SEU tests of an 80 Mbit/s optical receiver - PowerPoint PPT Presentation

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SEU tests of an 80 Mbit/s optical receiver

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ASIC designed in commercial 0.25 mm using radiation tolerant layout techniques ... Experimental setup. Karl Gill/CERN. SEU measurements at CRC (Louvain-la-Neuve, ... – PowerPoint PPT presentation

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Title: SEU tests of an 80 Mbit/s optical receiver


1
SEU tests of an 80 Mbit/s optical receiver
  • F. Faccio, K. Gill, M. Huhtinen, A. Marchioro, P.
    Moreira, F. Vasey
  • CERN, Geneva, Switzerland
  • G. Berger
  • UCL/CRC, Louvain-la-Neuve, Belgium

2
Outline
  • Introduction the optical receiver
  • The experiment
  • SEU results
  • System implications
  • Conclusions

3
Introduction
  • Optical receiver for the CMS tracker slow control
    gt data clock (_at_ 80 Mbit/s)
  • Tracker radiation environment gt PIN diode
    ASIC have to be radiation tolerant
  • Influence of radiation on the BER performance of
    the link?

4
Optical receiver
Fermionics InGaAs/InP
ASIC
  • ASIC designed in commercial 0.25 mm using
    radiation tolerant layout techniques
  • Both photodiode and ASIC have been proven
    radiation hard

5
Mounting with two photodiodes
6
Experimental setup
7
SEU measurements at CRC(Louvain-la-Neuve,
Belgium)
  • 59MeV protons (1-4108 p/cm2s)
  • lower energy with moderators
  • 62MeV (106 p/cm2s) and 32MeV neutrons (5105
    p/cm2s), 50 of neutrons within 2MeV from the
    peak
  • different angles to the beam
  • shielding either receiver or PIN diode

8
InGaAs PIN diode sensitive region
90 deg
45 deg
20 deg
Beam
9
BER calibration
10
Irradiation results (1)
Events in the PIN diode dominate the error rate!
11
Irradiation results (2)
12
Irradiation results (3)
13
Summary
Direct ionization, angle 20-80deg
Direct ionization, angle ?90deg
Nuclear interaction
14
System implications
15
Conclusion
  • BER performance of the receiver system is
    degraded!
  • SEU observed under irradiation in the form of
    bit-errors
  • Events in the PIN diode dominate the rate
  • Errors due to both direct and secondary
    ionization, depending on Popt, angle of incidence
    and particle nature
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