STIL Support

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STIL Support

• IMS Design and Test Software, Oct 2002

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SOC Device Tests Supported Today

• Functional tests
• Digital patterns from Verilog testbenches like
  VCS
• Analog tests are handcrafted by test department
• Structural tests
• Scan based (TetraMAX Output)
• Iddq
• Digital (SoCBIST), Memory, Mixed-Signal BIST

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IMS Short Term STIL Strategy

• Support STIL input for DFT flows
• Full Language parser
• DFT data subset in practice
• CTL supported
• Input from all DFT tools
• Validate STIL output to 1450 spec standard
• Support ATE-specific variants

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The IMS TestDeveloper Flow

• Design simulation output must be timed and ATE
  optimized
• Structural and functional tests are combined into
  one test file
• A Bridge creates specific tester source data

IMS flow simplifies complex tasks Standardized
process shortens test development
time Supplements in-house resources
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Supported ATE Product Families
And Additional Tester Support in Development

• Advantest T3340, T6600
• Agilent 83000, 93000
• Credence Kalos Quartet/Octet
• Teradyne J750, J971/3, Catalyst/Tiger
• Versatest V1000, V1300
• IMS Vanguard
• NPTest ITS9000
• SZ Test Systeme M3650, Piranha, Falcon, Kodiak

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Longer Term STIL Flow
Cyclize
EDA
ATE
Events inSTIL
Vectors in STIL

• STIL is a language
• Many forms of information can be expressed
• STIL does not solve the processing required

New tools will complete the STIL flow
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STIL Test Construct Advantages

• Flexible Signal group and attribute definition
• Hierarchical and multi-track waveform tables
• Spec block Selector block specifies
  min/typ/max, etc.
• Print-on-change pattern data
• Compact pattern data character representation
• MatchLoop, BreakPoint, GoTo, IddqTestPoint
  support
• Pattern Exec Control block to select from
  multiple timing and waveform blocks
• Scan Structure efficiency using Procedures and
  Macros
• User-defined extensibility User Keywords User
  Functions

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In Summary

• TestDeveloper delivers the flow to enable the
  current STIL efforts to be productive
• TestDeveloper supports the complete (functional
  and structural) test pattern, timing and
  connectivity files for engineering and production
  test systems
• IMS DaTS will continue its involvement in the
  STIL standards efforts