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Beam Diagnostics through

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Substantial Fraction of the pairs are scattered into the BeamCal. Use them to measure beam parameters. 5 Potential Technologies. Sandwich: Silicon/Tungsten ... – PowerPoint PPT presentation

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Title: Beam Diagnostics through


1
Beam Diagnostics through Beamstrahlung
Status report
Marko Ternick Achim Stahl DESY Zeuthen
ECFA DESY Workshop Prague Nov 2002
2
Pairs in the BeamCal
LumiCal
Substantial Fraction of the pairs are scattered
into the BeamCal Use them to measure beam
parameters
BeamCal
3
5 Potential Technologies
  • Sandwich Silicon/Tungsten
  • Sandwich Diamond/Tungsten
  • Sandwich Passive Gas Gaps/Tungsten
  • Crystals Thin Photo Diodes
  • Crystals Fiber Read Out

RD Project to investigate technologies
4
BeamCal Two Tasks
Tagged Electrons
Measure Beamstrahlung
serious background VETO EVENTS
beam diagnostics
5
Beamstrahlung
expected energy distribution nominal beam
parameters
6
Beamstrahlung
nominal
sx 553 nm ? 830 nm
7
Beam Strahlung
nominal
bunch tilted by 0.2 deg
8
Math. Formalism
Observables Oj
Beam Parameters xi
guinea pig
O1 a11 a12 . a1i x1 O2
a21 a22 . a2i x2
. .
Oj aj1 aj2 . aji xi
Moore Penrose Inverse dx (AT A)-1 AT O or dx
AT (A AT)-1 O

9
Example
  • 3 Observables
  • mean particle energy
  • mean radius on BeamCal
  • mean time of arrival
  • 2 Parameters
  • bunch length sz
  • bunch width sx

Input sz 250 µm sx 600 nm
Measured sz 242 /- 8 µm sx 597 /- 16 nm
Nominal sz 300 µm sx 553 nm
10
More Realistic Finite Granularity
GeV
Finite Granularity Ideal Resolution 16 Observables
11
Observables Example
Angular Distribution
nominal
beam tilted by 0.2 deg
U
U
R
R
L
L
D
D
O7 (L R) / (U D) O8 U /D
12
Transfer Matrix A
arsz
13
Transfer Matrix A
aEsz
14
Results 1
6 parameter test
nominal input measured
sx left 553 nm 600 nm 614 nm
sx right 553 nm 600 nm 574 nm
sy left 5 nm 12 nm 15 nm
sy right 5 nm 8 nm -3.4 nm
sz left 300 µm 280 µm 303 µm
sz right 300 µm 250 µm 221 µm
15
Results 2
6 parameter test
nominal input measured
sx both 553 nm 600 nm 614 nm
sy both 5 nm 8 nm 5.2 nm
sz both 300 µm 250 µm 227 µm
tilt x 0 µrad -700 µrad 1088µrad
tilt y 0 µrad 10 µrad 24 µrad
F 0 µrad -5.0 µrad -2.9 µrad
16
Conclusions
  • Possible to measure most beam parameters
  • Accuracy limited by bunch to bunch fluctuations
    still to be determined more
    precisely Integrate over
    several (10?) BX
  • Possible to distinguish left from right beam
  • Observables still have to be optimized
  • Detector resolution not included
  • Real Time Analysis possible?
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