Title: Effect of Defects in the Mechanical Properties of Carbon Nanotubes
1Effect of Defects in the Mechanical Properties of
Carbon Nanotubes
PHY 472 / Lehigh University Instructor Prof.
Slava V. Rotkin By Paul A. Belony, Jr.
2Common Defects observed in CNTs
- Main types of defects
- 3 main groups
- Point defects
- Topological defects
- Hybridization defects
- Subgroups
- Vacancies (PD)
- Metastable atoms
- Pentagons (TD)
- Heptagons (TD)
- StoneWales (SW or 5775) (TD)
- Fictionalization (HD) (sp3 bonds)
- Discontinuities of walls
- Distortion in the packing configuration of CNT
bundles - Etc
3Stone-Wales (5-7-7-5) Defects
- Stone-Wales defect is
- Composed of Two Pentagon-Heptagon pairs
- Formed by rotating a sp2 bond by 900
- In other words, formed when bond rotation in a
graphitic network transforms four hexagons into
two pentagons and two heptagons, which is
accompanied by elongation of the tube structure
along the axis connecting the pentagons, and
shrinking along the perpendicular direction
4Main Mechanical Properties affected by Defects
- Stiffness
- Ultimate Strength
- Ultimate Strain
- Flexibility
- Buckling and robustness under high pressure
- CNTs are among the most robust materials
- High Elastic Modulus (order of 1 TPa)
- High Strength (range up to 100s of GPa)
5Main effects on Stiffness
Changes in stiffness observed. Stiffness
decrease with topological defects and increase
with fictionalization Defect generation and
growth observed during plastic deformation and
fracture of nanotubes
Deepak Srivastava etal.
Qiang Lu and Baidurya Battacharya
6- Force-Displacement curves are used in order to
show the response of the SWNTs under loading - Reduced units
- 1 time ru 0.03526 ps
- 1 force ru 1.602 nN
- 1 displacement ru 1 ?
SWNTs with more defects are likely to break at
smaller strains and have less strength as
well. Forcedisplacement curves of nanotubes
with various average numbers of defects.
- the Young modulus can be calculated as the
initial slope of the forcedisplacement curve - The ultimate strength is calculated at the
maximum force point, sU (Fmax)/A, where F is
the maximum axial force, A is the cross section
area - the ultimate strain, which corresponds to the
ultimate strength, is calculated as - eU (?LU)/L, where L is the original tube
length.
7Types of stresses
- virial stress
- atomic (BDT) stress
- Lutsko stress
- Yip stress
8- The applied force is computed by summing the
interatomic forces for the atoms along the end of
the nanotube where the displacement is
prescribed. - The stress is calculated from the
cross-sectional area S pdh (h is the chosen
interlayer separation of graphite)
Belytschko et al. Force-Deflection curve for a
model of zigzag NT (Normalized to Stress vs.
Strain)
Crack formation in a 40, 40 armchair NT with SW
defect (evolution from left to right 12.5 12.8
ps)
Evolution of cracks in the NT Bond-breaking
spreads sideways after the initially weakened
bond failed
The crack grows in the direction of maximum shear
9Elastic modulus before defect
- Defect free (9,0) nanotube with periodic boundary
conditions - Strains applied using conjugate gradients energy
minimization - - All stress and strain measures yield a Youngs
modulus value of 1.002TPa
105-7-7-5 Defect on CNTs
- The graph shows the graph for Lutsko stress
profile for (9,0) zigzag NT with (5-7-7-5) defect - The defected region facilitates Stress
amplification - When applied strains increase, this amplification
reduces - A different situation is observed for (n,n)
armchair NT there is a decrease in stress at the
defect region
11N. Chandra, S. Namilae and C. Shet
- Contour plots of the longitudinal strain e33
strain and stress s33 near the defected region
drawn at different applied strain levels. - Strain contours at an applied strain of 1. b)
Stress contours at an applied strain of 1. - c) Strain contours at an applied strain of 3. d)
Stress contours at an applied strain of 3. - e) Strain contours at an applied strain of 5.
f) Stress contours at an applied strain of 5. - g) Strain contours at an applied strain of 8. h)
Stress contours at an applied strain of 8.
12NT possess residual forces at zero strain (even
when defect free) At about 1 TPa theres a
reduction of stiffness away from the defect-free
straight line
13Measuring Mechanical Properties
L. Forro etal.
- Use of Atomic Force Microscopy (AFM)
- For individual CNTs
- 3D representation of the adhesion of a SWNT to an
alumina ultra-filtration (tube is clamped
allowing mechanical testing) - How AFM works in schematic way (a load F is
applied to the suspending portion of the NT with
length L. So the max deflection d is
topologically measured
14- Fracture process of a (6, 6) SWNT with three SW
defects - crack initiation and propagation (AI)
- (b) corresponding force time history.
15Diameter dependence
The slope of the graphs seem to be very close to
each other for different curvature of the
NTs So, stiffness values of various tubes of
same SW defect but different diameters do not
change significantly Stiffness in the range of
0.61TPa to 0.63TPa for different (n,0)
tubes Curvature is not significantly affected by
Mechanical properties of SW defect
16Charality Dependence
Theres a significant change in the measured
stiffness when the charality varies
17- Defects can occur in the form of atomic
vacancies. - High levels of such defects can lower the tensile
strength by up to 85. - Due to the almost one-dimensional structure of
CNTs, the tensile strength of the tube is
dependent on the weakest segment of it in a
similar manner to a chain, where a defect in a
single link will greatly diminish the strength of
the entire chain.
18Summary
- Mechanical behavior of defects such as 5-7-7-5
defect is examined - A considerable decrease in stiffness at 5-7-7-5
defect location in different nanotubes is
observed - Changes in diameter dont affect the decrease in
stiffness significantly - Changes in chirality have different effect on
stiffness
197-5-5-7
STM images and corresponding atomic positions for
a C2 dimer absorbed into different nanotubes (a)
and (b) show a (10,10) tube (c) and (d) a (17,0)
tube. All under a 10 strain (tip at 10.5 eV.)
(10,10) NT under 10 strain
Heterojunction