Beam Lines At SSRL

1
Beam Lines At SSRL
Cathie Condron SSRL Scattering Workshop May 2007
2
Materials Scattering Beam Lines
Characteristics Diffractometer Flux
Energy range Detectors Analyzers Sample
stages Used for Planning Experiments at SSRL
3
1-4 SAXS
Q range 0.0001 1 Å Scatter From 1-100 nm
density inhomogeneities Energy Range 8333 eV
Detector CCD Sample Stages Transmission
Flow Cell Heater (R.T. 200 C) Reflection
4
1-4 SAXS
Use full to look at nanoparticles (catalysts,
bio-oxides, geo-oxides) nanoporous
materials co-polymers dendimers
supramolecular assemblies Micelles
colloids metallic glasses
WAXS patterns contain data concerning
correlations on an intra-molecular, inter-atomic
level SAXS patterns contain data
concerning correlations on an inter-molecular
level
5
2-1 Powder/ Thin Film Diffraction
Diffractometer Huber 2-circle q (sample), 2q
(detector) Flux 1011 to 1012 photons/s Energy
Range 4000 eV to 15800 eV Detector Bicron
(scintillation, no E resolution) Vortex
(future, 100 eV E resolution) Analyzers
Crystal (high-resolution) Sollar (low
resolution) Slits (adjustable/ lowish) Sample
Stages Flat Plate Capillary (hard to use)
Transmission cell (John Bargar) Anton Paar
Heater (R.T. 1173 K) Motorized Sample
Stage coming soon ARS Cryostat (10 K 350 K)
6
2-1
powder Diffraction, Amorphous Materials,
Reflectivity, Thin films, Anomalous diffraction,
Specular
Specular Diffraction of Pentacene Thin films How
The Structure Changes with Film Thickness
7
7-2 X-ray Scattering and Diffraction
Diffractometer Huber 4-circle q (sample), 2q
(detector), c, j Flux 1010 Energy Range
5000 eV to 17500 eV Detector Bicron Vortex
Analyzers Crystal (high-resolution) Sollar
(low resolution) Slits (adjustable/
lowish) Sample Stages Flat Plate (vacuum
chuck) Anton Paar Heater (R.T. 1173 K) ARS
Cryostat (10 K 350 K)
8
7-2
Single crystals, Grazing-incidence, Anomalous
diffraction, Thin films, Surface studies
Polythiophene Thin Film Transistors Highly
Oriented Crystals at The Interface
Grazing-Incidence
Rocking Curve
Kline et all. Nature Materials, 5, 222, 2006
9
11-3 X-ray Scattering and Diffraction
Diffractometer Huber kappa-geometry (?, k, f,
2?) Flux 2.6 x 1010 ph/s Energy Range Fixed
at 12700 eV (Se edge) Detector Area detector
(usually a MAR345) k, ? and 2? Fixed Sample
Stages Flat Plate Capillary Flat plate
transmission and other specialized
user-designed stages
10
11-3
Texture, Real time experiments,
Polycrystalline, Small grains (e.g. soils), Thin
films, Grazing-incidence
t0
t7
t8
t9
t10
11
Planning an SSRL Experiment
Work with scientific staff before arrival to
SSRL Think about the information you want Peak
shape Peak position Variation of peak with q
How long will you need to count Temperature
dependence Sample environment Determine
Appropriate Beam line Energy Detector
Analyzer Sample holder Special equipment If
you are not familiar with the instrument you will
be using plan to sit in with another team if at
all possible