An OffAxis Hartmann Sensor for Measurement of Wavefront Distortion in Interferometric Detectors - PowerPoint PPT Presentation

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An OffAxis Hartmann Sensor for Measurement of Wavefront Distortion in Interferometric Detectors

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Tomographic analysis is accurate. input, reconstructed. Implementation of tomography ... Radius (mm) Optical Path Difference ( l/1000 ) Radius of curvature = 1570m ... – PowerPoint PPT presentation

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Title: An OffAxis Hartmann Sensor for Measurement of Wavefront Distortion in Interferometric Detectors


1
An Off-Axis Hartmann Sensor for Measurement of
Wavefront Distortion in Interferometric Detectors
  • Aidan Brooks, Peter Veitch, Jesper Munch
  • Department of Physics, University of Adelaide

2
Objectives
  • Improve operation of advanced interferometers by
    reducing thermally induced wavefront distortion.
  • Develop a sensor to measure the distortion and
    correction in the ACIGA High Optical Power Test
    Facility.

3
Crux of thermal problem
Courtesy of Ryan Lawrence and David Ottaway, MIT
  • Absorbed power causes thermal lensing
  • Prediction of MELODY model of Advanced LIGO
  • Sideband power is scattered out of TEM00
  • Instrument failure at approximately 2 kW
  • Adv. LIGO cannot achieve desired sensitivity
    unaided

4
How to maintain cavity finesse?
  • Measure distortion with wavefront sensor
  • Employ active compensation system
  • Sensor cannot interfere with core optics or GWI
    laser beam.

OFF-AXIS WAVEFRONT SENSOR
5
Why use a Hartmann wavefront sensor?
  • Interferometry
  • Shack-Hartmann
  • Hartmann
  • Easiest to align
  • Cheap
  • In principle, can measure a wavefront change of
    less than l/1000

6
Hartmann wavefront sensor
CCD
  • Record spot positions on CCD
  • Wavefront changes ? spot positions change
  • Gradient of wavefront change proportional to
    displacement of spot.

7
Off-Axis Bench Top Test
Hartmann plate
8
Comparison of Hartmann sensor with interferometry
demonstrated accuracy
  • Line - Off axis fit
  • Data Interferometric fringe distortion

OPD (waves/100 at 633nm)
  • Hartmann data analyzed using quasi-orthogonal
    functions.
  • Lack of orthogonality results in systematic
    errors

9
Determine wavefront distortion using optical
tomography
Cylinder of transparent material with internal
temperature/refractive index distribution
10
Determine wavefront distortion using optical
tomography
Divide into annular volume elements (voxels)
11
Determine wavefront distortion using optical
tomography
Fitting functions are off-axis projections of
voxels
12
Simulation of tomography
  • Temperature distribution in ITM of AdLIGO-like
    system modelled using Hello-Vinet equation
  • Off-axis optical path distortion (OPD) through
    this distribution determined
  • OPD used as input data for a least-squares-fit to
    voxel projections
  • Internal temperature distribution reconstructed
  • On-axis OPD determined from reconstruction and
    compared to OPD predicted by theory

13
Simulation results
Original off-axis OPD
Best fit with voxel projections
14
Tomographic analysis is accurate
input, reconstructed
15
Implementation of tomography
  • Hartmann sensor used to measure OPD gradient
    field
  • Gradient field used to reconstruct phase
    distortion (OPD) using iterative process
  • Tomographic analysis determines temperature
    distribution from reconstructed OPD
  • On-axis OPD determined from reconstructed
    temperature distribution

16
Initial measured precision l/120
  • Measured using double snap no heating

17
Conclusion
Conclusion
  • Single view, off-axis Hartmann, tomographic
    wavefront sensor has sufficient accuracy to
    measure cylindrically symmetric refractive index
    distributions in advanced interferometers
  • Accuracy of l/1000 (simulation).
  • Current precision l/120 (measured)
  • CCD noise precision limit l/500
  • Can extend to non-cylindrically symmetric
    distributions use multiple views and azimuthal
    voxelation

18
Interpreting Off-Axis View
Distortion interferometer sees
Distortion we see
19
Analyzing distortion using functional
decomposition
r
z
n(r) ? ai fi(r)
F (x, y) ? ai gi(x, y)
F(r) C ? ai fi(r)
  • gi(x, y) are path integrated fi(r)
  • LSQ fit to appropriate fns gi(x, y)
  • Coefficients reveal on-axis distortion
  • Most appropriate functions fi(r) are elusive

20
Simulated Sensitivity Test
Optical Path Difference ( l/1000 )
Radius (mm)
Radius of curvature 1570m
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