Title: Enhanced Plasma Performance by ICRF Wall Conditioning
1Enhanced Plasma Performance by ICRF Wall
Conditioning
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HT-7
- B.N. Wan, J. Li, Y.P. Zhao, X.Z.Gong, X.M.
Zhang, H.L. Ruan, L. Zeng, Z.W. Wu, J.R. Luo,
W.W. Ye, X.M.Guo, C.F.Li, X.M.Wang, J.K. Xie and
HT-7 Team - Institute of Plasma Physics, Academia Sinica,
230031, Hefei, China
2Abstract
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HT-7
- Coating of the walls of HT-7 super-conducting
tokamak with boron and silicon by ICRF has led to
improved plasma performance. Significant
suppression of C, O, Mo and hence Zeff and
radiating power fraction are achieved. The
improved confinement both for particle and energy
is observed in full operation parameters. Energy
balance analysis shows that electron heat
diffusion coefficient is strongly reduced in
outer half region. Operation limit was extended
both in low and high electron density regions
after ICRF B-coating and further to low q region
after Si-coating.
3Introduction
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- HT-7 is a super-conducting Tokamak having
permanent toroidal field. - GDC is not suitable for HT-7 for wall cleaning
and conditioning. - Wall coating is necessary for HT-7 operation.
- New RF Boronization and Siliconization technique
is developed. - ICRF Boronization and Siliconization led to
enhanced tokamak discharges.
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Experiments
- C2B10H12 powder is used for ICRF boronization.
- Applying ICRF cleaning with helium reduce
hydrogen in the fresh film. - Density control can be achieved after about ten
shots. - To ensure the fresh properties of the coating
film, plasma behavior has been investigated
within 100 shots after ICRF boronization. - He SiH4 with the ratio of 955 is used for ICRF
siliconization. - There is no recycling problem at first shot after
siliconization. - Plasma behavior has been studied within 50 shots
after ICRF siliconization for fresh coating film.
- Only ohmic heated discharges with deuterium gas
fueling have been analyzed in this work
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HT-7 Superconducting Tokamak
R 1.22m a 0.285m (Mo Limiter) Ip 100250
kA (250) ne 18x1013cm-3 (6.5) BT
12.5T(2.5) Te 12 KeV (1.5) Ti 0.20.6K eV
(0.8) t 1 5s ( gt10s) ICRF f 1545MHz,
P 0.3MW, CW(0.25, 1.5s) LHCD f 2.45GHz,
P 1.2MW, 10s (0.85MW) Pellet injector up to
8 pellets /per shot Supersonic beam injection
lt1.0 km/s Pump limiter ( Mo head) Main Goal
Steady-state advanced operation and related
physics ( Ip gt 100kA, Negt1.0x13cm-3, t310s)
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Results
- Reduced Impurity influxes and radiating power
- Increased plasma current and decreased loop
voltage (increased bootstrap current?) - Improved energy/particle confinement times
- Reduced electron heat diffusion coefficients in
entire plasma region for B-coating and in outer
half radius region for Si-coating - Extended operation limit, especially to low-q
after Si-coating
7Discharge after ICRF boronization
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- Close line averaged central electron density
- Increased plasma current and lower loop voltage
- Reduced impurity influxes and radiating power
8Discharge after ICRF Siliconization
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- Close line averaged central electron density
- Increased plasma current and lower loop voltage
- Reduced impurity influxes and radiating power
9Very good discharge was obtained after 30 minutes
siliconization
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Zeff as fucntion of line averaged central
electron density
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C and O influxes as fucntion of line averaged
central electron density
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C and O line radiations as fucntion of shot number
13Energy/particle confinement time as fuction of
line averaged central electron density
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Energy balance analysis for two discharges before
and after ICRF boronization
- Close line averaged central density
- Reduced electron heat diffusion coefficients in
entire plasma region - Lower edge electron temperature
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Energy balance analysis for two discharges before
and after ICRF siliconization
- Close line averaged central density
- Reduced electron heat diffusion coefficients in
outer half radius - Higher Te(a) and radiating power than these after
boronization
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Extended operation limit after ICRF coating
- Operation limit are extended both in low and high
electron sensity - ICRF siliconization extend operation limit
further to low-q region
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Comparison of boronization and siliconization
- Boronization 24 hours
- Siliconization 0.51.0 hour
- Easy control of density and recycling for
siliconization. - Shorter life time for Si-coating.
After siliconization
18Summary
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HT-7
- RF condition technique is routinely used in HT-7
experiments, which is very powerful for
superconduting devices. - RF conditioning have led to suppression of
impurity level and radiating power. - RF conditioning leads to enhanced plasma
performance both for energy /particle and
transport. - RF conditioning leads to extension of operation
limit of the machine. - RF siliconization was effective within more than
100 shots and boronization for about 1000 for
good plasma performance.
19Reference
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HT-7
- 1. J.Winter et al., J. Nucl. Mater. 162-164
(1989) 713. - 2. J.Winter et al., Phys. Rev. Lett. 71 (1993)
1549. - 3. H.G.Esser et al., J. Nucl. Mater 241-243
(1997) 861. - 3 J K Xie, "RF wall conditioning A new
technique for future larger Superconducting
tokamak", this conferences - 4 Jiangang Li, et al., Nuclear Fusion, 39(1999)
973 - 5 ZHAO Yan-ping et al, CHIN. PHYS. LETT.
Vol.14, No. 12 (1996) - 6J.S.Hu et al. "Removal of particles by the
ICRF cleaning in HT-7 superconducting tokamak",
this conference.