Analog Single Event Transients

1
Analog Single Event Transients ASETTask 04-044
Description
Benefits

• Commercially available linear bipolar and CMOS
  devices
• are often susceptible to single energetic
  particle induced
• transients. FY03 NEPP efforts are focused on
  developing
• appropriate ground-based radiation test methods
  and to
• support DoD-funded modeling efforts to determine
• improved device ASET tolerance.
• In FY04, we propose to
• Survey existing datasets to classify COTS device
  tolerance and develop a guideline for what
  designers can expect from devices (comparator
  used for 100 mV difference can see)
• Provide radiation effects testing for inputs to
  DoD-funded
• models as appropriate

The key benefit is providing NASA designers
critical information to build more reliable
systems, I.e., proper choice of linear
devices/technologies and/or inputs for mitigation
methods. Flight anomalies such as those seen on
MAP and Cassini are what we are trying to
avoid. NASA provides key research to the
DoD-research efforts by its unique use of laser
and heavy ion tests.
Deliverables

• Guideline/database of devices/technologies with
  ASET classification
• I.e., associate potential types of transients
  with each device type (ex., op amps these types
  of transients positive, negative, amplitude
  ranges are some devices better choices than
  others?, CMOS vs. Bipolar?, etc) (GSFC- standard
  devices/document lead, JPL higher speed analog)
• Test reports in support of DoD (laser)

Schedule/Costs
Total ROM Cost (non-CS) 80K
Risks
Cost
Schedule
Technical
Programmatic Survey risk is extremely low and of great value
Red, Yellow, or Green
CS FTEs 0.3
Non-NASA Organizations/Procurements Defense
Threat Reduction Agency (DoD fund source) NSWC
Crane, Vanderbilt University, RLP Research, NRL,
Aerospace Corp, National Semiconductor

Lead Center/PI GSFC/ Christian Poivey (SGT)
Co-Is Allan Johnston/JPL Center Funding Split
GSFC - 40K/0.3, JPL - 40K
Strategic 12, Slide 17