Static Event Health Monitoring A Capability Improvement Program

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Static Event Health MonitoringA Capability
Improvement Program
Tom Odom VCD Technologies San Dimas, California
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Topics

• History of the Technology
• Magneto-Optics
• Prototype ExMOD Detectors
• Detector Fabrication
• Proposed Technology Improvements
• Risk Analysis Mitigation
• Conclusions

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History of the technology

• Bubble Memories
• Developed in the 1970s as an alternative to
  magnetic tape data storage
• Photo lithographically defined magnetic domains
  on a single crystal wafer.
• Used Large Scale Integration processes developed
  for the semiconductor industry
• Light Modulation Devices
• Developed for Military applications in the
  1980s.
• Used Single Crystal Magneto-Optic wafers to
  modulate light in nano-second time frames.
• Missile tracking applications
• Image Projection
• Magneto-Optic Static Event Detectors (MOSED)

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History of the technology, (continued)
Switched pixel

• Magneto-Optic Static Event Detectors (MOSED)
• Invented and demonstrated in 1990s
• Created to aid in the detection of ESD events.
• Magnetic fields created by the ESD transient
  changes the properties of the Magneto-Optic thin
  film deposited on a single crystal substrate
• Devices can be remotely reset
• Effect is observed using a polarizing microscope

Un-Switched pixel
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Magneto-Optics

• Magneto-Optic Effects
• Kerr Effect for Magneto-Optic Recording
• Faraday Effect for Light Modulation and memory
  devices
• Also known as the Magneto-Optic Effect, was the
  first experimental evidence that light and
  magnetism are related
• Result of ferromagnetic resonance in association
  with a magnetic field
• Resonance causes waves to be decomposed into
  circularly polarized rays which propagate at
  different speeds (circular birefringence)
• Upon re-combining, owing to the differences in
  propagation speed, a net phase offset and a
  resulting rotation of the angle of linear
  polarization results.

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Magneto-Optics, (continued)

• A magnetic field, caused by ESD transient,
  Changes the way light is polarized in the M-O
  Material
• Polarization changes are permanent until device
  is externally reset
• Effect is observed using a polarizing microscope

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Prototype ExMOD Detectors
TO-5 packaged Detector

• Manufactured from Prototype Magneto-Optic wafers
• Uses mature Semiconductor wafer processing
  techniques and materials

0.030
3.00
Over 6000 die can be produced from a 3 inch
diameter wafer
0.020
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Detector Fabrication

• M-O Thin film is grown over non magnetic
  substrate wafer
• Wafer is patterned and etched in the sequences
  shown below
• M-O devices are characterized and tested to
  determine electro-optic performance

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Prototype DetectorsAdvantages of the old
Technology

• Resettable The device can be reset as many times
  as desired so long as the current remains below
  protection level.
• Static Memory The device remains permanently
  switched after an ESD event until reset.
  Alternatively, the device can be observed
  continuously to record the time and threshold of
  the event.
• Small Size The die can be as small as 500mm x
  750mm.
• External Readout The device can be read without
  physical contact, using a polarizing
  microscope/optical system.
• External Reset The sensing device can be reset
  with an external non-contact device.
• Solid State Operates at extreme temperatures and
  environments.
• Fast Switching Provides discharge detection of
  fast ESD pulses generated by HBM, CDM, and MM
  events.
• Polarity Sensitivity If required, the device can
  distinguish the polarity of the ESD event.
• Sensitivity Levels High or low threshold devices
  will be available.
• Pulse Resolution Current devices can detect ESD
  events down to 300mA.
• Custom Configuration Available for customer
  specific applications with associated engineering
  development.

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Prototype DetectorsDisadvantages of the old
Technology

• Difficult to view
• Expensive microscopes are required to view the
  event
• Dual Polarizer analyzers required
• Difficult for customer to Assemble
• High Cost of Fabrication at low volume
• Customer acceptance of new technology

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Proposed Technology Improvements for CTMA / NCMS
Cost share
Active Domain

• Detector Device Improvements
• Replace multi-domain detector (14 individual
  sensors) with a single, active, domain
• Add a redundant domain for Readout verification
• Increase domain size to increase readout signal
  strength and simplification

Redundant domain
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Proposed Technology Improvements for CTMA / NCMS
Cost share
Alternative Two Cell Structure to discriminate
polarity
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Proposed Technology Improvements for CTMA / NCMS
Cost share

• Readout Reset Device Improvements
• Replace the polarizing microscope with an
  autonomous reader.
• The new reader will consist of the following
  components subsystems
• Polarized light source
• Magnifier
• Charge coupled device (CCD) camera or other
  sensing device
• Optical elements that cross polarize incoming and
  reflected light
• Processor
• Result indicator
• To read the MOSED, a Reader is placed above and
  in proximity to the MOSED to determine its state
  of polarization
• To reset the device , a permanent or
  electro-magnet device is integrated with the
  readout device

Example of Readout Device concept
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Proposed Technology Improvements for CTMA / NCMS
Cost share

• Operational Scenario

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Risk Analysis Mitigation

• Multiple Deliveries
• MOSED Device in discrete package
• Static Sensitive Test devices integrated with the
  new SED to characterize performance
• Multiple threshold devices for wide range of ESD
  sensitive devices
• Diverse Applications
• Surge Suppression device will be co-developed
• Use state-of-the-art surge suppression technology
• Couple with MOSED to identify existence of surge
• Government Review and Concurrence throughout
  development cycle
• Multiple workshops to obtain government input
• Reduces risk of redesign to meet user needs

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Conclusions

• Detection of ESD events can benefit the life
  cycle of electronic devices
• Manufacturers can improve on processes that
  historically have damaged, destroyed or degrade
  devices.
• End users can improve their handling of ESD
  sensitive devices, resulting in improved
  reliability in the field.
• Depot repair facilities can improve their ability
  to minimize field returns thereby providing added
  value to their repair/replacement functions.
• The Existing MOSED technology can be improved to
  overcome deficiencies in a risk-controlled CTMA
  cost share development program
• Provides Government and industry users with cost
  effective tools necessary to detect, analyze and
  control ESD events
• Dual Use technology improvements will result in
  significant cost savings for government and
  industry.