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PROOFS: A Fault Simulation Algorithm

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Title: PROOFS: A Fault Simulation Algorithm


1
PROOFS A Fault Simulation Algorithm
  • Pratap S.Prasad
  • ELEC 7250
  • Instructor Prof. Vishwani Agrawal

2
Fault Simulation
  • Fault Simulation
  • Simulators
  • Necessity
  • Strategy
  • Need For
  • Speed
  • Memory Reduction

3
Related Work
  • Fault simulation strategies
  • Approximate methods
  • Statistical Fault Analysis
  • Critical Path Tracing
  • Accurate methods
  • Concurrent
  • Deductive
  • Differential
  • Parallel
  • Others

4
PROOFS Algorithm
  • PROOFS Parallel RestOrative Order-independent
    Fault Simulator
  • A hybrid of the concurrent, differential, and
    parallel fault simulation algorithms.
  • For every test vector
  • Do true-value simulation
  • for every undetected faulty machine
  • Give a unique simulation ID
  • Inject current fault
  • recover current states
  • do event-driven simulation
  • if the fault is detected, drop the fault

5
Results
  • PROOFS algorithm was run on many of the ISCAS
    sequential benchmark circuits
  • A comparison of the two algorithms shows the
    PROOFS is 6 to 67 times faster than the
    concurrent algorithm while always requiring less
    memory.
  • Memory is reduced by up to 7.5 times over the
    concurrent algorithm
  • Sample Comparisons

6
Conclusion
  • PROOFS A very fast fault simulation algorithm
  • The new techniques in PROOFS are
  • Use of group-id to avoid the overhead of
    restoring the good values after each fault
    propagation
  • Concept of active and inactive faults to prevent
    eventless fault simulation
  • Efficient method of fault injection by circuit
    modification
  • An efficient fault ordering to minimize events in
    word parallel operations. It has been shown that
    this algorithm is 6.6 to 67 times faster than a
    state of the art concurrent fault simulator while
    also requiring much less memory.

7
References
  • M.L.Bushnell and V.D.Agrawal,Essentials of
    Electronic Testing for Digital, Memory and
    Mixed-Signal VLSI circuits Kluwer Academic
    Publishers., 2000
  • M.Abramovici, M.A.Breuer, A.D.Friedman,Digital
    Systems Testing and Testable Design, IEEE
    Press, 1995.
  • W.-T.Cheng and J.H.Patel, PROOFS A super fast
    simulator for sequential circuits, Design
    Automation Conference, Mar. 1990.
  • T.M.Niermann, Wu-Tung Cheng and J.H.
    PatelProofs a fast, memory efficient
    sequential circuit fault simulator, Proceedings
    of the 27th ACM/IEEE conference on Design
    automation, pp. 535 - 540, 1991
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