Testing Card specifications

1
Testing Card specifications
C. Gerber (UIC) Silicon Electrical Meeting,
1/14/02 A. Nomerotski 1/15/02

• Will be used in the Run2b SASEQ-based test stands
• 401615 needed. Build 75, two channels each.
• Will replace the IB and the adapter card
• Connects to SASEQ (50 conductor cable)
• Takes two jumper cables (2 AVX connectors)
• Will also have twisted pair cable connectors.
• Should fit in the cooldry box with the detectors
• 6U size or smaller
• Functionally of the purple card is similar to the
  active adapter card, but with additional
  functions indicated in purple.

2
New Test Card
3
Testing Card specifications

• two channels per printed circuit board
• size 20 sq. in. or best effort
• voltage regulation of SVX4 power (and possibly
  board power if needed)
• SVX4 voltage (8-pin header) controlled by HDI
  enable/disable from SASEQ
• Output for temperature monitoring (and voltage
  monitoring?), options for monitors
• VMIC Scanning ADC (requires VME)
• NWU microprocessor connected to PC via serial
  link ?
• voltmeter

4
Specifications (cont.)

• HV (silicon bias) supplied via a LEMO connector,
  and controlled by HDI enable/disable from the
  SASEQ
• CAL-SR LEMO connector (two connectors)
• fuses (resettable if feasible) on SVX4 power, and
  board power
• Dvalid delay provision SIP
• clock conversion from TTL to low-voltage
  differential
• one input 50-conductor connector from SASEQ

5
Specifications (cont.)

• Target date July '02 for working prototype.
• set on specs by 1/31/01
• First iteration (2 stuffed boards) by May 02
• 10-15 working boards at Fermilab on 7/1/02
• Probable cost
• 25K, includes production of prototypes and ONE
  turnaround
• 5-7K if second turnaround is needed.
• two channel interface card cost was 40-45K (for
  reference)