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Process Analytical Technology: An Industry Perspective

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Dielectric Constant. Specific Ion (pH, etc.) Temperature. Pressure. Common Attributes ... Duplicate method development cost if implemented after approval ... – PowerPoint PPT presentation

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Title: Process Analytical Technology: An Industry Perspective


1
Process Analytical Technology An Industry
Perspective
  • John G. Shabushnig, Ph.D.Pharmacia Corporation
  • February 25, 2002

2
Vision
  • From
  • Laboratory based, finished product testing
  • To
  • On-Line, in-process testing

3
Why use it?
  • Improved process control
  • Reduced testing cost
  • Reduced cycle time
  • Reduced in-process inventory

4
What is it?
  • Spectroscopic
  • Near IR
  • LIF
  • Physical
  • Viscosity
  • Specific Gravity
  • Optical
  • Refractive Index
  • Electrical
  • Impedance, Resistance
  • Dielectric Constant
  • Specific Ion (pH, etc.)
  • Temperature
  • Pressure

5
Common Attributes
  • Non-destructive
  • Limited/No sample prep
  • Convenient process interface
  • Fiber optics
  • Multipoint measurement
  • Rapid response time
  • Adequate dynamic range

6
Familiar Applications
  • Moisture
  • Lyophilized Powders
  • Granulations
  • Compressed Tablets
  • Potency
  • Sterile Aqueous Suspensions
  • Blend uniformity
  • Identification
  • Raw Materials
  • Packaging Materials
  • Finished Product
  • Sterilization Process
  • Steam
  • VHP

7
How used?
  • Support process development
  • Reduced laboratory testing
  • Parallel testing
  • Rapid confirmation of process performance
  • Laboratory assay used for lot release
  • Dont ask, dont tell
  • Lot release
  • Limited implementation

8
Where are we now?
  • Phase II?
  • Demonstrated efficacy
  • Good science
  • Incomplete engineering/development

9
Obstacles to broader use
  • Catch 22
  • Ideally, methods developed during product
    development
  • Risk delay of product approval
  • Duplicate method development cost if implemented
    after approval
  • Supplement required to implement
  • Regulatory acceptance
  • Complexity, Reliability
  • Limited option for retest

10
Where do we go from here?
  • Improve measurement equipment
  • More rugged and reliable
  • Smaller, faster, cheaper
  • Improve regulatory climate
  • Reduce uncertainty
  • Support PAT option
  • Identify high-value, high-success applications
    to model
  • Develop guidelines for development and
    validation

11
Acknowledgements
  • LE Fox
  • RM Leasure
  • JG White
  • RG Whitfield
  • SJ Doherty
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