A 200x100 Array Of Electronically Calibratable Logarithmic CMOS Pixels - PowerPoint PPT Presentation

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A 200x100 Array Of Electronically Calibratable Logarithmic CMOS Pixels

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A 200x100 Array Of Electronically Calibratable Logarithmic CMOS Pixels Bhaskar Choubey Satoshi Ayoma Dileepan Joseph Stephen Otim Steve Collins University of Oxford ... – PowerPoint PPT presentation

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Title: A 200x100 Array Of Electronically Calibratable Logarithmic CMOS Pixels


1
A 200x100 Array Of Electronically Calibratable
Logarithmic CMOS Pixels
  • Bhaskar Choubey
  • Satoshi Ayoma
  • Dileepan Joseph
  • Stephen Otim
  • Steve Collins
  • University of Oxford, Oxford
  • Satoshi Ayoma is currently with Renesses
    Technology Corp, Japan
  • Dileepan Joseph is currently with University of
    Alberta, Edmonton, Canada

2
Introduction
  • Need for High Dynamic Range Imaging
  • Linear Pixel
  • CCD
  • CMOS Active Pixel Sensor
  • Techniques to improve dynamic range lead to
  • Low Fill Factor
  • Complex In-pixel Circuits
  • Large Number of Bits

3
Logarithmic Pixels
  • Can capture Wide Dynamic Range
  • Encode Contrast Information
  • Similar Fill Factor as that of APS
  • Randomly Addressable
  • Device Variations Cause Fixed Pattern Noise

4
Ways to Reduce FPN
  • On-chip Methods
  • Electron Injection (Ricquer and coworkers)
  • Gate Voltage Adjustment (Loose et.al.)
  • Subtracting Reference Response (Kavadias et. al.)
  • Off-chip Methods
  • Subtracting Reference Response (IMSC chips)
  • Model Based Correction (Joseph and Collins)
  • Electronic Calibration (Choubey and coworkers)

5
Electronic Calibration
  • Log Pixel Response
  • Parameter Extraction
  • Photocurrent Extraction

6
Chip Design
  • 0.35 µ 2-Poly 3-Metal Process
  • Each Pixel 10 µ x 10 µ
  • Photodiodes used N-diff, P-substrate
  • 200 x 100 Pixel array
  • Column and Row Scanners

7
Experimental Procedure
  • All Clocks were generated externally using
    Instrunet data acquisition board and HP Vee
    programming interface
  • Analogue values from Pixels were read through
    semiconductor parameter analyzer (Agilent 4155B)
  • Slow speed clock was used to remove all transient
    effects
  • All electronic experiments were carried out in a
    stable temperature oven to remove temperature
    variability.

8
Experimental Result
  • A uniform scene without correction, after
    single parameter correction and after 2 parameter
    correction.

9
Experimental Result
10
Experimental Results
  • Uncorrected FPN was of the order of 104
  • Offset FPN Correction
  • FPN is dramatically reduced
  • However a low error is only obtained close to the
    calibration point.

11
Experimental Results
  • Calibration Points
  • The two points should be far from dark point to
    remove leakage effects.
  • They should be well separated to remove temporal
    noise effects on gain.
  • The second point should not be too close to the
    moderate inversion region.
  • FPN Correction
  • A contrast sensitivity of 2 is obtained for more
    than 6 decades of intensity.

12
Conclusion
  • Log Pixels have the ability to match the
    performance of human eye, but are crippled by
    high fixed pattern noise.
  • Offset only correction fails to get a high
    quality image.
  • Electronic Calibration provides an easy method of
    reducing the FPN caused by variation in all
    parameters.
  • The residual error after correction is as low as
    2 and hence matches the human eyes contrast
    sensitivity.
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