Nanonics Imaging Ltd.

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Nanonics produces AFM/SPM systems with unique
design for overcoming limitations of standard SPM
system. Nanonics offers unique capabilities for
integrated microscope of combining SPM with
optical microscopy, analytical devices (e.g.
Raman) and multiprobe operation. Nanonics
opened the door and pioneered many new fields in
SPM that became a standard in this market. The
following are examples

• MultiProbe SPM systems
• AFM/Raman and TERS
• Near-field Scanning Optical Microscopy (NSOM and
  sSNOM)
• Ultimate BioAFM Hydra with Tuning Fork feedback
• Fountain Pen Nanolithography
• SPM/FIB/SEM Integra ration

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• Nanonics covers a wide range of the Nanoscience
  and Nanotechnology spectrum
• SPM various modes
• Online AFM/Raman
• TERS
• Near-field and Far-field microscopy combined
  with SPM (NSOM and Apertureless)
• Photonics
• Plasmonics
• BioSPM
• Nanolithography
• Multiprobe imaging and nanomanipulation,
• Nano-Electrical/Thermal,
• Low temperature SPM and integration with
  FIB/SEM.
• Visit our website for more information or to get
  a quote www.nanonics.co.il

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Nanonics SPM Products
MultiView 4000TM (One Probe)
MultiView 4000 HydraTM (Two Probe)
MultiView 1000TM
MultiView 2000TM
Optometronics MultiView 4000TM (Two Probe-Two
Nanoaligners)
MultiView 4000TM (One Probe-Two Nanoaligners)
MultiView 4000TM (Four Probe)
CryoView 2000TM
Raman Integration Packages
AFM/SEM/FIB Integrations
NanoToolKitTM
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Unique SPM Design for Free Optical Axis
3D FlatScanTM Scanner Stage
Transparent Glass Probe

• Nanonics NanoToolKitTM
• Optically Friendly AFM Probes
• Normal Force NSOM Probes
• Coaxial Electrical Probes
• Two Wire Thermal Probes
• Chemical Writing Probes
• TERS Probes

• gt20 mm clear optical axis
• 7 mm thin scanner
• mms of rough scanning and up to 100 micron of
  fine scanning in X, Y and Z directions
• Allows for Tip and Sample scanning modes

All MultiView Systems Are Compatible With All
Conventional Probes Available
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NSOM/SNOM Near Field Scanning Optical Microscopy

• A line of instruments that provides the highest
  resolution optical information simultaneously
  with high resolution SPM topography.
• Tapered optical fiber probe functions as the main
  probe in the SPM
• light can be either transmitted or collected so
  that a variety of NSOM modes can be operated
  including collection, reflection, and
  transmission modes.
• Nanonics provides systems with different feedback
  mechanisms
• Probe shape and geometry are customizable
  depending on the customer needs.
• More info can be found at http//www.nanonics.co.i
  l/products/nsom-spm-systems/multiview-1000-system.
  html or http//www.nanonics.co.il/products/nsom-sp
  m-systems/multiview-2000-system.html

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Raman characterization AFM-Raman and TERS (tip
enhanced Raman characterization)

• Technology that provides high resolution chemical
  information through Raman spectra on your
  material simultaneously with high resolution
  topographic information.
• AFM/confocal Raman microscopy system
• Tip enhanced Raman spectroscopy (TERS) system for
  higher resolution
• In TERS, the SPM tip functions as an antenna to
  focus the light right beneath the tip and collect
  highly localized Raman spectra.
• More info can be found at http//www.nanonics.co.i
  l/products/nsom-spm-systems/multiview-1000-system.
  html or http//www.nanonics.co.il/products/nsom-sp
  m-systems/multiview-2000-system.html

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Multiple probe SPM

• A revolutionary technology that refers to the
  ability to simultaneously and independently
  operate two or even four probes 
• provides maximum flexibility and sophistication
  in your characterization needs.  
• Probes can be any combination of scanning probe,
  near field optical, thermal, electrical and
  nanolithography probes.  
• Unique experiments
• one probe manipulating or pumping a sample
  optically, electrically or thermally , while the
  other probe(s) interrogate the sample in various
  modes simultaneously
• Nanomanipulation
• Electrical and thermal transport
• More info can be found at http//www.nanonics.co.i
  l/products/nsom-spm-systems/multiprobe-imaging-mul
  tiview-4000.html

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Low Temperature/CryogenicMultiple Probe SPM

• A system that performs all of the standard
  SPM/optical measurements but now at temperatures
  down to 10K
• Very fast cooling that does not require an
  immersion cryostat.
• Applications include
• Photoconductivity
• Electrical transport
• Thermal transport
• Electrical probe station
• For dynamics and transport of 2D materials such
  as graphene and MoS2
• More info can be found at http//www.nanonics.co.
  il/products/nsom-spm-systems/low-temperature-multi
  probe.html

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Combined AFM/SEM/FIB

• The first triple beam AFM, SEM FIB with the
  ability to integrate AFM/NSOM with SEM and FIB
  technology
• the ultimate 3D nanoscale characterization
  capability
• Incorporates revolutionary innovation in this
  instrument and AFM probe design
• open architecture that provides open access to
  the SEM/FIB beams without any obstruction or
  interference to the injectors, detectors, or beam
  lines.
• More info can be found at http//www.nanonics.co.i
  l/products/nsom-spm-systems/combined-afm-fib-and-a
  fm-sem.html