Prsentation PowerPoint

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Annexe III
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RADECS 2002 report Alessandro Paccagnella
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RADECS2002 FINAL STATUSAlessandro
PaccagnellaDEI, Università di Padova
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Scientific Committee
Meeting in Padova on May 31, 2002, for paper
selection A. Paccagnella (Chairman, Padova
University) R. DeMarino (ESA-ESTEC) S. Duzellier
(ONERA) F. Faccio (CERN) F. Fantini (Modena
University) J.L. Leray (CEA) G. Manoni (ASI) R.
Sharp (AEA Technology) F. Saigné (Reims
University) M. Sonza Reorda (Politecnico
Torino) E. Zanoni (Padova University) IEEE
Liaison R. Schrimpf (Vanderbilt University)
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Organizing Committee
D. Bisello (Chairman, Padova University) M.
Pegoraro (INFN Padova) G. Prete (INFN
Legnaro) Local Arrangement L. Bandiera (Padova
University) G. Cellere (Padova University) Confer
ence Secretary C. Miletti (INFN Padova)
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The conference program
Wednesday, 18 September 2002 Sala dei Giganti al
Liviano Registration, Welcome cocktail, Sextant
open meeting, Concert Thursday, 19 September
2002 Palazzo del Bo, Aula E Oral sessions,
Historical notes on the Università di Padova,
Association RADECS Assemblée Generale and
Consiel dAdministration Villa Foscarini-Rossi
Social dinner Friday, 20 September 2002 Palazzo
del Bo, Aula E Oral sessions, Aula Ippolito
Nievo poster session and industrial exhibit
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Sessions and session chairs

• Basic Mechanisms A. Candelori, INFN, I
• K.F.
  Galloway, Vanderbilt University, USA
• Environment and Dosimetry J. Bart, GSFC/NASA,
  USA
• 
  M. Sarno, Alenia Spazio, I
• Technology and Design Hardening T. Gariè, CEA,
  F
• 
  L. Pater, RADITEC, F
• COTS and Photonics J. C. Boudenot, Thales, F
• R. Harboe
  Sørensen, ESA-ESTEC, NL
• Single Event F. Bezerra, CNES, F
• M. Ceschia, Univ. di
  Padova, I
• Poster Session G. Busatto, Univ. di Cassino, I
• S.Duzellier,
  ONERA/DESP, F
• G. Swift, JPL/Nasa,
  USA

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Invited talks

• Radiation effects in SOI microelectronics
• J.R. Schwank, Sandia National Laboratories, USA
• Radiation-induced degradation of bipolar
  transistors and
• linear integrated circuits
• R. Schrimpf, Vanderbilt University, USA
• Single-Event Effects in Advanced CMOS Devices
• A.H. Johnston, NASA/JPL, USA
• Historical notes on Padova University
• L. F. Donà dalle Rose, Università di Padova, I

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Submitted papers

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Contributing countries
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Technical sessions
Oral 20 Poster 31 Total 51
Basic Mechanisms
Environment and Dosimetry
Technology and Design Hardening
COTS and Photonics
Single Event
Radiation Facilities
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Industrial exhibitors

• Nine industrial exhibitors were present
• Aeroflex UTMC
• International Rectifiers
• NASA/GSFC
• SILVACO
• XILINX
• AWE ML
• Intersil
• Peregrine Semiconductor Europe
• TRAD-TestRadiation

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Participants

• 141 registered participants (15 accompanying
  persons) were present

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Conference Sponsors

• All public institutions
• Università di Padova
• Dipartimento di Elettronica e Informatica,
  Università di Padova
• Dipartimento di Fisica, Università di Padova
• INFN - Istituto Nazionale di Fisica Nucleare
• ASI - Agenzie Spaziale Italiana

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• organizing RADECS has been fun!
• ?

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