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Lecture 17 Diode and Transistor Theory

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Title: Lecture 17 Diode and Transistor Theory


1
Lecture 17Diode and Transistor Theory
  • Diode theory
  • MOSFET transistor theory
  • Summary
  • Michael L. Bushnell
  • CAIP Center and WINLAB
  • ECE Dept., Rutgers U., Piscataway, NJ

2
Diode Modeling
  • Model necessary semiconductor junction aspects in
    analog circuit models
  • Breakdown voltage and output resistance depend on
    reverse-biased pn-junction depletion region
    properties
  • Space charge region
  • ND cm-3 n region doping (constant)
  • NA cm-3 p region doping (constant)
  • Built-in potential Y0 VT ln
  • VT k T / q 0.026 V at 300o K

NA ND ni2
3
Diode Model
4
Depletion Region Widths
  • Conservation of charge W1 NA W2 ND
  • Poissons equation (in 1 dimension)

5
Depletion Region Widths (contd)
  • Linear e Integrate to get
  • Let V 0 for x - W1
  • At x 0, define V as V1
  • Potential difference from x 0 to x W2 is V2
  • Total junction voltage

6
Depletion Region Properties
  • p side penetration
  • n side penetration
  • Depletion Region Capacitance
  • A junction cross-sectional area

7
Depletion Region Properties
  • Leading to
  • Valid for reverse bias VR, and for forward bias,
    provided a small current flows.
  • If VD is junction bias then

8
pn Junction Depletion-layer Capacitance as f
(Bias Voltage VD)
9
Avalanche Breakdown
  • When reverse saturation current carriers get
    sufficient energy at ecrit they collide with
    silicon lattice atoms and create new
    electron-hole pairs -- Avalanche breakdown

10
Avalanche Breakdown
  • Reverse avalanche current near breakdown
  • IRA M IR
  • M (multiplication factor)
    , 3 n 6
  • BV breakdown voltage
  • Relevance Diodes operating at avalanche
    breakdown (Zener diodes) are commonly used as
    voltage references
  • Zener breakdown different in heavily-doped
    junction, e becomes large enough to strip e--
    from valence bands tunneling
  • Works only for BV lt 6 V

1

11
Cross Section and Top View of n- Channel
MOS Transistor
  • Depletion width under oxide
  • f potential in depletion layer at Si SiO2
    interface
  • Depletion region charge

12
nMOS Cross Section With Positive VGS Applied
  • Channel inverts when potential in Si reaches 2
    ff, ff 0.3 V

13
MOSFET Transistor
  • When inverted, with no substrate bias, depletion
    region contains fixed charge
  • With substrate bias VSB
  • Threshold voltage

1
14
Large-Signal Behavior
  • Induced channel charge
  • nd saturation drift velocity
  • W device width
  • L channel length
  • Voltage drop in channel along dy

15
Large-Signal Behavior (continued)
  • Substitute integrate
  • Or
  • When we enter saturation, drain end pinches off
    (like JFET)
  • Finding ID by replacing VDS VGS Vt

16
Summary
  • Diode theory
  • MOSFET transistor theory
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