Scanning Probe Microscopy

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Scanning Probe Microscopy

• What is it?

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Scanning Probe Microscopy

• Scanning probe microscopy (SPM) is a method for
  mapping surface forces of materials on the atomic
  scale. By mapping these forces, much can be
  learned about the surfaces of materials, where
  many interesting and complex phenomena occur.
• Scanning probe microscopy includes the methods of
  atomic force microscopy (AFM), magnetic force
  microscopy (MFM), and lateral force microscopy
  (LFM).

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Scanning Probe Microscopy

• How does it work?

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Scanning Probe Microscope

• This is how it works

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Why do you need to demonstrate?

• Cantilever tips can have radii of curvature as
  small as 5 nm but are often larger
• Super sharp silicon tips with radii of curvature
  as small as 25 nm
• An Atomic Force Microscope costs approximately
  500,000.00
• Considerations concerning shock absorption in the
  room in which it is being demonstrated

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So how big is a nanometer?
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Size Comparison
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Atomic Force Microscope
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Model of Atomic Force Microscope
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Magnetic Force Microscope