Recent Advances in Particle Analysis - PowerPoint PPT Presentation

1 / 32
About This Presentation
Title:

Recent Advances in Particle Analysis

Description:

undeviated ray. Diffracted ray. Refracted ray. Reflected ray. Transmitted after. internal reflection. Transmitted ray. Laser Light Scattering ... – PowerPoint PPT presentation

Number of Views:109
Avg rating:3.0/5.0
Slides: 33
Provided by: jeffrey137
Category:

less

Transcript and Presenter's Notes

Title: Recent Advances in Particle Analysis


1
Recent Advances in Particle Analysis
  • Paul Kester
  • Micromeritics Instrument Corporation

2
Areas of Interest for Ceramics
  • Density
  • Skeletal
  • New uses of old technique
  • Particle Size
  • Comparison of Techniques
  • New technique for nanoparticles
  • Surface Area
  • High Pressure Studies

3
Measure Skeletal Density at Various Stages
  • Molded
  • Debound
  • Sintered
  • Fully dense
  • Check for theoretical Density
  • Indicator for occluded pores
  • Excessive sintering
  • Indicator for removal of binder

4
Future ASTM Method for Density
  • Committee B09 on Powdered Metals and Powdered
    Metal Products
  • Sub-Committee B09.05 Structural Parts
  • Work to start in 6-8 months
  • Applies to parts after sintering
  • Standard Method for Gas Pycnometry

5
Density Equilibration Rate
  • Measure Rate of Equilibration for a material to
    determine proper analysis parameters
  • Study Rate of Equilibration for various gases on
    a material
  • May give information about tortuosity of pores

6
Particle Size Techniques
  • Laser Light Scattering
  • X-ray Sedimentation
  • Electrical Sensing Zone
  • Particle Size by Surface Area

7
Laser Light Scattering
  • Widely used fast technique that can be applied to
    various particulate systems
  • Easily automated in a variety of commercially
    available instruments
  • Requires knowledge of Refractive Index of the
    material
  • Data presented as Equivalent Spherical Diameter

8
Laser Light Scattering
  • Historically laser scattering was performed at
    small angles only, typically up to 14 , called
  • Fraunhofer diffraction
  • Forward light scattering
  • Low-angle laser light scattering (LALLS)
  • Gave results down to 1 µm
  • Now broadened to include wider angles with Mie
    Theory optical modeling
  • Expanded range down to 0.1 µm

9
Types of Scattered Light
Laser Scattering
  • Diffraction
  • Reflection
  • Refraction
  • Absorption

10
Laser Light Scattering
  • Groups of particles scatter light essentially
    equal to the sum of light scattered by the
    individual particles.
  • Optical models for selected particle sizes, and
    mathematical deconvolution, allow computation of
    the particle size distribution.
  • It is difficult to differentiate between single
    particles and agglomerates or aggregates.

11
X-ray Sedimentation
  • Based Upon a Classical Particle Sizing Method -
    Stokes Law.
  • Same Sizing Principle as Andreasen Pipette and
    Long-Arm Centrifuge.
  • Direct Mass Concentration Detection.
  • X-Ray Attenuation is Proportional to Mass in
    Beam.
  • Material Density must be Known
  • Widely used in the Ceramic Industry

12
X-Ray Sedimentation
X-ray Sedimentation
  • Stokes Law for Sedimentation, 1891.
  • Mature, well understood and widely practiced
    technique.
  • Now fully automated

13
Stokes equation
X-ray Sedimentation
  • D particle diameter
  • ? liquid viscosity
  • v sedimentation velocity
  • ? particle density
  • ?o liquid density
  • g acceleration due to gravity

14
X-ray Sedimentation
  • Accounts for Particle Mass Outside Analysis
    Range.
  • Analyzes Higher Concentrated Slurries than Most
    Other Techniques.
  • Provides Reliable Analyses of Wide Size Range
    300 µm to 0.1 µm.
  • Requires Only Readily-Available Physical
    Constants as Parameters.

15
Particle Size Distribution Analysis of Fine
Calcium Carbonate Sample.
X-ray Sedimentation
16
Electrical Sensing Zone
  • Same principle as Elzone 5380/5382 and Coulter
    Multisizer 3
  • Described by ISO 13319
  • Particle suspended in a conductive liquid,
    passing through a narrow orifice, increases
    resistance through the orifice
  • Voltage must increase to keep constant current
    through orifice, same as Elzone 5380 and
    Multisizer 3
  • Voltage change proportional to particle volume

17
Elzone II Principle of Operation
18
Elzone II Advantages
  • Counts and sizes organic and inorganic particles
  • Analyzes materials with mixed optical properties,
    densities and shapes
  • Higher resolution than other sizing methods
  • Lower quantity of sample needed for accurate,
    easy analysis
  • Compact size takes up little lab space
  • Automatic orifice blockage detection

19
Particle Size from Surface Area
  • Increasing interest in nanomaterials
  • Particle sizes lt 100 nm are of interest
  • Most techniques in this range questionable
  • Dynamic Light Scattering
  • Provides Mean Size
  • Difficult if bimodal
  • Agglomerates make sizing difficult
  • Obtain average size of primary particles from the
    surface area and density of the material

20
Tantalum TEM Image
21
TiSi2 TEM Image
22
Nickel TEM Image
23
Carbon TEM Image
24
Particle Size from Surface Area
  • 1 Volume (4/3)pr3)
  • ----------------------
    -------------------
  • BET x Density Area (4pr2)
  • Reduces to
  • 6
  • D (nm) ---------------------- x 1000
  • BET x Density

25
Comparison of Techniques
26
High Pressure Adsorption
  • Increasing interest in measurement of adsorption
    capacity of materials above atmospheric pressure
  • Adsorbent materials
  • Gas purification
  • Hydrogen Storage
  • Catalysts
  • Operate above atmospheric pressure

27
Static Adsorption
  • Van der Waals forces
  • Pressures to 150 psi
  • Measure uptake of gases at various real life
    pressures

28
High Pressure Isotherm
29
Dynamic Adsorption
  • Chemical bonding
  • Pressures to 1,000 psi
  • Pulse Chemisorption
  • Temperature Programmed
  • Oxidation
  • Reduction
  • Desorption
  • BET SA

30
High Pressure Chemisorption
31
Conclusions
  • Our research is letting us use old techniques in
    new ways to meet the needs of todays materials
    and applications

32
Acknowledgments
  • Jeff Kenvin - Micromeritics
  • Greg Thiele - Micromeritics
  • Tony Thornton - Micromeritics
  • Rick Brown MVA Scientific Consultants
Write a Comment
User Comments (0)
About PowerShow.com