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SPICE Model Checklist

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Today 18 members fabless, IDM, Foundry, EDA and Back-end Supplier ... Tracks versions of foundry documents, EDA tools, SPICE models ... – PowerPoint PPT presentation

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Title: SPICE Model Checklist


1
SPICE Model Checklist
  • Kenneth Brock
  • VP Marketing, Silvaco
  • October 13, 2005

2
FSA - TEN YEARS AND STILL GROWING
  • Established in 94 to achieve a more optimal
    balance between wafer supply and demand
  • 40 Charter Members
  • Fabless Actel, Adaptec, Cirrus Logic, Genesis,
    Exar, NVIDIA, Level One, DSP, QLogic
  • Suppliers Amkor, Chartered
  • Partners Prudential
  • Today FSA has almost 500 members in 21 countries
  • The inaugural BOD 9
  • Today 18 members fabless, IDM, Foundry, EDA
    and Back-end Supplier

3
FSA MISSION
Accelerate the growth and increase the return on
invested capital of the global fabless business
model by promoting an environment for innovation.
  • Provide a platform for meaningful global
    collaboration between fabless companies and their
    partners
  • Identify and articulate opportunities and
    challenges to enable solutions
  • Provide members with research, resources,
    publications and survey information
  • Promote the fabless business model

4
MS/RF SPICE Model Working Group
  • Working Group Objectives
  • Identify common issues shared by the foundry,
    fabless, EDA, IP and design service providers in
    the development and use of SPICE models with a
    focus on RF and Mixed-Signal
  • Develop a format for SPICE model representation
    and common terminology for describing model
    contents and inputs
  • Establish fabless customer requirements for MS/RF
    SPICE models
  • Define SPICE model quality criteria at critical
    delivery milestones
  • Streamline the SPICE model extraction and
    distribution process

5
Problems with Foundry Models
Discontinuous channel conductance across bias due
to binning
Nonphysical modeling of intrinsic gain
Nonphysical modeling of normalized output
conductance
6
MS/RF SPICE Model Checklist
  • Objective
  • Develop SPICE Model Checklist with recommended
    circuit measurements, and reports/graphs,
    delivered with each foundry model, to quantify
    and improve quality of foundry Digital, Analog,
    and RF models
  • Prior Art
  • FSA MOS Model Validation Procedures November
    1995
  • IEEE Recommended Practices P1485 on Test
    Procedures for Micro-electronic MOSFET Circuit
    Simulator Model Validation - May 1997
  • CMC Bipolar Model Standardization Proposed
    Standard Data Sets - 1999
  • Benchmark tests (10) for MOSFET models developed
    at the SEMATECH Compact Model Workshop 1995

7
SPICE Model Checklist
  • History of PDK Working Group
  • October 2002 - Founding of MS/RF Subcommittee
  • October 2003 - Checklist concept is born at FSA
    Suppliers Expo for PDKs
  • March 2004 - PDK Checklist Adopted by foundries
  • December 2004 Foundries report full adoption
  • History of SPICE Model Working Group
  • August 2004 - Formed SPICE Model working group
    from PDK Checklist working group
  • August 2005 Model Checklist adopted by leading
    foundries

8
Working Group Members
  • Foundries
  • 1st Silicon AMI Semiconductor IBM Jazz
    Semiconductor Polarfab Tower Semiconductor
    Ltd. TSMC UMC and X-FAB Semiconductor Foundries
    AG
  • Fabless
  • Agere Systems Exar Corporation IMEC LSI Logic
    Corporation Medtronic, Inc. Mindspeed
    Technologies, Inc. PMC-Sierra, Inc. QUALCOMM
    Incorporated
  • EDA Vendors
  • Agilent Technologies Inc. Cadence Design
    Systems, Inc. Silvaco

9
FSA MS/RF Foundry Subcommittee SPICE Model
Checklist
  • What is the FSA SPICE Model Checklist?
  • A three-page, FSA-endorsed document completed by
    the SPICE model developer and delivered with each
    new release of an SPICE Model
  • Page 1 - foundry, process and support contact
    information and versions of foundry modeling
    documents
  • Page 2 - versions of circuit simulators used to
    validate the model and a rigorous model
    classification
  • Page 3 - device list with the deliverables and
    tests performed for each device.
  • Serves as a combination ingredients list and
    nutrition facts label for a MS/RF SPICE model
  • Helps you to better understand the source data,
    completeness and quality of the model before
    using it to design ICs or to re-extract it to fit
    into your specific product needs.

10
FSA SPICE Model ChecklistServes as a Nutrition
Facts Label
Standard measured vs. simulated plots of a
typical MOSFET(ID vs. VD and its derivative RDS,
ID vs. VG and its derivate, GM)
11
What is Included With the SPICE Model Checklist?
  • Documents on-line at www.fsa.org
  • FSA MS/RF SPICE Model Checklist (3 pages) in
    editable Word format.
  • FSA MS/RF SPICE Model Checklist Users Guide (9
    pages) in pdf format
  • For Fabless Companies, this document describes
    the meaning of each part of the checklist.
  • For Foundries, this document describes the balls
    and strikes consistent rules for completing the
    Checklist.
  • FSA MS/RF SPICE Model Checklist Definitions and
    Taxonomy (10 pages) that includes consistent
    definitions of SPICE modeling terms used in the
    other documents.

12
Foundry and SupportContact Information
  • Section 1 Foundry and Support Contact
    Information
  • Foundry _________________________________________
    _
  • Process ________________________________________
    __
  • Date __________________________________________
  • SPICE Model Support Contact
  • Name __________________________________________
  • Phone __________________________________________
  • Email __________________________________________

13
Section 2Foundry Modeling Documents
14
Section 3Circuit Simulators
Comments
15
Section 4Types of Devices Modeled
16
Model Classification, Noise, Matching,
Statistical Variation, Results
17
Model Identification
  • Device type (list) see table
  • 2. Device name (name) the foundry-defined
    unique name that invokes the schematic symbol in
    the PDK, invokes the model card in simulation,
    and the correct Pcell in layout.
  • 3. Model name (name) name of the model card and
    individual model file if models are not combined
    into a single library
  • Model Type (name) e.g. (BSIM3, BSIM4, EKV,
    HICUM, GP, etc. )
  • 5. Version (.) ex. (3.2, 3.3, 4.4)
  • 6. Model Style (same as the PDK Checklist
    column Spice Model) means that the model is one
    of the following types (Ccompact model,
    Bbehavioral, and S.SUBCKT).
  • Comments
  • 8. Terminals () defines the number of
    terminals on the device.

18
General Model Capabilities
  • 9. No of Bins () - e.g. (1, 2, 3, 4, 5 etc. for
    number of model cards to cover devices full
    operating range through automatic binning of W,
    L) measure of continuity
  • 1/f Noise (list) means that the SPICE model was
    characterized for what is called 1/f, flicker, or
    low frequency noise by the following methods
    (Mmeasured, TTCAD, Eestimated, or blank if not
    included).
  • HF Noise (list) means the SPICE model was
    characterized for what is called high-frequency
    or RF noise (MMeasured, TTCAD, EEstimated, or
    blank if not included) in the gigahertz range
  • RF Parameters (list) means that the SPICE model
    includes any number of the following extracted RF
    parameters that were verified as per the model
    documentation (Y Y-parameters, SS-parameters,
    NNF or Noise Figure, FFT or transition
    frequency, and L NLE or non-linear effects)
  • 13. High Voltage (list) means that the model
    was extracted and characterized for high voltage
    applications and includes any number of the
    following parameters that were verified as per
    the model documentation (HSelf Heating,
    BBreakdown, SSafe Operating Area, PPulsed
    Measurements).

19
Statistical Model Parameters
  • Statistical Model (list) summarizes the SPICE
    model included for the device (SStatistical
    Monte Carlo models have been extracted and
    verified, Mmatch models documented in Matching
    Models document, and CCorner models 4
    FF,SS,FS,SF corners are included)
  • 15. Statistical Method (list) describes the
    method(s) used for the generation of statistical
    models (CPCA or primary component analysis,
    PPFA or primary factor analysis, BBPV Backward
    propagation of variance by Colin McAndrew).
    Foundries may use a combination of these methods.
  • 16. Samples/Lots (/) is a two part number,
    the first part is the number of sample die that
    were used to generate the statistical models, the
    second part after the / is the total number of
    lots from which those sample die were taken.
    There is no mandated distribution of those die
    over the lots, but model users may assume that it
    is random and reflects the process distribution.

20
Model Validation Metrics
  • 17. Model Validation (list) means the model
    validation procedures are performed (P
    Procedure for model validation is described in
    the model documentation, R Results of the model
    validation procedure for this device are
    published in the model documentation).
  • 18. Corner Validation (list) means the corner
    validation procedures are performed (P
    Procedure for corner validation is described in
    the model documentation, R Results of the
    corner validation procedure for this device are
    published in the model documentation). Corner
    validation includes tables or graphs that show
    how the statistical model corners correlate to
    the published PCM specification for the process.
  • 19. Max Error (list) means the maximum error of
    Simulated vs. Measured plots (P Procedure for
    error calculation is described in the model
    documentation, R Results of the error
    calculation for this device are published in the
    model documentation). Maximum error is the
    absolute percentage or RMS percentage (as defined
    in the model documentation) that is acceptable
    for each type of plot for this device.
  • 20. Number of plots () means the number of
    Simulated vs. Measured plots are included for
    this device in documentation. These plots may
    include DC plots, AC plots, RF plots, S
    parameter, Y parameter, W elements, and ring
    oscillator performance.

21
Section 5Active Device Specific Parameters
Device Specific Extraction and Model Parameters
22
Section 6Passive Device Specific Parameters
Device Specific Extraction and Model Parameters
23
FSA MS/RF SubcommitteeSPICE Model Checklist
  • What it is
  • Enhances communication within MS/RF supply chain
    with a common language
  • Tracks versions of foundry documents, EDA tools,
    SPICE models
  • Lists contents of the model library
  • Serves as a nutrition facts label for foundry
    supplied SPICE models, showing both the good and
    bad characteristics in a consistent, easy to read
    format.
  • What it is not
  • Marketing brochure
  • Process Spec Sheet
  • Device Spec sheet

24
Benefits for Fabless, Fablite, Foundry, and EDA
Vendors
  • Fabless and Fablite
  • Consistent documentation and version control
  • Easily compare completeness and quality of model
  • Quickly determine if model needs enhancement
  • Foundry
  • Centralized documentation and version control
  • Saves customer support resources common
    questions
  • Shortens initial engagement timeclarity,
    confidence, trust
  • EDA Vendor
  • Easier to support customers with model, circuit,
    simulator issues
  • Easier to support foundry partners
  • Easier to integrate models into PDKs

25
Conclusions and Next Steps
  • Conclusions
  • The success of the FSA MS/RF SPICE Model
    Checklist depends on good models being
    standardized by the CMC. We follow your
    leadership and make the best of it.
  • Next Steps
  • Next meeting on Tuesday, November 8, 2005 at
    900AM at Silvaco in Santa Clara, CA
  • Agenda includes discussing problems for foundries
    implementing checklist by end of 2005
  • Phase 2 will focus on model validation suites,
    statistical model validation suites
  • Current MOS guidelines in Checklist to be further
    developed for MOS-RF, BJT, and passives in select
    regions (saturation, linear, sub-threshold) and
    applications (digital, analog/mixed mode, high
    voltage and RF)
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