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JRA1: Lithography limits for Nanophotonic Devices

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Effects of stitching very critical. Glasgow 6db/cm (600um Writefield) ... Project- minimise stitch errors by exposing each point from multiple stage positions ... – PowerPoint PPT presentation

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Title: JRA1: Lithography limits for Nanophotonic Devices


1
JRA1 Lithography limits for Nanophotonic Devices
  • Coordinator Thomas F Krauss tfk_at_st-and.ac.uk
  • Deputy Coordinator William Whelan-Curtin (Liam
    OFaolain) jww1_at_st-and.ac.uk

2
Research Integration Targets
  • Machine comparison
  • Agreement on Interaction
  • Comparison of Proximity correction
  • Examination of effects of processing (e.g
    sidewall roughness and long vs short range
    disorder
  • Submission of at least 2 papers

3
Agreement/Papers
  • Agreement on data dissemination that satisfied
    the concerned partners
  • 1 paper submitted
  • 1 about to be submitted
  • 2 in preparation

4
Proximity Correction
  • dR/R measured off SEM images
  • Proxecco (Glasgow) 2.2
  • Nanopecs (ETHZ) 1.7
  • Termination affects coupling into slow light
    regime (adjacent to mode edge)

Good
Poor
5
Processing/Disorder
  • Etching quality is the primary factor influencing
    loss
  • Small errors dramatically increase the loss
  • High freq. disorder important
  • Low frequency (over 100s periods) disorder
    (writefield distortion, beam drift) has little
    effect on loss
  • Causes chirping rather than scattering

6
Photonic Wires
  • Delay due to long original process development
  • Repeatability problems due to post
    lithography/etch processing
  • Effects of stitching very critical
  • Glasgow 6db/cm (600um Writefield)
  • St Andrews 15.5db/cm (100um Writefield)- Light
    often seen to scatter at WF boundaries

7
Machine Comparison
8
JRE- Shot shifting
  • Politecnico di Torino to St Andrews
  • Giuseppe Pagnotta- 6 months
  • Project- minimise stitch errors by exposing each
    point from multiple stage positions
  • Loss- from 15.5db/cm down to 8.5db/cm (700nm
    wires)

2 exposures
4 exposures
Normal
9
Research Highlights Low Loss Photonic Crystals
Blue Loss Red- 0.1 mm W1 Green 1.89mm W1
  • 4.1 db/cm W1 waveguide patterned on the LEICA
    EBPG 5 at Glasgow
  • Worlds 2nd best Silicon photonic crystal (to our
    knowledge)
  • At the sub 10db/cm level, the bigger writefield
    becomes important

10
Research Highlights Disorder Induced Loss in
Photonic Crystals
  • Deliberately positionally disordered W1s
  • Initial Quadratic dependence than sharp drop
    (mode edge shifts causing reflection)
  • In absence of reflection
  • TA-B(xC)2
  • T- transmission, x- deliberate disorder A-
    Coupling, B- loss dependence on disorder, C-
    intrinsic positional disorder

Scattering loss
Reflection loss
  • Plot B against vg
  • 1/vg1/2 best fit
  • Previous reports (Hughes et al.)- 1/vg2
  • Zero intrinsic positional disorder within error
    (0.5nm)

11
Most valuable outcome of this activity
  • Photonic crystals of the highest standard
  • High performance photonic crystals can be
    patterned using relatively low specification beam
    writers
  • Understanding of Disorder Induced loss in
    photonic crystals

12
Continuation / New activity
  • Nanostructuring Platform
  • See earlier talk
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