Title: Beyond Thermal Budget: Simple Kinetic Optimization in RTP
1Beyond Thermal Budget Simple Kinetic
Optimization in RTP
- Lecture 13a Text Overview
2Two Approaches to Kinetic Modeling
- Sophisticated
- Detailed kinetics
- Treatment integrated with uniformity, strain
- Computationally intensive
- Not-so-sophisticated
- Simplified kinetics
- Heuristic integration of process constraints
- Computationally simple
Here we employ second approach
3Thermal Budget Basic Idea
- Definition varies in common usage
- Product of T and t
- Area under a T-t curve
- Area under a D-t curve
- Principle minimum budget optimizes against
unwanted rate processes - Diffusion
- Interface degradation
- Many others
4Merits of the Concept
- Positives
- Appealing metaphor like fiscal budget
- Successfully predicts kinetic advantages of RTP
over conventional furnaces - Negatives
- Definition varies, ambiguous treatment
- Focuses excessively on initial, final states
- Tends to ignore transformations during ramp
- Ignores rate selectivity
5Controlled Test of the Concept
- Simultaneous Si CVD (desired) and dopant
diffusion (undesired) - Undoped Si on B-doped Si
- Undoped Si on Cu-doped Si
- Fix CVD thickness, measure dopant profile by SIMS
- See whether budget minimization works for
- Eundes gt Edes
- Eundes lt Edes
See R. Ditchfield and E. G. Seebauer, JES 40
(1997) 1842
6T-t Curves B on Si
- Undoped Si grown epitaxially on B-doped Si(100)
- Tgt730C, 57.5 nm
- Hi T ? lowest budget
- Ediff 3.6 eV Edep 0.52 eV
7Boron Profiles
- Lowest budget (Hi T) gives worst spreading
- Thermal budget prediction fails
8T-t Curves Cu in Si
- Undoped Si grown epitaxially on Cu-doped Si(100)
- Tlt700C, 57.5 nm
- Hi T ? lowest budget
- Ediff 1.0 eV Edep 1.5 eV
9Copper Profiles
- Lowest budget (Hi T) gives best spreading
- Thermal budget prediction OK
10Summary of Experiments
- T-t budget minimization fails completely when
Eundes gt Edes - D-t minimization works
- x2 6Dt is always smallest for minimum budget
- but
- Ignores rate selectivity doesnt give unique
prediction for T-t profile
11Ambiguity of Budget Minimization
Minimize t
Minimize T
- These scenarios give different kinetic results
- Need consideration of rate selectivity
12Setting the Stage Desiderata
- Typical desired rate processes
- CVD
- Silicidation
- Oxidation/nitridation
- Post-implant annealing/activation
- Typical undesired rate processes
- TED
- Interface degradation
- Silicide agglomeration
13Problem Formulation
- Restrict attention appropriately
- Ignore strain, uniformity, control
- Focus on one desired, one undesired rate
- Assume suitable rate data exist
- Focus on integrated (not instantaneous) rates
? r(t,T) dt vs. r(t,T)
14Phenomenological View of Activation Energy
- Ignore notions of activation barrier
- Applies to single, elementary steps only
- Qualitative view
- Describes strength of T dependence
- Higher Ea ? stronger T variation of rate
- Quantitative description
Ea d(lnK)/d(1/kBT)
15Effects of Activation Energy
- t varies strongly with T
- High slope
- t varies weakly with T
- Low slope
16A Subtle Distinction
- We use t-T curves to represent actual time and
temperature
- We use T-t curves to represent total process
times for design purposes
17Rate Selectivity
- Principle
- Processing Rules
- If Eundes gt Edes ? favor low T
- If Eundes lt Edes ? favor high T
- Corollaries
- Get to and from soak T (or max T in spike) as
fast as possible - No kinetic advantage to mixture of ramp and soak
At high T, rate with stronger T dependence wins
18Eundes lt Edes
- Use fast ramp and cool
- High T best, limited only by process constraints
on Tmax
19Eundes gt Edes
- Use fast ramp and cool
- Low T best, limited only by process constraints
on tmax
20Accounting for Constraints Examples
- T constraints
- Tmax ? wafer damage, differential thermal exp.
- Tmin ? thermodynamics (dopant activation)
- t constraints
- tmax ? throughput
- tmin ? equipment limitations (maximum heating
rate)
21Formulation of Constraints
- Half-window upper or lower limit
- Most undesired phenomena upper limit
- Degree of interface degradation
- Extent of TED
- Some desired phenomena lower limit
- Defect annealing
- Silicidation
- Full window upper and lower limit
- Some desired phenomena
- Film deposition
- Oxidation
22Window Collapse
max
min
- Hopefully shaded area is nondegenerate!
23Mapping of Constraints Half Window
24Mapping of Constraints Full Window
25Superposing other Process Constraints
26Final Optimization
- From a kinetic perspective, its usually best to
operate - Better along an edge of allowed window
- Best at a corner
- Example Eundes gt Edes
- Lowest T gives best selectivity
- Lowest t gives best throughput
- Alternatives
- Highest T gives best rate at cost of selectivity
27Spike Anneals
- Characteristics
- No soak period
- Sometimes very fast ramp (gt 400/C)
- Motivation
- Takes selectivity rules for high T to their
logical extreme - Improved kinetic behavior, esp. in post-implant
annealing
28An Idealized Spike
- Assume
- Linear ramp up at rate ? (?C/s)
- Cooling by radiation only
- Constant emissivity
- Surroundings at negligible temperature
- Assumptions satisfactory only for
semiquantitative results
29Mathematical Analysis
- Simplified kinetic expressions
- Desired
- differential r A exp(Ed /kT)
- integral R ? r dt
- Undesired
- integral x 2 6Dt
- 6Do exp(Eu /kT)t
30Integrated Rates during Ramp Up
- Ramp up
- Desired
-
- Undesired
- These integrals need an approximation to evaluate
analytically -
31Laplace Asymptotic Evaluation
- Integrals like have the form
-
for y gtgt 1
so that
and
so
32Behavior of Laplace Approximation
- With E/kTM ? 30, approximation is good to 7
- More accurate (1) approximation comes from the
Incomplete Gamma Function
- See E. G. Seebauer, Surface Science, 316 (1994)
391-405.
33Laplace Approximations to Rates during Ramp Up
- Ramp up
- Desired
-
- Undesired
-
- Note 1/? trades off with E the way t does in
non-ramp expressions
34Effects of Activation Energy
- t varies strongly with T
- High slope
- t varies weakly with T
- Low slope
35Laplace Approximations to Rates during Cool-Down
- Cool down
- Desired
-
- Undesired
-
36Total Integrated Rates
- Desired
-
- Undesired
- Control variables ? and TM only
- If ? gtgt CTM4, increasing ? brings little extra
return -
37Mapping of Constraints Half Window
38Mapping of Constraints Full Window
39Mapping of Constraints Full Window
- Optimal point shown to give most throughput
40Summary
- Concept of thermal budget problematic
- Rate selectivity more reliable
- Simple graphical procedure helps conceptualize
2-rate problems, including constraints - Framework can be generalized to 3 or more rates
- Laplace approximation useful for variable-T
applications
41For Further Reference
- R. Ditchfield and E. G. Seebauer, General
Kinetic Rules for Rapid Thermal Processing,
Rapid Thermal and Integrated Processing V (MRS
Vol. 429, 1996), 133-138. (General rules, child
metaphor) - E. G. Seebauer and R. Ditchfield, Fixing Hidden
Problems with Thermal Budget, Solid State
Technol. 40 (1997) 111-120. (Review, exptl
data, mapping concepts) - R. Ditchfield and E. G. Seebauer, Rapid Thermal
Processing Fixing Problems with the Concept of
Thermal Budget, J. Electrochem. Soc., 144 (1997)
1842-1849. (Detailed exptl data) - R. Ditchfield and E. G. Seebauer, Beyond Thermal
Budget Using D?t in Kinetic Optimization of
RTP, Rapid Thermal and Integrated Processing VII
(MRS Vol. 525, 1998), 57-62. (More mapping
concepts) - E. G. Seebauer, Spike Anneals in RTP Kinetic
Analysis, Advances in Rapid Thermal Processing
(ECS Vol. 99-10, 1999) 67-71. (Extension of
concepts to spikes)