FrontEnd Hybrid Industrial Tester

1
Front-End Hybrid Industrial Tester
Fabian Boldrin, Luc Bonnet, Vincent Lemaitre,
Yvan Longrée, Alain Ninane, Xavier Rouby
Status report

• Tests and Block Diagram
• FEH and FHIT connectors
• Evaluation board
• The transition board
• Software
• Conclusion

2
Tests
CT a test of connectivity -passive test,
without power supply connected -each pin of the
FEH connector is tested in order to find open or
short circuit -the termination resistors are
also tested ET an active test, with power
supply -test of the power supply current -test
with min and max supply voltages -I2C bus (test
of margins, access to chips and their
registers) -change in supply current according
to settings (bias, etc) -test of the
CTN FT FHIT becomes a simple interface to ARC
possible tests are -Response to RST, presence
of tick mark, response to trigger, test DC
level -Pedestal per channel and rms
(peak/dec.) -Common noise (p/d) -Noisy/bad
channels
3
Bloc Diagram

• Components
• Mechanical structure
• Transition board (FEHC)
• FHIT pcb electronic circuit including switching
  matrices for CT, Active component for ET, a
  connection to ARC (equivalent of ARC-FE card)
  and fast Controllers
• ARC system(for the FT)
• Power supplies
• PC

4
FEH and FHIT connectors
Exploded view
Guide for the SAMTEC connector
Access to PCB transition board
Power supplies
Active components for ET
Controller and RS232 IO
Connection to ARC for FT
Switching matrices for CT
5
Evaluation Board
Power supply
Hybrid equipped with APV25
Transition board
FHIT pcb
ARC system
Under test in Strasbourg (CT and ET only)
6
TOB/TEC transition board
BOTTOM
TOP
Transition board constructed and delivered in
Strasbourg and Aachen
NAIS
SAMTEC
TIB (top) transition board constructed and under
test
7
Software
Abandon of visual C in order to be fully
compatible with Aachen Make the CT and ET
graphical interface with Labview Use ARC software
for FT New software team LabView and C
Fabian Boldrin and Xavier Rouby Tests Luc
Bonnet, Vincent Lemaitre, Xavier
Rouby Database Alain Ninane Arc Software
from Aachen presently under test in Louvain. To
add CT and ET functionality to the Aachen Labview
program
8
Conclusion

• Present
• Evaluation board (Mono channel version) is
  constructed and under test in Strasbourg. (Test
  consist in validating the hybrid with the CT, ET
  only).
• Transition boards (NAIS-gtSAMTEC) for TOB/TEX,
  top/bottom constructed and used in Strasbourg
  and Aachen.
• Visual interface (Labview) and Software for CT,
  ET and FT is under development
• Next Milestones
• Test of TIB (top) Transition board (Need old
  TIB hybrid)
• Refine ET based on experience gained with the
  evaluation board
• Merging of Aachen (FT) and FHIT software (CT
  ET) in LabView.
• Connectivity with a Database (including barcode
  reader system)
• Build a prototype of a multi-channel FHIT (2
  times 4 Hybrids/FHIT system)