IEEE 2015 VLSI AGING-AWARE RELIABLE MULTIPLIER DESIGN WITH ADAPTIVE HOLD LOGIC.pptx - PowerPoint PPT Presentation

About This Presentation
Title:

IEEE 2015 VLSI AGING-AWARE RELIABLE MULTIPLIER DESIGN WITH ADAPTIVE HOLD LOGIC.pptx

Description:

PG Embedded Systems www.pgembeddedsystems.com #197 B, Surandai Road Pavoorchatram,Tenkasi Tirunelveli Tamil Nadu India 627 808 Tel:04633-251200 Mob:+91-98658-62045 General Information and Enquiries: g12ganesh@gmail.com – PowerPoint PPT presentation

Number of Views:208
Slides: 9
Provided by: pgembedded
Tags:

less

Transcript and Presenter's Notes

Title: IEEE 2015 VLSI AGING-AWARE RELIABLE MULTIPLIER DESIGN WITH ADAPTIVE HOLD LOGIC.pptx


1
AGING-AWARE RELIABLE MULTIPLIER DESIGN WITH
ADAPTIVE HOLD LOGIC
2
ABSTRACT
  • Digital multipliers are among the most
    criticalarithmetic functional units. The overall
    performance of thesesystems depends on the
    throughput of the multiplier. Meanwhile,the
    negative bias temperature instability effect
    occurs whena pMOS transistor is under negative
    bias,increasing the threshold voltage of the pMOS
    transistor, andreducing multiplier speed. A
    similar phenomenon, positive biastemperature
    instability, occurs when an nMOS transistor is
    underpositive bias.

3
  • Both effects degrade transistor speed, and in
    thelong term, the system may fail due to timing
    violations. Therefore,it is important to design
    reliable high-performance multipliers. In this
    paper, an aging-aware multiplier is designed with
    anovel adaptive hold logic (AHL) circuit. The
    multiplier is able toprovide higher throughput
    through the variable latency and canadjust the
    AHL circuit to mitigate performance degradation
    thatis due to the aging effect. Moreover, the
    proposed architecturecan be applied to a column-
    or row-bypassing multiplier.

4
  • Theexperimental results show that our proposed
    architecture with16 16 and 32 32
    column-bypassing multipliers can attain upto
    62.88 and 76.28 performance improvement,
    respectively, compared with 1616 and 3232
    ?xed-latency column-bypassingmultipliers.
    Furthermore, our proposed architecture with 16
    16and 32 32 row-bypassing multipliers can
    achieve up to 80.17and 69.40 performance
    improvement as compared with 1616and 32 32
    ?xed-latency row-bypassing multipliers.

5
EXISTING METHODS
  • 1. Guard banding and gate oversizing technique to
    mitigate the aging effect 2. NBTI optimization
    which considered the path sensitization, dynamic
    voltage scaling and body biasing technique to
    reduce the power or extend circuit life. But this
    method increases the delay.3. Variable latency
    adder with speculation technique for error
    detection and correction which increases the
    area. 4. Design of variable latency multiplier
    with the help of booth technique, which increases
    the area because of recoding circuitry.

6
PROPOSED METHOD AGING AWARE RELIABLE MULTIPLIER
  • An aging-aware reliable multiplier is designed
    with a novel adaptive hold logic (AHL) circuit.
    The multiplier is based on the variable-latency
    technique and can adjust the AHL circuit to
    achieve reliable operation under the in?uence of
    NBTI and PBTI effects. The AHL circuit can decide
    whether theinput patterns require one or two
    cycles and can adjustthe judging criteria to
    ensure that there is minimum performancedegradatio
    n after considerable aging occurs. The aging
    aware reliable multiplier is designed based on
    Row/Column bypass multiplier which reduces the
    activity power. Razor flipflops are used to
    detect the timing violation.

7
(No Transcript)
8
ADVANTAGES
  • 1. Increases the speed
  • 2. Reduces the area
Write a Comment
User Comments (0)
About PowerShow.com