BTM 024 qualification

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BTM 024 qualification

• MRB Meeting dd month yyyy

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Description and reference documentation

• Description of nonconformance
• Problem description
• Instances
• Where was it found
• Suspected Root cause
• description
• Reference NCR List
• NCR n

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Vacuum test

• Vacuum test
• Performed in the vacuum chamber in INFN-Roma 2.
• Tray connected to the readout electronics by
  means of a single flex cable in order to minimize
  the number of the lines to be brought out of the
  vacuum chamber (all the FE chips read by the left
  GTRC).
• 20 hours _at_ P lt 0.1 mbar, room temperature (25
  C).
• Noise and gain of each single channel
  continuously monitored throughout the test.

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Vacuum profile
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Functional tests

• Functional tests
• Test suite run continuously during the night.
• Noise and gain measured at the level of the
  single strip every 15 minutes.
• 80 tests performed in total, no failures
  detected.
• One noisy channel since the beginning, no more
  channels were lost during the test.

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Thermal cycles

• Thermal cycles
• Performed in the climatic chamber _at_ INFN-Pisa.
• Tray connected to the TEM through both flex
  cables.
• 4 complete cycles from -15 C to 45 C (standard
  tray thermal cycles).
• Noise and gain and noise occupancy of each single
  channel continuously monitored throughout the
  test.

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Functional tests

• Functional tests
• Test suite run continuously throughout the whole
  test.
• Noise and gain/noise occupancy measured at the
  level of the single strip every 15 minutes.
• 93 tests performed in total, no failures
  detected.
• Final complete test suite after the thermal
  cycles successfully performed.

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Conclusion

• Description of nonconformance
• Problem description