Armin Karcher, LBNL - PowerPoint PPT Presentation

1 / 14
About This Presentation
Title:

Armin Karcher, LBNL

Description:

... W. Kolbe, J. Lee, M. Levi, N. Palaio, B. Turko, M. Uslenghi, M. Wagner, G. Wang ... Dark current can limit the usefulness of long exposures. ... – PowerPoint PPT presentation

Number of Views:115
Avg rating:3.0/5.0
Slides: 15
Provided by: wfk
Learn more at: https://snap.lbl.gov
Category:
Tags: lbnl | armin | karcher

less

Transcript and Presenter's Notes

Title: Armin Karcher, LBNL


1
Proton Radiation Damage in P-Channel CCDs
Fabricated on High-Resistivity Silicon.
Preferred Customer
Preferred Customer
  • C. Bebek, D. Groom, S. Holland, A. Karcher, W.
    Kolbe, J. Lee, M. Levi, N. Palaio, B. Turko, M.
    Uslenghi, M. Wagner, G. Wang
  • Lawrence Berkeley National Laboratory

2
Overview
  • High-Resistivity CCDs
  • Performance Parameters
  • Irradiation
  • Results
  • Comparison to Conventional CCDs
  • Conclusion

3
High-Resistivity CCDs
4
High-Resistivity CCDs
5
Performance Parameters
  • Charge Transfer Efficiency (CTE)
  • CTE becomes critical in large CCDs.
  • Smaller CCDs would mean higher complexity in
    mosaic cameras.
  • Radiation damage reduces CTE, making radiation
    tolerant CCDs essential for extended space
    missions.
  • Dark Current
  • Dark current can limit the usefulness of long
    exposures.
  • It is a volume effect, stemming from thermal
    generation in the bulk silicon.
  • High purity silicon and low operating
    temperatures along with a gettering process
    reduce dark current.

6
Irradiation
  • 2 sets of 4 CCDs each were irradiated.
  • One set incorporated an additional channel
    implant, reducing lateral charge movement to
    reduce CTE degradation.
  • Applied doses of 5x109, 1x1010, 5x1010 and 1x1011
    protons/cm2 at 12 MeV.
  • The highest dose corresponds to 300 years in a
    high earth orbit!
  • Devices were irradiated at room temperature
    without power.

7
CTE Measurement
8
CTE Results
9
Improved Radiation Tolerance on notch implant
devices

10
CTE Dependence on Temperature
11
Dark Current Degradation

12
Dark Current vs Temperature
Dark Current vs Temperature
9
2
for CCD after 5x10
protons/cm
100000
208 K
10000
/h)
-
1000
100
Dark Current (e
10
158 K
e-0.609 eV/kT
1
0.1
50
60
70
80
90
100
1/kT (eV)
13
Comparison to Conventional CCDs
1L.Cawley, C.Hanley, WFC3 Detector
Characterization Report 1 CCD44 Radiation Test
Results, Space Telescope Science Institute
Instrument Science Report WFC3 2000-05,
Oct.2000 2 T. Hardy, R. Murowinski, M.J. Deen,
Charge transfer efficiency in proton damaged
CCDs, IEEE Trans. Nucl. Sci., 45(2), pp.
154-163, April 1998
14
Conclusion
  • P-channel high-resistivity CCDs show remarkable
    radiation tolerance against CTE degradation.
  • Dark current remains low even after proton doses
    equivalent to decades in space.
Write a Comment
User Comments (0)
About PowerShow.com