SCIENTIFIC TEST INC'

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SCIENTIFIC TEST INC.
SERIES 5000 TESTER FAMILY
TESTER
HCD
SCANNER
LCD
MUX
MUX STATION
ADP340-5
FIXTURES
ADP401
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SCIENTIFIC TEST INC.
5300HS TESTER

• The Model 5300HS is a high speed discrete test
  system capable of testing a wide variety of
  devices. It employs an A/D converter for fast
  measure and datalog. Real time math allows
  comparison of test results and computation of
  figures on merit. Options provide scanning,
  voltage and current range extension and
  multiplexing.

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SCIENTIFIC TEST INC.
LOW CURRENT DECK

• LC-1000
• Low Current Test Deck
• Adds Soak to 99 seconds for current less than
  1uA.
• Extends leakage measurements downward to 20
  picoamp with 1 picoamp resolution.

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SCIENTIFIC TEST INC.
HIGH CURRENT DECK

• HC-500 - 500 Amp Current Capability.
• HC-1000 - 1000 Amp Current Capability.
• HC-1200 - 1200 Amp Current Capability.

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SCIENTIFIC TEST INC.
SCANNER
Front
Rear

• SCANNER 50A / 2KV Automatic Programmable per
  step Scanner for multiple device packages. Up
  to 20 Scans available.

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SCIENTIFIC TEST INC.
MULTIPLEXER MUX STATION

• MULTIPLEXER 3 or 4 outputs
• OPTIONS
• MUX Manual Stations
• Handler connections

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SCIENTIFIC TEST INC.
ADP340-5

• ADP340-5
• Ring-Com, Tip-Com, Tip-Ring connections for 4/5
  pin modules.
• VL (100V/us) test plus all SSOVP Tests
• Gated Device Capability Optional
• RCOIL Test included

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SCIENTIFIC TEST INC.
ADP401 MATRIX SCANNER

• ADP401 Matrix Scanner 30A / 1KV
• ADP401 4, 8, or 16 pins DIP
• ADP401 A-8 8 pins totally programmable
• ADP401 A-16 16 pins totally programmable

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SCIENTIFIC TEST INC.
SYSTEM CONFIGURATION

• SYSTEM CONFIGURATION WITH TESTER, MUX AND 2
  MANUAL STATIONS

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SCIENTIFIC TEST INC.
SYSTEM CONFIGURATION

• SYSTEM CONFIGURATION WITH TESTER AND HIGH CURRENT
  DECK

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SCIENTIFIC TEST INC.
FIXTURES

• A variety of Fixtures and Adapters are available
  for many package configurations including surface
  mount devices. See Price list.

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SCIENTIFIC TEST INC.
DEVICES TESTED

• TRANSISTOR
• TRIAC
• SCR
• MOSFET
• DIODE
• ZENER
• OPTO
• REGULATOR
• CURRENT REGULATOR
• MOV

• SSOVP
• 4 / 5 PIN MODULE
• GATED OVP
• QUADRAC
• DIAC
• SIDAC
• IGBT
• STS
• RELAY
• J-FET

Quadrac is a regestered trademark or
trademark of Teccor Electronics
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SCIENTIFIC TEST INC.
VOLTAGE / CURRENT

• Voltages
• 1KV (Optional 2KV)
• Max Resolution 1mV
• Current
• 50A Max (Optional 500/1000/1200 with High Current
  Deck)
• Max Resolution 0.1nA (1pA with Low Current Deck)
• SSOVP
• 900ma _at_ 400V

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SCIENTIFIC TEST INC.
TEST METHODS

• Single Test Measure
• Most tests are measured directly using a fast A/D
  converter. The specified drive condition is
  applied to the device and the resulting parameter
  is measured. BVZ, for example, is performed by
  applying the specified IZ to the device and
  measuring BVZ. Some tests are not as straight
  forward to accomplish with a single application
  of stimulus gain of a transistor and trigger
  parameter of a Triac are among them.
• Gain HFE, VGSON
• Transistor hFE is measured in a single test by
  driving IC indirectly. IB is measured and hFE
  computed and reported. Pulse duration is 300us
  at 10MA and above, longer below 10MA. MOSFET
  VGSON is performed in a similar manner. gFS can
  be computed in real time from two VGSON tests.

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SCIENTIFIC TEST INC.
TEST METHODS

• Triple-Ramp, Trigger tests, Breakover, VGT, IGT,
  VBO, IH
• Trigger and breakover parameters are difficult to
  measure with a single application of stimulus
  because of their negative resistance
  characteristics. The 5300HS uses a proprietary
  triple ramp method. The ramps are composed of
  discrete steps, each with increasing resolution.
  Gate trigger current and voltage are typically
  measured in less then 20 ms. The triple ramp is
  used for IGT, VGT and VBO tests on SCRs, Triacs,
  Quadracs, Diacs, Sidacs, STSs and other negative
  resistance devices.
• 1 KHZ Zener Impedance
• Zener impedance is performed by modulating the
  programmed IZ current 10 RMS at 1KHZ. The
  resultant 1KHZ voltage across the Zener is
  extracted, amplified and filtered. The
  measurement is made using 4 full cycles and
  computing the RMS value at up to 1uV resolution.
  A very accurate result is thereby obtained in
  only one test application. Total measure time is
  less than 15 ms.

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SCIENTIFIC TEST INC.
SOFTWARE / FIRMWARE FEATURES

• Wafer Mapping (Optional)
• Delta-On-The-Fly (Optional)
• Datalog directly into Excel
• Real Time SPC
• Auto-Calibrate
• Real Time Math
• True Parameter Substitution
• Programmable delay between tests
• 16 pin Matrix Programmable Scanner
• 96 Tests
• 99 Sorts

• 16 Logical Bins
• Sort Qualifying on Pass or Fail
• Branch on 1st non-qualifying test
• 4 programmable Relay drivers/test
• IEEE Interface
• Connections to USB or Serial Ports
• BIN Alarm
• Programmable EOT Pulse
• Programmable BIN Result Signal
• Live Lot Summary Data
• High Speed Data Capture to Disk

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SCIENTIFIC TEST INC.
TEST PROGRAM SUMMARY SCREEN

• Send Test Program to Tester.

• Save Test Program.

• Print Program.

• Add a new test step.

• Create or edit Operator Information File.

• These buttons control the STI Tester

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SCIENTIFIC TEST INC.
TEST PROGRAM SUMMARY SCREEN
Double Click to edit the Test Step
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SCIENTIFIC TEST INC.
TEST PROGRAM SUMMARY SCREEN

• Use the TAB Key to move from entry to entry

• Accepts the entries.

• ESC Key to quit

• Indicates valid entry range

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SCIENTIFIC TEST INC.
CALCULATION SUMMARY SCREEN
Double click to edit Calculation Screen
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SCIENTIFIC TEST INC.
CALCULATION SUMMARY SCREEN

• STI Expression Editor
• Calculation Entry (up to 11 characters.
• Relation (Changed by Space Bar)
• Calculation Limit Entry
• Units (eg. A, V, O)
• Actual calculation which can include references
  to previous test steps.
• Click to accept the values entered (Press ESC
  key to quit).

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SCIENTIFIC TEST INC.
OPTIONS SCREEN
Allows the user to customize the Test Program
Options.
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SCIENTIFIC TEST INC.
BIN / SORT PLAN SCREEN
Allows user to specify Binning and Sorting
details. Double click on the highlighted item to
change. (see STI Manual for complete details)
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SCIENTIFIC TEST INC.
ADP-401 SCANNER PLAN SCREEN
Allows user to customize the ADP-401 for the
device configuration needed. A, G, K and Gnd can
be assigned to the socket pins required.
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SCIENTIFIC TEST INC.
TESTER CONTROLS SCREEN

• A Test Program can be saved to, loaded or
  deleted from the memory in the CPU of the Tester.
• This allows a Test Program to be recalled and
  does not have to be downloaded every time the
  Tester is powered OFF and ON.

• EOT and BIN Results are factory set but can be
  changed by the user depending on the needs of the
  Handler being used.
• Click the Handler Button in the Tester Setup
  to make changes.

• Tester Setups are factory set but can be changed
  by the user if the need arises.
• These setups are the type that will usually
  never have to be changed.

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SCIENTIFIC TEST INC.
DATALOG SCREEN
Exact Value Window is acquired by clicking the
Runtime tab on the main screen, then clicking
on Exact Value in the pull-down menu.
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SCIENTIFIC TEST INC.
DATALOG SCREEN
Lot Summary Window Right Mouse Click inside
window for popup menu to edit Lot Summary
Exact Value Window Displays Test data received
from tester. Right Mouse Click inside window for
popup menu to edit Datalog functions, such as Log
every nth, etc.
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SCIENTIFIC TEST INC.
DATALOG SCREEN
Start Button starts a complete test sequence or
a single test.
For single test, enter the test number and check
the box for Measure (M) or Pass/Fail (PF)
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SCIENTIFIC TEST INC.
DATALOG SCREEN
Toggles Datalog Capture
Starts Test Sequence
Refer to the STI Manual for operation of Lot
Summary function buttons
Sends datalog data to an EXCEL file
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SCIENTIFIC TEST INC.
SELF-TEST FEATURE

• Self-Test
• Executes a series of test routines to confirm
  functional operation of the system. A supplied
  Self-test fixture is plugged into the front
  panel. Proper operation of all power supplies,
  relays, modes and gains is confirmed. Error
  codes are keyed to a fault table in the STI
  Operation Manual to provide guidance in
  troubleshooting.

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SCIENTIFIC TEST INC.
SELF-TEST FEATURE
On the interface screen, press the Self Test
button and the STI Self Test screen will appear.
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SCIENTIFIC TEST INC.
SELF-TEST FEATURE

• Press the Start button.
• The Start button will go dim indicating self
  test is running.
• When Self Test is complete the Display will
  indicate the results.
• CHECK-OUT GOOD
• ERROR CODE- XX
• Run BLOCK indicated

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SCIENTIFIC TEST INC.
SELF-TEST FEATURE

• Press the Start button.
• The Start button will go dim indicating self
  test is running.
• When Self Test is complete the Display will
  indicate the results.
• CHECK-OUT GOOD
• ERROR CODE- XX
• Run BLOCK indicated

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SCIENTIFIC TEST INC.
AUTO-CALIBRATION FUNCTION

• Auto-Calibration
• A simple procedure can be initiated by the
  operator anytime. Correction factors are stored
  in Flash Memory in the CPU and used to
  appropriately correct all drive and measure
  amplifier offsets.

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SCIENTIFIC TEST INC.
AUTO-CALIBRATION FUNCTION

• Select Autocalibrate

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SCIENTIFIC TEST INC.
AUTO-CALIBRATION FUNCTION

• When Auto Cal button is pressed the new Auto
  Cal Factors will be displayed.
• The ZERO button will zero all factors
• When SAVE button is pressed the factors will be
  saved into Flash Memory in the CPU.
• Until they are saved you can recall the already
  saved factors by pressing the RECALL button.

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SCIENTIFIC TEST INC.
WAFER MAPPING FUNCTION

• Wafer Mapping
• A procedure whereby wafer attributes may be
  mapped.
• User selectable attribute may be
• LOGICAL BIN (up to 16 and Fail)
• INDIVIDUAL TEST RESULT (up to 16 divisions)
• SORT (up to 16 and Fail)
• Test result range and number of divisions are
  user entered.
• Attribute colors are user selectable.

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WAFER MAPPING SAMPLE
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TABLE OF TESTS
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TEST SPECIFICATIONS
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TEST SPECIFICATIONS
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SCIENTIFIC TEST INC.
See your local Representative for further details
and to place an order!