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An Eternal Triangle

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10/18/09. ISSTA 2000, Portland. 1. An Eternal Triangle. Testability. Fault Size. D-to-R Ratio ... Observability: 'distinct outputs are generated from distinct ... – PowerPoint PPT presentation

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Title: An Eternal Triangle


1
An Eternal Triangle
  • Fault Size
  • Testability
  • D-to-R Ratio

Martin Woodward, U. Liverpool, UK Zuhoor
Al-Khanjari, SQU, Oman
2
Outline of Talk
  • Functional view of software
  • Domain-to-range ratio (DRR)
  • Domain testability and DRR
  • PIE testability and fault size
  • PIE testability via mutation
  • Fault size and DRR
  • Related work
  • Conclusions

3
A Functional View of Software
  • Correct program P D R
  • Suppose single fault f exists.

4
Domain-to-Range Ratio (DRR)
  • DRR D / R, where
  • D cardinality of inputs
  • R cardinality of outputs
  • High DRR, i.e. DgtR Þ
  • greater potential to hide faults
  • internal state collapse
  • DRR is a rough approximation of the softwares
    testability

DgtR
DR
5
Domain Testability(Freedman, 1991)
  • Observability distinct outputs are generated
    from distinct inputs
  • " a, b ÎD P(a)¹P(b) Þ a¹b
  • Controllability given any desired output value,
    an extra input exists which forces the
    component to that value
  • " r Î R d Î D P(d) r

6
Domain Testability Extensions
  • Observable extensions
  • introduce n new input variables with types Ti
  • Ob log2( T1 . . . Tn )
  • Controllable extensions
  • reduce the range by modifying m output variable
    types to Tk
  • Ct log2( T1 . . . Tm )

7
Domain Testability and DRR
  • Extend D by ?D giving D
  • Reduce R by ?R giving R
  • For testable component

8
PIE Testability and Fault Size
  • PrFailurePrE?PrI E?PrP I
  • EExecute, IInfect, PPropagate

9
PIE Testability via Mutation
  • Let ML be representative non-equivalent mutant of
    location L
  • TestabilityL min (semantic size of ML)
  • Find proportion of large number of random test
    cases that kills ML
  • Traditional mutation stops testing a mutant once
    dead
  • c.f. size estimates for mutation operators
    (Offutt Hayes, 96)

10
Fault Size and DRR
  • Define
  • input fault size Df / D
  • output fault size Rf / R
  • DRR for correct program P under full input domain
    D
  • Can be related to DRR for faulty version under Df

11
Related Work
  • PIE (Voas,92), DRR(Voas,95)
  • Fault size (Offutt Hayes, 96)
  • Fault-based testing theory (Morell, 90)
  • RELAY model (Richardson et al., 93).
  • Dynamic impact analysis (Goradia, 93)
  • Prioritizing fault-exposing tests (Rothermel et
    al., 99)

12
Conclusions
  • Testability
  • is an important attribute
  • has various guises
  • and links with other concepts
  • Domain testability and DRR
  • PIE testability and fault size
  • Validation possible by
  • empirical studies
  • analytic approach (How Tai Wah,
    2000)
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