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International Technology Roadmap for Semiconductors

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ORTC Table 1a,b - MPU/ASIC M1 Half-Pitch Trend. Stagger-contacted, same as DRAM ... 2005 Definition of the Half Pitch ... ORTC Table DRAM Intro 1e,f (Near, Long Term) ... – PowerPoint PPT presentation

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Title: International Technology Roadmap for Semiconductors


1
International Technology Roadmap for
Semiconductors 2006 ITRS Update/ORTC
Product Models Status Including 1Q06 SIA/SICAS
Industry Technology Capacity Demand Analysis For
Public 07/12/06 Conference SEMICON / San
Francisco, CA (Draft Rev 0, 06/30/06)
Semiconductor Industry Association /
Semiconductor Industry Capacity Statistics
2
2005 ITRS Executive Summary Fig 5
Source 2005 ITRS Document online at
http//www.itrs.net/Links/2005ITRS/Home2005.htm
3
ORTC Overview 2006 Update ITRS - Unchanged
  • One standard TWG table technology trend header
  • Presently continue to use DRAM stagger-contacted
    M1 as typical industry lithography driver
  • Transitioned to product-oriented technology trend
    drivers and cycles
  • ORTC Table 1a,b - MPU/ASIC M1 Half-Pitch Trend
  • Stagger-contacted, same as DRAM
  • 2.5-year Technology Cycle (.5x/5yrs)
  • 180nm/2000 90nm/2005 45nm/2010(equal DRAM)
  • Then continue on a 3-year Technology Cycle,
    equal to DRAM 2010-2020
  • ORTC Table 1a,b - STRJ Flash Poly (Un-contacted
    dense lines)
  • 2-year Technology Cycle (0.5x/4yrs)
  • 180nm/2000 130nm/2002 90nm/2004 65nm/2006
  • Then 3-year Technology Cycle 1 year ahead of
    DRAM 06-20
  • ORTC Table 1a,b MPU/ASIC Printed Gate Length
    per FEP and Litho TWG ratio relationship to Final
    Physical Gate Length - UNCHANGED from the 2005
    ITRS targets (3-year cycle after 2005)
  • TWG table Product-specific technology trend
    driver header items are added to individual TWG
    tables from ORTC Table 1ab
  • Chip Size Models are connected to proposals and
    historical trends, incl. new Flash Model
  • Function Size Logic Gate SRAM Cell Dram Cell
    Flash Cell (SLC, MLC)
  • Functions/Chip Flash DRAM High Performance
    (hp) MPU Cost Perf. (cp) MPU
  • Chip Size hp MPU cp MPU DRAM Flash

Note Cycle time to 0.5x linear scaling
every two cycle periods 0.71x/ cycle
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Summary
  • DRAM Model stagger-contacted M1 is unchanged from
    2005 ITRS (3-year cycle after 2004)
  • MPU M1 stagger-contact half-pitch is on a
    2.5-year cycle through 2010/45nm, then 3-year
    cycle
  • Flash Model un-contacted poly half-pitch
    continues on 2-year cycle to 1 year ahead of
    DRAM (contacted) in 2006, then 3-year cycle
  • Printed MPU/ASIC Gate Length set by FEP and Litho
    TWGs ratio agreement, but Physical GL targets
    remain unchanged and on 3-year cycle beginning
    2005
  • Industry Technology Capacity Demand (SICAS) still
    on 2-year cycle
  • Total MOS Capacity is growing 11 CAGR (SICAS),
    and 300mm Capacity Demand has ramped to 22 of
    Total MOS
  • Historical chip size models connected to
    Product scaling rate models, and include design
    factors, function size, and array efficiency
    targets
  • Average industry product Moores Law met or
    exceeded throughout 2005-2020 ITRS timeframe
  • ITRS Cycle definition time to .5x linear
    scaling every two cycle periods

18
Backup
Source 2005 ITRS Document online at
http//www.itrs.net/Links/2005ITRS/Home2005.htm
19
ORTC Table 1a,b (Near, Long Term)
20
ORTC DRAM Flash Prod Table 1c (Near Term)
21
ORTC DRAM Flash Prod Table 1d (Long Term)
22
ORTC Table DRAM Intro 1e,f (Near, Long Term)
23
ORTC MPU cp Table 1g (Near Term)
24
ORTC MPU cp Table 1h (Long Term)
25
ORTC MPU/ASIC hp Table 1i (Near Term)
26
ORTC MPU/ASIC hp Table 1j (Long Term)
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