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CFT Hardware

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Pulse height spectra measured in SVX chips ... Temperature, will be determined at Boeing, it is part of chip's characterization ... – PowerPoint PPT presentation

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Title: CFT Hardware


1
CFT Hardware
  • Scintillating fibers, light guides
  • VLPC chips-Visible Light Photon Counters
  • 9600 chips for CFT
  • 12608 chips for CFTCPSFPS
  • 100864 individual pixels (12608 chips8
    pixels/chip)
  • SIFT chips-
  • SVX chips

Scintillating fiber
Light guide
trigger
VLPC
SIFT
SVX
2
Monitoring and CalibrationGoals and Means
  • Detection and diagnostics of broken, inefficient,
    or malfunctioning channels (fibers, light
    guides, electronics)
  • Setting and control of operating parameters
  • VLPC bias and temperature
  • SIFT threshold
  • SVX threshold
  • LED light injected into the system
  • Pulse height spectra measured in SVX chips
  • The background simulated by second (so called
    background) LED

3
Testing of VLPC chips now at Boeing
  • LED illuminate VLPC chips
  • Camac crate with LeCroy ADCs
  • NIM electronics
  • Windows NT Workstation with two CPUs
  • DAQ Object Oriented Program based on Microsoft
    Foundation Classes
  • Two CPUs use MINUIT to fit pulse height spectra
    of every pixel to four gaussian peaks
  • Access Database

pedestal
signal
4
Starting in AutumnCalibrating in Lab. 3
  • LED induced spectra measured with and without
    background LED
  • DAQ
  • Embedded processors in VME crates with VRB
    modules and DART Fermilab Acquisition System.
    DART will be running in DØ for silicon tests.
    Also EPICS needed to download SVX chips
  • Window NT-Paul Padley DAQ
  • Database?

S B
Scintillating fiber
LEDs
Light guide
Signal Background
VLPC
SIFT
SVX
5
Setting and Control ofVLPC bias, SVX threshold
  • Temperature, will be determined at Boeing, it is
    part of chips characterization
  • Bias for VLPC chips, threshold for SVX chips
  • Bias the bias at which chips efficiency is
    maximum.
  • Both determined at Boeing at the rate of 20 MHz
    of single photoelectrons, LED generated
    background
  • Both checked during test in Lab. 3
  • We would like to repeat this in dedicated
    calibration runs during the store.

6
Calibration Runs in Run IIPedestal runs
  • Goal Detection of dead and noisy channels
  • Bias on VLPC chips set to 4.0 V
  • Measured pulse height distributions with the use
    of SVX chips. The quantities calculated are
  • Mean of pulse height distribution
  • RMS of pulse height distribution
  • These runs are done outside the store

2100864 numbers
7
Calibration Runs in Run IILED runs
  • Goalto detail the performance of each chip
  • Measured pulse height distributions for each
    pixel
  • Dark current pulse height distributions
  • LED-ON pulse height distributions
  • Outside store
  • During store. Minimum 40000 triggers needed. No
    background LED
  • LED timing such that signal induced by LED comes
    in abort gap
  • Fired LED generates L1 accept, L2 accept and L3
    accept
  • Analysis compares Beam OFF and Beam ON pulse
    height spectra
  • Gains and relative QE found by fitting pulse
    height distributions to multigaussian
    distributions
  • Paul Padley using two processors, each 233 MHz
    fits 15 chips in 5 minutes
    12608 chips(5min/15chips) 2.9 days

2100864 histograms stored and analyzed
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