (FFT analysis)
    of ADCs according to IEEE std 1241 and DYNAD to
    compare test methods reported in these two
    standards. Programming language LabView
  • Develop an ATE for the histogram test of ADCs
    according to IEEE std 1241 and DYNAD to compare
    test methods reported in these two standards.
    Programming language LabView
  • Develop an ATE for the time-domain analysis (sine
    fitting algorithm) of ADCs according to IEEE std
    1241 and DYNAD to compare test methods reported
    in these two standards. Programming language
    LabView
  • Develop an ATE for the dual tone test of ADCs
    according to IEEE std 1241 and DYNAD to compare
    test methods reported in these two standards.
    Programming language LabView

At level of category standardization, in 2000 the
Technical Committee 10 of the IEEE
Instrumentation and Measurement Society published
the IEEE 1241. It provides both standard
terminology for specifying the performance of
ADCs and test methods for measuring it
The research project Methods and draft standards
for the DYNamic characterization and testing of
Analog to Digital converters (DYNAD) was
proposed and successfully financed within the 4th
Framework Programme Standard, Measurement and
Testing SMT of the European Union. The project
aimed at integrating and complementing IEC
Standard 60748 for the part concerning dynamic
testing, by proposing a list of parameters
specifying the dynamic behavior of the converter
and indicating in detail the measurement
conditions and the data processing algorithms to
be adopted.
ELECTRONIC VERSIONS OF IEEE STD 1241 AND DYNAD
WILL BE ON THE DESKTOP OF THE PC IN THE LAB
3
Summer School Students Projects
  • Compare numerical results obtained by using test
    methods reported in the IEEE Std. 1241 and DYNAD
  • Compare the two standards also in terms of

readability, easiness of use, completeness and
effectiveness
how easy is to read and comprehend the standard ?
how easy is to carry out the standard test
methods ?
should something be added or changed or deleted
in the standard ?
4
Develop an ATE for dynamic testing (FFT analysis)
of ADCs according to IEEE std 1241 and DYNAD to
compare test methods reported in these two
standards.
THD, SINAD, SNHR, SFDR and ENOB of the ADC of the
PCI6024 DAQ board
The ATE should be composed by a programmable
signal generator connected to a PC via GPIB
interface and the DAQ board.
Agilent 33120A
Dynad
IEEE std 1241
coherent and not coherent
sampling
coherent
sampling
5
Develop an ATE for the histogram test of ADCs
according to IEEE std 1241 and DYNAD to compare
test methods reported in these two standards.
Gain, offset, INL, DNL of the ADC of the PCI6024
DAQ board
The ATE should be composed by a programmable
signal generator connected to a PC via GPIB
interface and the DAQ board.
Agilent 33250A
IEEE std 1241
Dynad
histogram
histogram
ramp
sinewave
sinewave
Gain and Offset, linearity errors definitions
Gain and Offset, linearity errors definitions
least squares fit, end-points and min-max
definition
Independently and terminal based
6
Develop an ATE for the time-domain analysis (sine
fitting algorithm) of ADCs according to IEEE std
1241 and DYNAD to compare test methods reported
in these two standards.
SINAD, ENOB of the ADC of the PCI6024 DAQ board
The ATE should be composed by a programmable
signal generator connected to a PC via GPIB
interface and the DAQ board.
Agilent 33220A
Dynad
IEEE std 1241
parameter
parameter
three and four
fixed-frequency and four
multiharmonic sine-wave fitting
7
Develop an ATE for the dual tone test of ADCs
according to IEEE std 1241 and DYNAD to compare
test methods reported in these two standards.
IMD of the ADC of the PCI6024 DAQ board
The ATE should be composed by a programmable
signal generator connected to a PC via GPIB
interface and the DAQ board.
Tektronix AWG420
Dynad
IEEE std 1241
IMD in the frequency domain
IMD in the frequency and time domain
coherent and not coherent sampling
coherent sampling
8
Guidelines
  • Each developed ATE must be written in LabView
  • A sub VI for each test method must be developed
  • The same notation used in the two standards must
    be considered
  • A detailed report of the work done explaining the
    considered test methods, highlighting existing
    differences in the two standards and thoroughly
    describing the developed LabView code, has to be
    written
  • Presentation of the results of the Individual
    Case Studies
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