Zero Defect Tools in the Semiconductor Industry

1
Zero Defect Tools in the Semiconductor Industry

• There are several tools and techniques that are
  commonly used in the industry to achieve, zero
  defects or near-zero defect rates.

2
Statistical Process Control (SPC)

• This is a data-driven method that monitors and
  controls the production process by collecting and
  analyzing data in real-time. SPC semiconductor
  can identify when a process is deviating from its
  normal behavior, allowing engineers to take
  corrective action before a defect occurs.

3
Failure Mode and Effects Analysis (FMEA)

• This is a method used to identify potential
  failure modes and their impact on the product,
  process, or system. FMEA is often used in the
  early stages of product design to identify
  potential issues and take corrective action
  before the product goes into production.

4
Design of Experiments (DOE)

• This is a method used to systematically test and
  analyze the effects of various factors on a
  process or product. DOE can identify the optimal
  settings for process parameters and help to
  minimize variation in the production process.

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Add Ons

• Automated Assemble Map Generation
• Cross Work Center Correlation