Title: Dept. of Mechanical Engineering, IISc
1Dept. of Mechanical Engineering, IISc
- ME-255 PRINCIPLES OF TRIBOLOGY
- Surface Properties - Measurement Techniques
- Profilometer
- Presented by
- Balasenthil D
- Sr.No. 08993
2CONTENTS
- Introduction
- Types of Profilometer
- Contact
- Non - Contact
- Working Principle
- Optical Principle Basics
- Modes of Operation
- System Performances
- Range , Resolution Accuracy
- Surface Parameters
- Surface Topography Amplitude Parameters
- Profilometers _at_ IISc
- Measurement Examples
3INTRODUCTION
- Definition.
-
- - A profilometer is a device used to measure
the roughness of a surface. - - Gives difference between the high and low
point of a surface in nanometres. - Types of Profilometers.
- Non - Contact Profilometers
- Contact Profilometers
4Non - Contact Profilometer
- Optical Methods
- Vertical Scanning Interferometry
- Phase - Shifting Interferometry
- Differential Interference Contrast Microscopy
- Focus Detection Methods
- Intensity Detection
- Focus Variation
- Differential Detection
- Critical Angle
- Astigmatic Method
- Focault Method
- Confocal Microscopy
- Contd
5Non - Contact Profilometer
- Pattern Projection Methods
- Fringe Projection
- Fourier Profilometry
- Moire
Contact Pseudo Contact Profilometer
- Stylus Profilometer
- Atomic Force Microscopy
- Scanning Tunneling Microscopy
6Contact Profilometer
- Height from 10 nanometres to 1 millimetre
- Radius of diamond stylus from 20 nm to 25 µm
- Horizontal resolution is controlled by the scan
speed and data signal sampling rate. - Contd ...
7Contact Profilometer
- Advantages Disadvantages
- Acceptance Easy to Use
- Surface Independence
- Resolution The stylus tip radius can be as
small as 20 nanometres - Direct Technique No modelling required.
- Not suitable for very soft (or even liquid) and
easily damageable surface - Very hard and damage surface can damage the
stylus - Only 2D
8Non - Contact Profilometer
- Uses beams of light to read a surface
- They shoot a beam out and measure the time it
takes to return. - no wear since none of its parts touch anything
- Contd
9Non - Contact Profilometer
- Advantages of optical profilometers
- Good Resolution Vertical resolution is usually
in the nm level - High Speed
- Reliability cannot be damaged by surface wear
or careless operators - Spot size or lateral resolution ranges from a
few micrometres down to sub micrometre. - Contd
10Non - Contact Profilometer
- Limitations
- Limited by very high slopes, where the light is
reflected away from the objective, unless the
slope has enough texture to provide the light. - Surface Modelling is required to convert the
digital code to human usable data.
11Working Principle of Profilometer(Non - Contact
Optical Profilometer)
Contd
12Working Principle of Profilometer(Non - Contact
Optical Profilometer)
- A light beam is split, reflecting from reference
(known/flat) test material. - Constructive and destructive interference occurs
- Forms the light and dark bands known as
interference fringes. -
- The optical path differences are due to height
variances in the test surface. - Contd
13Working Principle of Profilometer(Non - Contact
Optical Profilometer)
- Constructive interference areas as lighter and
the destructive interference areas as darker. - Light to dark fringes above represents one-half a
wavelength of difference between the reference
path and the test path. - Contd
Interference Image
14Working Principle of Profilometer(Non - Contact
Optical Profilometer)
- From the above Interference Image
- Lower portion is out of focus means less
interference. - Greatest contrast means best focus.
15Modes of Operation(Non - Contact Optical
Profilometer)
- Phase Shifting Interferometry (PSI) Mode
- Vertical Scanning Interferometry (VSI) Mode
- Contd
16Modes of Operation(Non - Contact Optical
Profilometer)
17System Performances
- Range Highest vertical distance the profiler can
measure. - Resolution Smallest distance the profiler can
accurately measure. - Lateral Resolution
- Vertical Resolution
- Accuracy How closely a measured value matches
the true value can be obtained by frequent
calibration.
18Surface Parameters
- Surface Topography 3D representation of
geometric surface irregularities. - Contd
19Surface Parameters
- Roughness Closely spaced irregularities
- Waviness More widely spaced irregularities
- Error of Form Long period non cyclic
deviations - Flaws Discrete infrequent irregularities
- Roughness Waviness comprise the Surface Texture
- Contd
20Surface Parameters
- Amplitude Parameters
- Contd
-
-
Term Definition Use
Ra The roughness average (mean height) Gives roughness of the machine surface
Rq RMS roughness Describes the finish of optical surface
Rp Rv Max profile peak max profile valley depth Ra - info of friction wear Rv - retaining of lubricant
Rt Max height of surface Gives overall roughness of the surface
21Surface Parameters
Term Definition Use
Rz Average max height of the profile Evaluating surface texture on limited access surfaces
Rsk Skewness - measure of asymmetry of the profile about the mean line. Gives load carrying capacity, porosity characteristic of non-conventional machining processes.
22Profilometers _at_ IISc
- Optical surface profilometer
- Make Veeco NT1100
- Type Non Contact type
- Principle of Operation
- VSI g interferometry (VSI)
- Phase-shifting interferometry (PSI).
- Range
- VSI 2mm
- PSI 160nm
- Resolution
- Vertical Resolution PSI 3Å VSI 3nm
- Lateral Resolution -- Function of magnification
objective and the detector array size you choose
23Profilometers _at_ IISc
- Nanoscience Profilometer
- Film thickness measurement from 5 microns down
to 300 nm or less - 4 million pixel camera for high resolution
- Auto-range and auto-fringe-find for ease of use
of Single mode of operation over all scan ranges.
24Measurement Examples
- Some of the profiles obtained are shown below
- 600 GRIT SIZE
-
- UPD (in 2D) UPD (in 3D)
25Measurement Examples
- Surface of steel Block Reflection Intensity
- 3D Image
26Measurement Examples
- Pit on a thin iron plate 2D image
- Plate thickness 0.7mm
- (Depth 0.14494mm)
27Measurement Examples
28References
- Research Papers
- T.V.Vorburger, J.Raja.
- Surface Finish Metrology Tutorial
- June 1990
- WYKO Surface Profilers Technical Reference
manual - September 1999, Version 2.2.1
- Webpage
- Profilometer, Wikipedia
- http//en.wikipedia.org/wiki/Profilometer
29THANK YOU