CLSI Beamline 06ID1, Hard Xray MicroAnalysis HXMA

1
CLSI Beamline 06ID-1, Hard X-ray MicroAnalysis
(HXMA)
N. Chen1, C.-Y. Kim1, G. Wright1, R. Igarashi1,
J. Warner1, and D.T. Jiang2 1. Canadian Light
Source, 2. Department of Physics, University of
Guelph
XAFS Endstation
HXMA BL The Hard X-ray Micro-Analysis (HXMA)
beamline is a wiggler-sourced hard X-ray (5 40
keV) spectroscopy beamline. User Communities
XAFS, microprobe, and diffraction. Current
Status XAFS successfully performing general
users' experiments since Jan.
2007 Microprobe opening for letter of
intent Diffraction under commissioning
Kohzu CMJ-1 fixed exit DCM selectable Si(111)
or Si(220) crystal pairs exchanged by transverse
motion of the vacuum housing, indirect liquid
nitrogen cooling for the monochromator 1st
crystal ( max 500 W absorbing thermal power) and
the 2nd crystal.
The resolvability of the 1s-4d transition feature
on the Cu K edge as a function of primary slit
vertical opening, measured from a 7.5 ?m thick
copper foil. The result was used as a guideline
to setup collimating mirror bending radius.
Exemplary spectra of standard foil samples
acquired in transmission modes. The inserts in
the upper and lower panel show the background
removed XAFS data in k-space. The measurements
were taken using Si(220) mono crystal and Pt
coating stripes on the collimating and toroidal
focus mirrors.
63 pole 2T superconducting wiggler
Microprobe Endstation
Hi-pressure powder diffraction setup at HXMA BL.
Diffraction Huber psi-8 diffractometer The HXMA
diffraction capability is under commissioning.
Initial powder diffraction commissioning activity
has yielded encouraging results. Current
diffraction commissioning emphasis is in the
detailed understanding of the focused
monochromatic beam characteristics for refining
powder diffraction data and in the development of
the instrumentation associated with the Huber
psi-8 diffractometer for surface studies.
White beam slits 2.5 mm (V) x 4.0 mm (H) 1/3 of
the 1.5 mrad horizontal wiggler radiation fan.
Phase transfer from ambient pressure phase (Left
0.1 GPa), through phrase mixture (middle, 17.5
GPa), to new high pressure phase (right, 22.9
GPa) (John, et al., 2007)
Knife-edge test shows that horizontal beam
position changes less than 0.1 mm while the
incident X-ray energy changes by 5.0 keV.
Apparent change in edge shape is largely due to
normalization process.