SPD

1
SPD

• Barcelona Group
• LHCB
• September 2001

2
Index

• Trademarks
• Laboratory Electronics Results
• ASIC - Integrator
• ASIC- Channel Measurements
• Test Beam Electronics Results
• Testing ASIC. Possible changes
• DAQ System Adaptation
• ...
• Status and Plans
• Conclusions

3
Index

• Trademarks
• Laboratory Electronics Results
• ASIC - Integrator
• ASIC- Channel Measurements
• Test Beam Electronics Results
• Testing ASIC. Possible changes
• DAQ System Adaptation
• ...
• Status and Plans
• Conclusions

4
Trademarks

• Test new Asic of three different channels in
  order to know possible crosstalk between them.
• Laboratory Results vs. Test Beam Results.
• Measurement of pedestals and noise.
• Power Consumption
• Adaptation to DAQ system
• Setup inside DAQ

5
Index

• Trademarks
• Laboratory Electronics Results
• ASIC - Integrator
• ASIC- Channel Measurements
• Test Beam Electronics Results
• Testing ASIC. Possible changes
• DAQ System Adaptation
• ...
• Status and Plans
• Conclusions

6
Laboratory Electronics Results (I)

• Integrator Signal of 5 MIPs

7
Laboratory Electronics Results (II)

• Integrator Linearity.
• First noise estimation Eno (Equivalent Output
  Noise Voltage)lt 1Vrms
• Tresetlt 10ns

8
Laboratory Electronics Results (III)

• Channel Measurements
• Signal Processing (1-gt Upper Subch., 2-gt Lower
  Subch.)
• Input Signal

9
Laboratory Electronics Results (IV)

• Channel Measurements
• Integrator1
• Integrator2

10
Laboratory Electronics Results (V)

• Channel Measurements
• Track and Hold 1
• Track and Hold 2

11
Laboratory Electronics Results (VI)

• Channel Measurements
• Substractor 1
• Substractor 2

12
Laboratory Electronics Results (VII)

• Channel Measurements Threshold at level of
  -0.5MIPS
• Comparator 1
• Comparator2

13
Laboratory Electronics Results (VIII)

• Channel Measurements
• ECL output (after multiplex)
• Results
• Mean offset (between channels and subch.) is
  about 100mV
• Discriminator noiselt 6Vrms (first non-accurated
  measures)
• Power supply per channel 25mA for the -2.5V and
  27 mA for the 2.5V.

14
Index

• Trademarks
• Laboratory Electronics Results
• ASIC - Integrator
• ASIC- Channel Measurements
• Test Beam Electronics Results
• Testing ASIC. Possible changes
• DAQ System Adaptation
• ...
• Status and Plans
• Conclusions

15
Test Beam Electronics Results(I)

• Testing ASIC.
• Preliminary data all the blocks discriminate
  properly with a signal of 1MIP.
• Integrator linearity Measurements prove that
  integrator have so good linearity as the
  simulation.
• Noise 200mV in transition (with a random
  trigger)
• Crosstalk in no connect channel-gt5

16
Test Beam Electronics Results(II)

• DAQ System adaptation.
• Problems with grounding in TestBeam Board-gt
  generation of noise.
• Good adaptation to the system of data
  adquisition.
• The interface between data adquisition board from
  LAL and Test beam board works properly.
• Problems with power consumption-gt As a result of
  the use of regulators.
• Noise-gt Thinking of a new and better layout.

17
Test Beam Electronics Results(III)

• Others.
• Aquí van los resultados de los ficheros que hay
  del Test Beam.

18
Index

• Trademarks
• Laboratory Electronics Results
• ASIC - Integrator
• ASIC- Channel Measurements
• Test Beam Electronics Results
• Testing ASIC. Possible changes
• DAQ System Adaptation
• ...
• Status and Plans
• Conclusions

19
Status and Plans

• ASIC
• Final October 2001 New ASIC with digital
  Interface
• November-December 2001 Test of new ASIC
• October-... 2001 Improvements of the old version
  of three channels for next run
• Algo más???
• Boards
• October 2001 Test Boards for new ASIC
• October-December 2001 New layout for the Test
  Beam board
• Más detalles???

20
Index

• Trademarks
• Laboratory Electronics Results
• ASIC - Integrator
• ASIC- Channel Measurements
• Test Beam Electronics Results
• Testing ASIC. Possible changes
• DAQ System Adaptation
• ...
• Status and Plans
• Conclusions

21
Conclusions

• Preliminary data ASIC of three channels works
  properly
• Good adaptation with data adquisition system
• Need of redesign the layout of Test Beam board
• Study of noise reducing techniques
• ...