Title: VIII' Pattern Transfer: Additive techniquesPhysical Vapor Deposition and Chemical Vapor Deposition
1VIII. Pattern Transfer Additive
techniques-Physical Vapor Deposition and Chemical
Vapor Deposition Winter 2009
2Content
- Physical vapor deposition (PVD)
- Thermal evaporation
- Sputtering
- Evaporation and sputtering compared
- MBE
- Laser sputtering
- Ion Plating
- Cluster-Beam
- Chemical vapor deposition (CVD)
- Reaction mechanisms
- Step coverage
- CVD overview
- Epitaxy
- Electrochemical Deposition
3Physical vapor deposition (PVD)
- The physical vapor deposition technique is based
on the formation of vapor of the material to be
deposited as a thin film. The material in solid
form is either heated until evaporation (thermal
evaporation) or sputtered by ions (sputtering).
In the last case, ions are generated by a plasma
discharge usually within an inert gas (argon). It
is also possible to bombard the sample with an
ion beam from an external ion source. This allows
to vary the energy and intensity of ions reaching
the target surface.
4Physical vapor deposition (PVD) thermal
evaporation
The number of molecules leaving a unit area of
evaporant per second
6
5Physical vapor deposition (PVD) thermal
evaporation
This is the relation between vapor pressure
of the evaporant and the evaporation rate. If a
high vacuum is established, most molecules/atoms
will reach the substrate without intervening
collisions. Atoms and molecules flow through the
orifice in a single straight track,or we have
free molecular flow
The fraction of particles scattered by collisions
with atoms of residual gas is proportional to
The source-to-wafer distance must be smaler than
the mean free path (e.g, 25 to 70 cm)
The cosine law
6Physical vapor deposition (PVD) thermal
evaporation
From kinetic theory the mean free path relates
to the total pressure as
Since the thickness of the deposited film, t, is
proportional To the cos b, the ratio of the film
thickness shown in the Figure on the right with
? 0 is given as
7 Physical vapor deposition (PVD) sputtering
Momentum transfer
-V working voltage - i discharge current - d,
anode-cathode distance - PT, gas pressure - k
proportionality constant
8Evaporation and sputteringcomparison
9Physical vapor deposition (PVD) MBE, Laser
Ablation
- MBE
- Epitaxy homo-epitaxy hetero-epitaxy
- Very slow 1µm/hr
- Very low pressure 10-11 Torr
- Laser sputter deposition
- Complex compounds (e.g. HTSC, biocompatible
ceramics)
-
10Physical vapor deposition (PVD) Ion cluster
plating
- Ionized cluster it is possible to ionize atom
clusters that are being evaporated leading to a
higher energy and a film with better properties
(adherence, density, etc.). - From 100 mbar (heater cell) to 10-5 to 10-7 mbar
(vacuum)--sudden cooling - Deposits nanoparticles
- Combines evaporation with a plasma
- faster than sputtering
- complex compositions
- good adhesion
11Physical vapor deposition (PVD)Ion cluster
plating and ion plating
- Gas cluster ions consist of many atoms or
molecules weakly bound to each other and sharing
a common electrical charge. As in the case of
monomer ions, beams of cluster ions can propagate
under vacuum and the energies of the ions can be
controlled using acceleration voltages. A cluster
ion has much larger mass and momentum with lower
energy per atom than a monomer ion carrying the
same total energy. Upon impact on solid surfaces,
cluster ions depart all their energy to an
extremely shallow region of the surface. Cluster
plating material is forced sideways and produces
highly smooth surfaces. - Also individual atoms can be ionized and lead to
ion plating (see figure on the right, example
coating very hard TiN)
12Chemical vapor deposition (CVD) reaction
mechanisms
- CVD Diffusive-convective transport of depositing
species to a substrate with many intermolecular
collisions-driven by a concentration gradient
- Mass transport of the reactant in the bulk
- Gas-phase reactions (homogeneous)
- Mass transport to the surface
- Adsorption on the surface
- Surface reactions (heterogeneous)
- Surface migration
- Incorporation of film constituents, island
formation - Desorption of by-products
- Mass transport of by-produccts in bulk
SiH4
SiH4
Si
13Chemical vapor deposition (CVD) reaction
mechanisms
- Energy sources for deposition
- Thermal
- Plasma
- Laser
- Photons
- Deposition rate or film growth rate
(Ficks first law)
(Boundary layer thickness)
(gas viscosity h, gas density r, gas stream
velocity U)
(Dimensionless Reynolds number)
(by substitution in Ficks first law and Dxd)
14Chemical vapor deposition (CVD) reaction
mechanisms
- Mass flow controlled regime (square root of gas
velocity)(e.g. AP CVD 100-10 kPa) FASTER - Thermally activated regime rate limiting step is
surface reaction (e.g. LP CVD 100 Pa----D is
very large) SLOWER
15Chemical vapor deposition (CVD) step coverage
- Step coverage, two factors are important
- Mean free path and surface migration i.e. P and T
- Mean free path l
0
q180
q is angle of arrival
z
0
q90
q270
0
a
w
16Chemical vapor deposition (CVD) overview
- CVD (thermal)
- APCVD (atmospheric)
- LPCVD (lt10 Pa)
- VLPCVD (lt1.3 Pa)
- PE CVD (plasma enhanced)
- Photon-assisted CVD
- Laser-assisted CVD
- MOCVD
17Chemical vapor deposition (CVD) L-CVD
- The LCVD method is able to fabricate continuous
thin rods and fibres by pulling the substrate
away from the stationary laser focus at the
linear growth speed of the material while keeping
the laser focus on the rod tip, as shown in the
Figure . LCVD was first demonstrated for carbon
and silicon rods. However, fibres were grown from
hundreds of substrates including silicon, carbon,
boron, oxides, nitrides, carbides, borides, and
metals such as aluminium. The LCVD process can
operate at low and high chamber pressures. The
growth rate is normally less than 100 µm/s at low
chamber pressure (ltlt1 bar). At high chamber
pressure (gt1 bar), high growth rate (gt1.1 mm/s)
has been achieved for small-diameter (lt 20 µm)
amorphous boron fibres.
18Epitaxy
- VPE
- MBE (PVD) (see above)
- MOCVD (CVD) i.e.organo-metallic CVD(e.g.
trimethyl aluminum to deposit Al) (see above) - Liquid phase epitaxy
- Solid epitaxy recrystallization of amorphous
material (e.g. poly-Si)
Liquid phase epitaxy
19Epitaxy
- Selective epitaxy
- Epi-layer thickness
- IR
- Capacitance,Voltage
- Profilometry
- Tapered groove
- Angle-lap and stain
- Weighing
Selective epitaxy
20Electrochemical deposition electroless
- Electroless metal displacement
- Electroless sustainable oxidation of a reductant
- Metal salt (e.g.NiCl2)
- Reductant (e.g.hypophosphite)
- Stabilizerbath is thermodynamically unstable
needs catalytic poison (e.g. thiourea) - Complexing agent prevent too much free metal
- Buffer keep the pH range narrow
- Accelerators increase deposition rate without
causing bath instability (e.g. pyridine)
- Deposition on insulators (e.g. plastics) seed
surface with SnCl2/HCl - 1. Zn(s) Cu 2(aq) ------gt Zn 2(aq) Cu(s)
- 2. Reduction (cathode reaction)
- Ni2 2e- gt Ni
- Oxidation (anode reaction)
- H2PO 2- H2Ogt H2PO3- 2H 2e-
------------------------------------------ - Ni2 H2PO2- H2O gt Ni H2PO3- 2H
- e.g. electroless Cu 40 µmhr-1
Cu
21Electrochemical deposition electroless
Evans diagram
- Evans diagram electroless deposition is the
combined result of two independent electrode
reactions (anodic and cathodic partial reactions) - Mixed potential (EM) reactions belong to
different systems - ideposition ia ic and IA x i deposition
- Total amount deposited m max I t M/Fz (t is
deposition time, Molecular weight, F is the
Faraday constant, z is the charge on the ion) - CMOS compatible no leads required
-
F 96,500 coulombs1, 6 10 -19 (electron charge)
x 6. 02 10 23 (Avogadros number)
22Electrochemical deposition electrodeposition-ther
modynamics
- Electrolytic cell
- Au cathode (inert surface for Ni deposition)
- Graphite anode (not attacked by Cl2)
- Two electrode cells (anode, cathode, working and
reference or counter electrode) e.g. for
potentiometric measurements (voltage
measurements) - Three electrode cells (working, reference and
counter electrode) e.g. for amperometric
measurements (current measurements)
23Electrochemical deposition electrodeposition-ther
modynamics (E)
1. Free energy change for ion in the solution to
atom in the metal (cathodic reaction)
or also
(1)
2. The electrical work, w, performed in
electrodeposition at constant pressure and
constant temperature
and since DV 0
(2)
3. Substituting Equation (2) in (1) one gets
(Nernst equation)
4. Repeat (1) and (2) for anodic reaction
or
E2 gt E1 - battery E2 lt E1 E ext gt E cell
to afford deposition
24Electrochemical deposition electrodeposition-ther
modynamics (h)
- A thermodynamic possible reaction may not occur
if the kinetics are not favorable - Kinetics express themselves through all types of
overpotentials - E -E o h ( anodic and - is cathodic)
25Electrochemical deposition electrodeposition-kine
tics-activation control
- Understanding of polarization curves consider a
positive ion transported from solution to the
electrode - Successful ion jump frequency is given by the
Boltzmann distribution theory (h is Planck
constant)
(without field)
(with field)
26Electrochemical deposition electrodeposition-kine
tics-activation control
- At equilibrium the exchange current density is
given by - The reaction polarization is then given by
- The measurable current density is then given by
- For large enough overpotential
(Butler-Volmer)
(Tafel law)
27Electrochemical deposition electrodeposition-kine
tics-diffusion control
we get
- From activation control to diffusion control
- Concentration difference leads to another
overpotential i.e. concentration polarization - Using Faradays law we may write also
- At a certain potential C x00 and then
28Electrochemical deposition electrodeposition-non-
linear diffusion effects
- Nonlinear diffusion and the advantages of using
micro-electrodes - An electrode with a size comparable to the
thickness of the diffusion layer - The Cottrell equation is the current-vs.-time on
an electrode after a potential step - For micro-electrodes it needs correction
29Electrochemical deposition electrodeposition-non-
linear diffusion effects
- The diffusion limited currents for some different
electrode shapes are given as (at longer times
after bias application and for small electrodes) - If the electrodes are recessed another correction
term must be introduced
30Homework
- Homework demonstrate equality of l
(pRT/2M)1/2 h/PT and l kT/2 1/2 a 2 p PT (where
a is the molecular diameter) - What is the mean free path (MFP)? How can you
increase the MFP in a vacuum chamber? For metal
deposition in an evaporation system, compare the
distance between target and evaporation source
with working MFP. Which one has the smaller
dimension? 1 atmosphere pressure ____ mm Hg
___ torr. What are the physical dimensions of
impingement rate? - Why is sputter deposition so much slower than
evaporation deposition? Make a detailed
comparison of the two deposition methods. - Develop the principal equation for the material
flux to a substrate in a CVD process, and
indicate how one moves from a mass transport
limited to reaction-rate limited regime. Explain
why in one case wafers can be stacked close and
vertically while in the other a horizontal
stacking is preferred. - Describe step coverage with CVD processes.
Explain how gas pressure and surface temperature
may influence these different profiles.