Using an SEM to Statically and Dynamically Investigate the Chemical Quartering of a Piezoelectric Tu - PowerPoint PPT Presentation

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Using an SEM to Statically and Dynamically Investigate the Chemical Quartering of a Piezoelectric Tu

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Title: Using an SEM to Statically and Dynamically Investigate the Chemical Quartering of a Piezoelectric Tu


1
Using an SEM to Statically and Dynamically
Investigate the Chemical Quartering of a
Piezoelectric Tube
  • Matthew Sztelle
  • Research Assistant for Professor Joe Lyding
  • Scanning Tunneling Microscopy Group Beckman
    Institute

2
STMs Need Piezoceramics
  • Insulating Ceramic
  • Change Dimensions to Applied Electric Fields
  • Motion is Linear in the Angstrom Regime w/
    Respect to Voltage
  • Work Horse of the Scanning Tunneling Microscope
    (STM)

3
Our Application Piezo-Tubes
  • Geometric Concerns Cylindrical
  • Material PZT-5A (Lead Ziconate Titanate)
  • Nickel Coated
  • 4 Axial Cuts Provide x y Manipulation

Inner Piezo-Tube (x-y Manipulation)
Tip Assembly
Tip Holder
Base Assembly
Tip
Axial Cut
4
Our Situation
  • Early 90s
  • Initial Batches Displayed Strong Spatial
    Response to Applied Fields
  • Tubes Came As Is and No Further Work Required
  • No Outside Test Desired or Required Before Scope
    Assembly
  • Late 90s
  • Newer Batches Response to Applied Field Less
    Robust Than Previously Seen

5
What Was Different?
  • Initial Observation Revealed Axial Cuts
    Significantly Deeper
  • However, Nothing Conclusive

6
Motivated ESEM Analysis
  • Static Test
  • Allows High Resolution Images of the Surface
  • Possible to Accurately Determine Depth of Cut
  • Possible to See Cracks and Fissures
  • Dynamic Test
  • Electrical Feedthrough
  • Observe Displacement of Tube Under Applied Voltage

7
Dynamic ESEM Test Procedure
  • Solder Lead Wire to Each Quadrant
  • Stick to Viewing Surface With Tape
  • Feed Lead Wires Through Feedthrough to Power
    Supply
  • Find Edge of Tube in ESEM
  • Apply Voltages At Increments and View Motion

8
SEM Results
  • Old Tubes
  • Shallower Cuts
  • Approximately 60 um of Motion Under 150V Applied
    Bias
  • New Tubes
  • Deeper Cuts
  • Approximately 10 um of Motion Under 150V Applied
    Bias

9
SEM Conclusions
  • Depth of Cut May Be an Issue
  • Mechanical Stress is Clearly an Issue
  • The Quartering Method Employed by the Company Can
    Not Meet Our Rigorous Specifications

10
In-House Quartering Methods
  • Scribe Using Diamond Carbide Knife
  • Machine Shop Tools With Precision
  • Chemical Etching
  • Wax and Acid Bath
  • Photo-Resist and Acid Bath

11
Stress Fissures at Scribe Marks
Typical Fissures Seen From Mechanical Scribing
12
Fissures In Piezo Bulk Material
Larger Than Normal Fissure
Typical Bulk Fissure
13
Chemical Etching
  • Significant Advantage Vs Other Techniques
  • No Mechanical Stressing of the Tube
  • Disadvantages
  • Labor Intensive
  • Lines Not as Pure as Mechanical Solutions

14
Etching Procedure
  • Cover Tube in Beeswax
  • Scribe Line in Wax With Needle
  • Place in 11 Mix HClHNO3
  • Remove Wax
  • Repeat 3 More Times
  • Take to SEM for Analysis

15
SEM Results
  • Nothing to See No Visible Cracks or Fissures
  • Best Dynamic Response Equivalent to Half That of
    Old Tubes
  • However, Not All Dynamic Responses Were Equal

16
Conclusions
  • Clearly Our New Technique Causes No Mechanical
    Stress to Tube
  • Work Pending
  • Investigation of Test Set-up
  • Not the Same as Previous Test Set-up
  • Not Time Tested Either
  • Actual Live Testing of Tube In Microscope

17
Acknowledgements
  • Professor Joe Lyding
  • Nathan Guisinger
  • Jixin Yu
  • Scott Robinson
  • STM Nanofabrication and Characterization Group
    (University of Illinois)
  • ONR Multidisciplinary University Research
    Initiative (MURI)
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