Collaborators: George Malliaras and Alex Mayer

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Collaborators George Malliaras and Alex
Mayer Both of Cornell University
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Vacuum enclosure for x-ray studies of pentacene
thin film growth. The cell contains a silicon
dioxide substrate, pentacene evaporator, shutter,
and thickness monitor. The left panel shows the
CAD design, and the right panel is a picture of
the cell mounted on a diffractometer at the
synchrotron x-ray source.
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Stacking of pentacene molecules to form a layered
thin-film structure.
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Thickness monitor readout for ptcn13.
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Layer-by-layer oscillations observed For
pentacene deposition on silicon dioxide. Each
peak and valley corresponds to the formation of
one layer of pentacene molecules. Sample is
ptcn13.
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Pentacene thickness calibration deduced from the
growth oscillations. Each monolayer of pentacene
corresponds to 15.5 angstroms. Sample is ptcn13.
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Very rough fit using slabs of charge to
represent pentacene. Each slab is seperated from
its neighbors By 2 angstroms of vacuum. The best
fit d spacing is 15.45 angstroms.
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PTCN13 scans 10 and 17 12 A water (for 10), 8 ML
pentacene (for 17)
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AFM analysis of 7 ML pentacene sample (ptcn12)
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Atomic Force Microscope image of the pentacene
surface at a coverage of approximately 2
monolayers. (unknown sample number)
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PTCN14 60 C
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PTCN 11 and height histogram.