Chris Maloney - PowerPoint PPT Presentation

About This Presentation
Title:

Chris Maloney

Description:

Characterization of a Geiger-mode Avalanche Photodiode ... Breakdown voltage Diode ideality factor Series ... is armed and a laser pulse is detected ... – PowerPoint PPT presentation

Number of Views:167
Avg rating:3.0/5.0
Slides: 27
Provided by: RITC69
Learn more at: http://ridl.cfd.rit.edu
Category:

less

Transcript and Presenter's Notes

Title: Chris Maloney


1
Characterization of a Geiger-mode Avalanche
Photodiode
  • Chris Maloney
  • May 10, 2011

2
Project Objectives
  • To extract key parameters that will allow for
    effective and efficient operation of a
    Geiger-mode avalanche photodiode array in a LIDAR
    imaging system

3
Project Goals
  • Extract key parameters
  • Breakdown voltage
  • Diode ideality factor
  • Series resistance
  • Dark count rate
  • Optimal bias for imaging
  • Number of traps present
  • Type of traps present

4
Applications
  • Avalanche photodiodes (APDs) are used for light
    detection and ranging (LIDAR)

Color coded video of a Chevy van produced by
Lincoln Lab LIDAR system
5
Applications
  • Altimetry
  • Measuring rainforest canopy
  • Measuring polar icecaps
  • Mapping celestial bodies
  • Mapping ocean topography
  • Autonomous Landing
  • Unmanned aircrafts
  • Landing on Mars
  • Landing on an asteroid

(Image Credit MOLA Science Team and G. Shirah,
NASA GSFC Scientific Visualization Studio.)
6
Background
  • Lincoln Laboratory at MIT has fabricated a 32x32
    array of Geiger-mode APDs for LIDAR imaging
    applications

7
Linear-mode vs. Geiger-mode
  • APDs can be operated in linear-mode or
    Geiger-mode
  • Geiger-mode provides much more sensitivity
  • Linear-mode can produce intensity images

(Image Credit D.F Figer.)
8
Project Flowchart
NO
YES
9
System Design
CAD camera part
Fabricated camera
10
Front View
Without the lens
11
Readout board integrated with camera
View inside of camera
12
Detector integrated with readout board
32x32 APD array
Readout board and detector are both from MITs
Lincoln Laboratories
13
System Design
Complete LIDAR system
14
Diode IV Testing
  • Shielded Probe Station
  • Agilent 4156B Parameter Analyzer
  • Noise Floor 1 fA

15
Measured Reverse Diode Current vs. Voltage
Breakdown Voltage 28 V
Dark Current 0.1 pA Dark Current Density 1
nA/cm2
All diodes across the wafer are uniform
16
Measured Forward Diode Current vs. Voltage
Series resistance 2 kO
n 1.0
No R/G region
No R/G region implies number of traps are minimal
17
Gate Width Definition
  • The amount of time the detector is ready to
    detect a photon

h?
Gate Width
Timing Gate
18
Measured Dark Count Rate vs. Gate Width
Dark count rate should be constant
19
Dead Pixels
Upper right corner is unresponsive due to low
yielding bump-bonds
20
Measured Dark Count Rate vs. Gate Width 9 by 8
array
Dark count rate is constant and no longer
decreasing
21
Measured Dark Count Rate vs. Bias
Add 5V to x-axis to account for cathode voltage
Breakdown voltage is higher than breakdown
extracted from IV curve
22
Afterpulsing Theory
  • Detector is armed and a laser pulse is detected
  • Detector cannot detect photons for tdead
  • Any carriers caught in traps will also discharge
  • Detector is armed
  • If tdead is shorter than the trap lifetime then
    the trap will discharge while the detector is
    armed and will result in a false event

23
Afterpulsing Model
1
? dark count rate Rdark measured dark count
rate without afterpulsing Pa avalanche
probability Nft number of filled traps tdead
dead time ttrap trap lifetime
24
Measured Afterpulsing
  • No afterpulsing seen
  • No traps
  • or
  • Trap lifetime
  • gt500 µs

25
Acknowledgements
  • Rochester Imaging Detector Lab
  • Dr. Don Figer
  • John Frye
  • Dr. Joong Lee
  • Brandon Hanold
  • Kim Kolb
  • Microelectronic Engineering Department
  • Dr. Rob Pearson
  • Dr. Sean Rommel
  • Dr. Karl Hirschman
  • This work has been supported by NASA grant
    NNX08AO03G

26
References
  • 1 K.E. Jensen, Afterpulsing in Geiger-mode
    avalanche photodiodes for 1.06 µm wavelength
    Lincoln Laboratory, MIT 2006.
  • 2 D. Neamen, An Introduction to Semiconductor
    Devices McGraw Hill 2006.
  • 3 R.F. Pierret, Semiconductor Device
    Fundamentals Addison-Wesley Publishing Company,
    Inc. 1996.
Write a Comment
User Comments (0)
About PowerShow.com