Title: Focusing effect of open tip carbon nanotube
1Electrical Switching in Carbon Nanotubes and
Conformational Transformation of
Chain Molecules
2006. 8. 30
Jisoon Ihm School of Physics, Seoul National
University
2Collaborators
- Sangbong Lee, Seungchul Kim, Byoung Wook Jeong
(Seoul Natl Univ.) - Young-Woo Son ,Marvin Cohen, Steven Louie
(Berkeley)
3BasicsSubstitutional Impurity in Metallic Carbon
Nanotubes
Boron or Nitrogen
Tube axis
4Electronic Structure of Metallic Armchair Nanotube
Band structure of a (10,10) single-wall nanotube
( LDA, first-principles pseudopotential method )
5CBM
VBM
6Tube axis
7Conductance with Boron Impurity
Similarity to acceptor states in semiconductors
A
A
H.J. Choi et al, PRL 84, 2917(2000)
8Conductance with Nitrogen Impurity
Similarity to donor states in semiconductors
D
D
9I. Electrical switching in metallic carbon
nanotubes
( Y.-W. Son, J. Ihm, etc., Phys. Rev. Lett. 95,
216602(2005) )
101. Motivation
- Metallic and semiconducting carbon nanotubes are
produced simultaneously.
C. Dekker, A. Zettl
Selection Problem!
- Semiconducting nanotubes easy to change
conductance using gate - Metallic nanotubes robust against impurities,
defects, or external fffffffff
fields (difficult to change conductance)
111. Motivations contd
Is it possible to control the conductance of
metallic single-wall carbon nanotubes?
S.B. Lee, A. Zettl
Interplay between defects and electric fields
electron flow
122. Calculational Method
2
Landauer formalism
SCattering-state appRoach for eLEctron Transport
(SCARLET) H. J. Choi et al, PRB 59, 2267(1999),
and in preparation
133. B(N) doped (10,10) SWNT
144. Switching in B-N codoped (10,10) SWNT
B
N
- Switching behavior off/on ratio607kO/6.4kO100
- Maximum resistance depends on the relative
position between N and B. - Asymmetric resistance w.r.t. the direction of Eext
155. Scaling for larger (n,n) SWNT
?H ? Eext ? (diameter)2
166. Switching in (10,10) SWNT with Vacancies
- Four carbon atoms are removed (Strong repulsive
potential). - Doubly degenerate quasibound states at fermi
level - Switching behavior off/on ratio1200kO/6.4kO
200 - Symmetric resistance w.r.t. the direction of Eext
176. Switching in (10,10) with Vacancies contd
Quasibound states move up or down depending on
the direction of Eext.
18Summary
- Conductance of metallic CNTs with impurities and
applied electric fields is studied. - With N and B impurity atoms on opposite sides,
asymmetric switching is possible using external
fields. - With a large vacancy complex, symmetric switching
is possible using external fields.
19II. Conformational Transform of Azobenzene
Molecules
( B.-Y. Choi et al., Phys. Rev. Lett. 96,
156106(2006) )
20Azobenzene (AB) C6H5-NN-C6H5
21Transformation between transAB and cisAB
(Voltage bias using STM)
22Geometries of tAB
23Geometries of cAB
24Optimal geometry of tAB and cAB
25STS for tAB and cAB
26Disperse Orange 3 (NH2-C6H4-NN-C6H4-NO2)
27Flat geometry of cAB
28(No Transcript)
29Summary
- Electrical pulse is found to induce molecular
flip between trans and cis structures.
30Example of MATERIAL DESIGN totalreflection by
three nitrogen impurities
Appendix
Importance of geometric symmetry (equilateral
triangle)
Doubly degenerate impurity states cause perfect
reflection at 0.6 eV.
(Both even and odd states are fully reflected at
same energy.)
31 Difference between Eext and impurity potential U
Lippman-Schwinger formalism Eigenstate ?gt of
Htot associated with the eigenstate ?gt of H0
with the same energy E (with impurity potential U
at site a)
32Projection on to the impurity ?gt
where
Reflection for the specific state ?gt
Total transmission
Resonance condition
33Effect of Eext Greens function itself changes.
G0 projected at site a
With applied electric fields,
Suppose ?H at site a is ?E.
In other words, is G0(aE)
shifted by ?E.
34(10,10) SWNT with single attractive impurity of
U-5t
35Changing Eext is different from changing U.
(10,10) SWNT with a single attractive impurity of
U-5t while changing Eext
36SAMSUNG SDI FED 2005 -
37Power consumption of SED, LCD, PDP (36in)
Canon-Toshiba SED at CEATEC2004
SED
LCD
PDP